An all-electrical method is presented to determine the exchange constant of magnetic thin films using ferromagnetic resonance. For films of 20 nm thickness and below, the determination of the exchange constant A, a fundamental magnetic quantity, is anything but straightforward. Among others, the most common methods are based on the characterization of perpendicular standing spin-waves. These approaches are however challenging, due to (i) very high energies and (ii) rather small intensities in this thickness regime. In the presented approach, surface patterning is applied to a permalloy (Ni80Fe20) film and a Co2Fe0.4Mn0.6Si Heusler compound. Acting as a magnonic crystal, such structures enable the coupling of backward volume spin-waves to the uniform mode. Subsequent ferromagnetic resonance measurements give access to the spin-wave spectra free of unquantifiable parameters and, thus, to the exchange constant A with high accuracy.
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7 March 2016
Research Article|
March 07 2016
Parameter-free determination of the exchange constant in thin films using magnonic patterning
M. Langer;
M. Langer
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
2Institute for Physics of Solids,
Technische Universität Dresden
, Zellescher Weg 16, 01069 Dresden, Germany
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K. Wagner;
K. Wagner
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
2Institute for Physics of Solids,
Technische Universität Dresden
, Zellescher Weg 16, 01069 Dresden, Germany
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T. Sebastian;
T. Sebastian
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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R. Hübner;
R. Hübner
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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J. Grenzer;
J. Grenzer
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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Yutian Wang;
Yutian Wang
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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T. Kubota;
T. Kubota
3Institute for Materials Research,
Tohoku University
, Sendai 980-8577, Japan
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T. Schneider;
T. Schneider
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
4Department of Physics,
Technische Universität Chemnitz
, Reichenhainer Str. 70, 09126 Chemnitz, Germany
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S. Stienen;
S. Stienen
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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K. Lenz;
K. Lenz
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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H. Schultheiß;
H. Schultheiß
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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J. Lindner;
J. Lindner
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
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K. Takanashi;
K. Takanashi
3Institute for Materials Research,
Tohoku University
, Sendai 980-8577, Japan
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R. E. Arias;
R. E. Arias
5Departamento de Física, CEDENNA, FCFM,
Universidad de Chile
, Casilla 487-3, Santiago, Chile
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J. Fassbender
J. Fassbender
1Helmholtz-Zentrum Dresden–Rossendorf,
Institute of Ion Beam Physics and Materials Research
, Bautzner Landstr. 400, 01328 Dresden, Germany
2Institute for Physics of Solids,
Technische Universität Dresden
, Zellescher Weg 16, 01069 Dresden, Germany
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Appl. Phys. Lett. 108, 102402 (2016)
Article history
Received:
September 23 2015
Accepted:
February 14 2016
Citation
M. Langer, K. Wagner, T. Sebastian, R. Hübner, J. Grenzer, Yutian Wang, T. Kubota, T. Schneider, S. Stienen, K. Lenz, H. Schultheiß, J. Lindner, K. Takanashi, R. E. Arias, J. Fassbender; Parameter-free determination of the exchange constant in thin films using magnonic patterning. Appl. Phys. Lett. 7 March 2016; 108 (10): 102402. https://doi.org/10.1063/1.4943228
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