Plasmonic field enhancement in terahertz (THz) generation is one of the recently arisen techniques in the THz field that has attracted considerable interest. However, the reported levels of enhancement of THz output power in the literature are significantly different from each other, from less than two times to about two orders of magnitude of enhancement in power, which implies the existence of other major limiting factors yet to be revealed. In this work, the contribution of the plasmonic effect to the power enhancement of THz emitters is revisited. We show that the carrier collection efficiency in a THz emitter with plasmonic nanostructures is more critical to the device performance than the plasmonic field enhancement itself. The strong reverse fields induced by the highly localized plasmonic carriers in the vicinity of the nanoelectrodes screen the carrier collections and seriously limit the power enhancement. This is supported by our experimental observations of the significantly enhanced power in a plasmonic nanoelectrode THz emitter in continuous-wave radiation mode, while the same device has limited enhancement with pulsed radiation. We hope that our study may provide an intuitive but practical guideline in adopting plasmonic nanostructures with an aim of enhancing the efficiency of optoelectronic devices.
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15 August 2016
Research Article|
August 17 2016
A comparative study of the plasmon effect in nanoelectrode THz emitters: Pulse vs. continuous-wave radiation Available to Purchase
Kiwon Moon;
Kiwon Moon
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Eui Su Lee;
Eui Su Lee
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Jeongyong Choi;
Jeongyong Choi
2Metal-Insulator Transition Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Donghun Lee;
Donghun Lee
3Optical Internet Components Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Il-Min Lee;
Il-Min Lee
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Sang-Pil Han;
Sang-Pil Han
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Hyun-Soo Kim;
Hyun-Soo Kim
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Kyung Hyun Park
Kyung Hyun Park
a)
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
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Kiwon Moon
1
Eui Su Lee
1
Jeongyong Choi
2
Donghun Lee
3
Il-Min Lee
1
Sang-Pil Han
1
Hyun-Soo Kim
1
Kyung Hyun Park
1,a)
1Terahertz Basic Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
2Metal-Insulator Transition Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
3Optical Internet Components Research Section,
Electronics and Telecommunications Research Institute (ETRI)
, Daejeon 305-700, South Korea
a)
Author to whom correspondence should be addressed. Electronic mail: [email protected].
Appl. Phys. Lett. 109, 071105 (2016)
Article history
Received:
May 18 2016
Accepted:
August 02 2016
Citation
Kiwon Moon, Eui Su Lee, Jeongyong Choi, Donghun Lee, Il-Min Lee, Sang-Pil Han, Hyun-Soo Kim, Kyung Hyun Park; A comparative study of the plasmon effect in nanoelectrode THz emitters: Pulse vs. continuous-wave radiation. Appl. Phys. Lett. 15 August 2016; 109 (7): 071105. https://doi.org/10.1063/1.4961305
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