Crystalline-polarity-dependent electronic structures of gallium nitride (GaN) were studied by photoemission spectroscopy (PES) using soft and hard x-rays with different linear polarizations. A peak located near the valence band (VB) maximum was enhanced for a (0001) surface compared with that for a () surface regardless of photon energy. Comparison of the VB density of states obtained by ab-initio calculations with the observed VB-PES spectra indicates that the crystalline-polarity dependence is associated with the Ga 4p and N 2p states. The most plausible origin of the crystalline-polarity-dependent VB feature is based on the photoemission phenomena of electrons in the pz-orbitals due to spontaneous electric polarization along the c-axis of GaN.
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26 October 2015
Research Article|
October 30 2015
Investigating crystalline-polarity-dependent electronic structures of GaN by hard x-ray photoemission and ab-initio calculations Available to Purchase
Takeo Ohsawa;
Takeo Ohsawa
a)
1
National Institute for Materials Science (NIMS)
, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
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Shigenori Ueda;
Shigenori Ueda
2Synchrotron X-ray Station at SPring-8,
NIMS
, Sayo, Hyogo 679-5148, Japan
3
Quantum Beam Unit
, NIMS, Sayo, Hyogo 679-5148, Japan
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Motohiro Suzuki;
Motohiro Suzuki
4
Japan Synchrotron Radiation Research Institute (JASRI)
, Sayo, Hyogo 679-5198, Japan
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Yoshitaka Tateyama;
Yoshitaka Tateyama
5
International Center for Materials Nanoarchitectonics (MANA)
, NIMS, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
6
PRESTO
, Japan Science and Technology Agency (JST), 4-1-8 Honcho, Kawaguchi, Saitama 333-0012, Japan
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Jesse R. Williams;
Jesse R. Williams
5
International Center for Materials Nanoarchitectonics (MANA)
, NIMS, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
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Naoki Ohashi
Naoki Ohashi
1
National Institute for Materials Science (NIMS)
, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
7Materials Research Center for Element Strategy (MCES), Mailbox SE-6,
Tokyo Institute of Technology
, 4259 Nagatsuta, Midori-ku, Yokohama 226-0026, Japan
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Takeo Ohsawa
1,a)
Shigenori Ueda
2,3
Motohiro Suzuki
4
Yoshitaka Tateyama
5,6
Jesse R. Williams
5
Naoki Ohashi
1,7
1
National Institute for Materials Science (NIMS)
, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
2Synchrotron X-ray Station at SPring-8,
NIMS
, Sayo, Hyogo 679-5148, Japan
3
Quantum Beam Unit
, NIMS, Sayo, Hyogo 679-5148, Japan
4
Japan Synchrotron Radiation Research Institute (JASRI)
, Sayo, Hyogo 679-5198, Japan
5
International Center for Materials Nanoarchitectonics (MANA)
, NIMS, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
6
PRESTO
, Japan Science and Technology Agency (JST), 4-1-8 Honcho, Kawaguchi, Saitama 333-0012, Japan
7Materials Research Center for Element Strategy (MCES), Mailbox SE-6,
Tokyo Institute of Technology
, 4259 Nagatsuta, Midori-ku, Yokohama 226-0026, Japan
a)
Electronic mail: [email protected]
Appl. Phys. Lett. 107, 171604 (2015)
Article history
Received:
June 07 2015
Accepted:
October 18 2015
Citation
Takeo Ohsawa, Shigenori Ueda, Motohiro Suzuki, Yoshitaka Tateyama, Jesse R. Williams, Naoki Ohashi; Investigating crystalline-polarity-dependent electronic structures of GaN by hard x-ray photoemission and ab-initio calculations. Appl. Phys. Lett. 26 October 2015; 107 (17): 171604. https://doi.org/10.1063/1.4934842
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