GaAsBi/GaAs nanowires (NWs) grown on Si substrate and proper reference samples have been studied by photoacoustic (PA) spectroscopy. It has been shown that PA signal originating from NWs is quite strong and can be easily identified in the PA spectra, as well as distinguished from the signal originating from the Si substrate. The absorption edge of GaAsBi/GaAs and GaAs NWs has been determined from the analysis of amplitude PA spectra to be 1.26 eV and 1.42 eV, respectively. These values are consistent with the band gap reduction resulting from the introduction of ∼2% Bi in bulk GaAsBi alloy. The presented results prove that, despite light scattering, which is typical for NWs, PA spectroscopy is an excellent tool to study the absorption edge in semiconductor NWs.
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31 October 2016
Research Article|
October 31 2016
Photoacoustic spectroscopy of absorption edge for GaAsBi/GaAs nanowires grown on Si substrate
Szymon J. Zelewski
;
Szymon J. Zelewski
a)
1Faculty of Fundamental Problems of Technology,
Wroclaw University of Science and Technology
, Wybrzeze Wyspianskiego 27, 50-370 Wrocław, Poland
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Jan Kopaczek;
Jan Kopaczek
1Faculty of Fundamental Problems of Technology,
Wroclaw University of Science and Technology
, Wybrzeze Wyspianskiego 27, 50-370 Wrocław, Poland
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Wojciech M. Linhart;
Wojciech M. Linhart
1Faculty of Fundamental Problems of Technology,
Wroclaw University of Science and Technology
, Wybrzeze Wyspianskiego 27, 50-370 Wrocław, Poland
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Fumitaro Ishikawa
;
Fumitaro Ishikawa
2Graduate School of Science and Engineering,
Ehime University
, 3 Bunkyo-cho, Matsuyama, Ehime 790-8577, Japan
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Satoshi Shimomura;
Satoshi Shimomura
2Graduate School of Science and Engineering,
Ehime University
, 3 Bunkyo-cho, Matsuyama, Ehime 790-8577, Japan
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Robert Kudrawiec
Robert Kudrawiec
b)
1Faculty of Fundamental Problems of Technology,
Wroclaw University of Science and Technology
, Wybrzeze Wyspianskiego 27, 50-370 Wrocław, Poland
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Szymon J. Zelewski
1,a)
Jan Kopaczek
1
Wojciech M. Linhart
1
Fumitaro Ishikawa
2
Satoshi Shimomura
2
Robert Kudrawiec
1,b)
1Faculty of Fundamental Problems of Technology,
Wroclaw University of Science and Technology
, Wybrzeze Wyspianskiego 27, 50-370 Wrocław, Poland
2Graduate School of Science and Engineering,
Ehime University
, 3 Bunkyo-cho, Matsuyama, Ehime 790-8577, Japan
a)
Author to whom correspondence should be addressed. Electronic mail: [email protected]
b)
E-mail: [email protected]
Appl. Phys. Lett. 109, 182106 (2016)
Article history
Received:
September 18 2016
Accepted:
October 20 2016
Citation
Szymon J. Zelewski, Jan Kopaczek, Wojciech M. Linhart, Fumitaro Ishikawa, Satoshi Shimomura, Robert Kudrawiec; Photoacoustic spectroscopy of absorption edge for GaAsBi/GaAs nanowires grown on Si substrate. Appl. Phys. Lett. 31 October 2016; 109 (18): 182106. https://doi.org/10.1063/1.4966901
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