Kelvin-probe force microscopy (KFM) has been widely used to evaluate the localized charge trap states in the organic thin-film transistor (OTFT) channels. However, applicability of the KFM has been limited to the trapped charges whose lifetime is typically longer than several minutes because of the temporal resolution of the KFM. Therefore, it has not long been employed for studying the dynamics of the trapped charges in the OTFTs. Here, we demonstrate a method to visualize the transient distribution of the trapped charge carriers in operating OTFTs. The method allows visualizing the dynamics of the trapped charges during the gate voltage sweeps on a time scale of several hundreds of milliseconds. The experimental results performed on dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene (DNTT) OTFTs indicate that, immediately after a bias voltage applied to a device was turned off, the primary discharging of the channel region around the electrode edges started and it limited the ejection process of the remaining accumulated charges to the electrodes, resulting in an increased density of long-lived trapped charges in a region distant from the electrodes. The presented results suggest that the method is useful to study the electrical connections at the interface between the DNTT grains and electrodes, or those between the grains.
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29 February 2016
Research Article|
March 02 2016
Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps
Yuji Yamagishi;
Yuji Yamagishi
1Department of Electronic Science and Engineering,
Kyoto University
, Kyoto 615-8510, Japan
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Kei Kobayashi;
Kei Kobayashi
a)
1Department of Electronic Science and Engineering,
Kyoto University
, Kyoto 615-8510, Japan
2The Hakubi Center for Advanced Research,
Kyoto University
, Kyoto 615-8520, Japan
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Kei Noda;
Kei Noda
3Department of Electronics and Electrical Engineering,
Keio University
, Yokohama 223-8522, Japan
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Hirofumi Yamada
Hirofumi Yamada
1Department of Electronic Science and Engineering,
Kyoto University
, Kyoto 615-8510, Japan
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a)
Electronic mail: [email protected]
Appl. Phys. Lett. 108, 093302 (2016)
Article history
Received:
December 10 2015
Accepted:
February 20 2016
Citation
Yuji Yamagishi, Kei Kobayashi, Kei Noda, Hirofumi Yamada; Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps. Appl. Phys. Lett. 29 February 2016; 108 (9): 093302. https://doi.org/10.1063/1.4943140
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