We investigate how excitonic processes in rubrene single crystals are affected by a deliberately implanted defect gradient induced by proton irradiation. Spatially resolved measurements show a gradually reduced photoluminescence quantum yield and triplet exciton diffusion length along the defect gradient. Both effects are caused by a decrease in the average triplet lifetime due to interaction with the implanted defects. The triplet lifetime was reduced by almost two orders of magnitude at the highest implanted defect density of 1017 cm–3. The strong sensitivity of the photoluminescence quantum yield to the defect density that is observed already at moderate excitation densities is caused by the combination of two effects: the dominant contribution of triplet-fusion to the observed photoluminescence and the long-range diffusion of triplet excitons.
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8 February 2016
Research Article|
February 10 2016
Defect density dependent photoluminescence yield and triplet diffusion length in rubrene Available to Purchase
Pavel Irkhin;
Pavel Irkhin
1Department of Physics,
Lehigh University
, Bethlehem, Pennsylvania 18015, USA
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Ivan Biaggio;
Ivan Biaggio
1Department of Physics,
Lehigh University
, Bethlehem, Pennsylvania 18015, USA
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Tino Zimmerling;
Tino Zimmerling
2Laboratory for Solid State Physics,
ETH Zürich
, 8093 Zürich, Switzerland
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Max Döbeli;
Max Döbeli
3Ion Beam Physics,
ETH Zürich
, 8093 Zürich, Switzerland
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Bertram Batlogg
Bertram Batlogg
2Laboratory for Solid State Physics,
ETH Zürich
, 8093 Zürich, Switzerland
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Pavel Irkhin
1
Ivan Biaggio
1
Tino Zimmerling
2
Max Döbeli
3
Bertram Batlogg
2
1Department of Physics,
Lehigh University
, Bethlehem, Pennsylvania 18015, USA
2Laboratory for Solid State Physics,
ETH Zürich
, 8093 Zürich, Switzerland
3Ion Beam Physics,
ETH Zürich
, 8093 Zürich, Switzerland
Appl. Phys. Lett. 108, 063302 (2016)
Article history
Received:
July 28 2015
Accepted:
January 29 2016
Citation
Pavel Irkhin, Ivan Biaggio, Tino Zimmerling, Max Döbeli, Bertram Batlogg; Defect density dependent photoluminescence yield and triplet diffusion length in rubrene. Appl. Phys. Lett. 8 February 2016; 108 (6): 063302. https://doi.org/10.1063/1.4941756
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