A method for determining deep trapping lifetime in semiconductors using an impedance spectroscopy is proposed. A unique feature of the method is the simultaneous determination of the drift mobility and deep trapping lifetime in thin-film electronic devices. The validity of the proposed method is examined by numerical calculation. Simultaneous determinations of the drift mobility and deep trapping lifetime using this method are demonstrated in prototypical hole transporting organic semiconductors.
Determination of deep trapping lifetime in organic semiconductors using impedance spectroscopy
Kenichiro Takagi, Takashi Nagase, Takashi Kobayashi, Hiroyoshi Naito; Determination of deep trapping lifetime in organic semiconductors using impedance spectroscopy. Appl. Phys. Lett. 1 February 2016; 108 (5): 053305. https://doi.org/10.1063/1.4941235
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