In order to better understand biochemical processes inside an individual cell, it is important to measure the molecular composition at the submicron level. One of the promising mass spectrometry imaging techniques that may be used to accomplish this is Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), using MeV energy heavy ions for excitation. MeV ions have the ability to desorb large intact molecules with a yield that is several orders of magnitude higher than conventional SIMS using keV ions. In order to increase the spatial resolution of the MeV TOF-SIMS system, we propose an independent TOF trigger using a STIM (scanning transmission ion microscopy) detector that is placed just behind the thin transmission target. This arrangement is suitable for biological samples in which the STIM detector simultaneously measures the mass distribution in scanned samples. The capability of the MeV TOF-SIMS setup was demonstrated by imaging the chemical composition of CaCo-2 cells.
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31 August 2015
Research Article|
September 01 2015
Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy
Zdravko Siketić;
Zdravko Siketić
Ruđer Bošković Institute
, Bijenička cesta 54, 10000 Zagreb, Croatia
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Ivančica Bogdanović Radović;
Ivančica Bogdanović Radović
Ruđer Bošković Institute
, Bijenička cesta 54, 10000 Zagreb, Croatia
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Milko Jakšić;
Milko Jakšić
Ruđer Bošković Institute
, Bijenička cesta 54, 10000 Zagreb, Croatia
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Marijana Popović Hadžija
;
Marijana Popović Hadžija
Ruđer Bošković Institute
, Bijenička cesta 54, 10000 Zagreb, Croatia
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Mirko Hadžija
Mirko Hadžija
Ruđer Bošković Institute
, Bijenička cesta 54, 10000 Zagreb, Croatia
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Appl. Phys. Lett. 107, 093702 (2015)
Article history
Received:
May 20 2015
Accepted:
August 22 2015
Citation
Zdravko Siketić, Ivančica Bogdanović Radović, Milko Jakšić, Marijana Popović Hadžija, Mirko Hadžija; Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy. Appl. Phys. Lett. 31 August 2015; 107 (9): 093702. https://doi.org/10.1063/1.4930062
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