We study the photoluminescence internal quantum efficiency (IQE) and recombination dynamics in a pair of polar and non-polar InGaN/GaN quantum well (QW) light-emitting diode (LED) structures as a function of excess carrier density and temperature. In the polar LED at 293 K, the variation of radiative and non-radiative lifetimes is well described by a modified ABC type model which accounts for the background carrier concentration in the QWs due to unintentional doping. As the temperature is reduced, the sensitivity of the radiative lifetime to excess carrier density becomes progressively weaker. We attribute this behaviour to the reduced mobility of the localised electrons and holes at low temperatures, resulting in a more monomolecular like radiative process. Thus we propose that in polar QWs, the degree of carrier localisation determines the sensitivity of the radiative lifetime to the excess carrier density. In the non-polar LED, the radiative lifetime is independent of excitation density at room temperature, consistent with a wholly excitonic recombination mechanism. These findings have significance for the interpretation of LED efficiency data within the context of the ABC recombination model.
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10 October 2016
Research Article|
October 12 2016
Radiative recombination mechanisms in polar and non-polar InGaN/GaN quantum well LED structures Available to Purchase
T. J. Badcock
;
T. J. Badcock
a)
1Toshiba Research Europe Ltd.,
Cambridge Research Laboratory
, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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M. Ali;
M. Ali
1Toshiba Research Europe Ltd.,
Cambridge Research Laboratory
, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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T. Zhu
;
T. Zhu
2Department of Materials Science and Metallurgy,
University of Cambridge
, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom
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M. Pristovsek
;
M. Pristovsek
2Department of Materials Science and Metallurgy,
University of Cambridge
, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom
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R. A. Oliver
;
R. A. Oliver
2Department of Materials Science and Metallurgy,
University of Cambridge
, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom
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A. J. Shields
A. J. Shields
1Toshiba Research Europe Ltd.,
Cambridge Research Laboratory
, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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T. J. Badcock
1,a)
M. Ali
1
M. Pristovsek
2
R. A. Oliver
2
A. J. Shields
1
1Toshiba Research Europe Ltd.,
Cambridge Research Laboratory
, 208 Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
2Department of Materials Science and Metallurgy,
University of Cambridge
, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom
a)
Present address: Oclaro Technology Ltd., Caswell, Towcester NN12 8EQ, United Kingdom. Electronic mail: [email protected].
Appl. Phys. Lett. 109, 151110 (2016)
Article history
Received:
June 20 2016
Accepted:
October 02 2016
Citation
T. J. Badcock, M. Ali, T. Zhu, M. Pristovsek, R. A. Oliver, A. J. Shields; Radiative recombination mechanisms in polar and non-polar InGaN/GaN quantum well LED structures. Appl. Phys. Lett. 10 October 2016; 109 (15): 151110. https://doi.org/10.1063/1.4964842
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