We demonstrate polarity-sensitive orientation mapping of non-centrosymmetric phases by Electron Backscatter Diffraction (EBSD). The method overcomes the restrictions of kinematic orientation determination by EBSD, which is limited to the centro-symmetric Laue-groups according to Friedel's rule. Using polycrystalline GaP as an example, we apply a quantitative pattern matching approach based on simulations using the dynamical theory of electron diffraction. This procedure results in a distinct assignment of the local orientation according to the non-centrosymmetric point group of the crystal structure under investigation.

1.
J. F.
Nye
,
Physical Properties of Crystals
(
Clarendon Press
,
Oxford
,
1985
).
2.
Electron Backscatter Diffraction in Materials Science
, 2nd ed., edited by
A. J.
Schwartz
,
M.
Kumar
,
B. L.
Adams
, and
D. P.
Field
(
Springer
,
Berlin
,
2009
).
3.
B.
Adams
,
S.
Wright
, and
K.
Kunze
,
Metall. Trans. A
24
,
819
(
1993
).
4.
D. J.
Dingley
and
S. I.
Wright
,
J. Appl. Crystallogr.
42
,
234
(
2009
).
5.
M. N.
Alam
,
M.
Blackman
, and
D. W.
Pashley
,
Proc. R. Soc. London, Ser. A
221
,
224
(
1954
).
6.
K.
Marthinsen
and
R.
Høier
,
Acta Crystallogr., Sect. A
44
,
700
(
1988
).
7.
K. Z.
Baba-Kishi
and
D. J.
Dingley
,
Scanning
11
,
305
(
1989
).
8.
A.
Winkelmann
,
C.
Trager-Cowan
,
F.
Sweeney
,
A. P.
Day
, and
P.
Parbrook
,
Ultramicroscopy
107
,
414
(
2007
).
9.
A. J.
Wilkinson
and
T. B.
Britton
,
Mater. Today
15
,
366
(
2012
).
10.
S. U.
Park
,
D.
Wei
,
M.
De Graef
,
M.
Shah
,
J.
Simmons
, and
A.
Hero
, in
20th IEEE International Conference on Image Processing (ICIP)
(
2013
), pp.
3780
3784
.
11.
P. G.
Callahan
and
M.
De Graef
,
Microsc. Microanal.
19
,
1255
(
2013
).
12.
G.
Nolze
and
A.
Winkelmann
,
Cryst. Res. Technol.
49
,
490
(
2014
).
13.
A.
Winkelmann
and
G.
Nolze
,
Ultramicroscopy
149
,
58
(
2015
).
14.
L. T.
Romano
,
J. E.
Northrup
, and
M. A.
O'Keefe
,
Appl. Phys. Lett.
69
,
2394
(
1996
).
15.
R. M.
Kemper
,
T.
Schupp
,
M.
Häberlen
,
T.
Niendorf
,
H.-J.
Maier
,
A.
Dempewolf
,
F.
Bertram
,
J.
Christen
,
R.
Kirste
,
A.
Hoffmann
,
J.
Lindner
, and
D.
Josef As
,
J. Appl. Phys.
110
,
123512
(
2011
).
16.
F.
Liu
,
R.
Collazo
,
S.
Mita
,
Z.
Sitar
,
S. J.
Pennycook
, and
G.
Duscher
,
Adv. Mater.
20
,
2162
(
2008
).
17.
A.
Beyer
,
B.
Haas
,
K. I.
Gries
,
K.
Werner
,
M.
Luysberg
,
W.
Stolz
, and
K.
Volz
,
Appl. Phys. Lett.
103
,
032107
(
2013
).
19.
M.
De Graef
and
M. E.
McHenry
,
Structure of Materials. An Introduction to Crystallography, Diffraction and Symmetry
, 2nd ed. (
Cambridge University Press
,
2012
).
20.
O.
Engler
and
V.
Randle
,
Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping
, 2nd ed. (
CRC Press
,
Boston, MA, USA
,
2009
).
21.
N. C.
Krieger Lassen
,
Micron Microsc. Acta
23
,
191
(
1992
).
22.
R. C.
Gonzalez
and
R. E.
Woods
,
Digital Image Processing
, 2nd ed. (
Addison-Wesley Longman Publishing Co., Inc.
,
Boston, MA, USA
,
1992
).
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