We demonstrate polarity-sensitive orientation mapping of non-centrosymmetric phases by Electron Backscatter Diffraction (EBSD). The method overcomes the restrictions of kinematic orientation determination by EBSD, which is limited to the centro-symmetric Laue-groups according to Friedel's rule. Using polycrystalline GaP as an example, we apply a quantitative pattern matching approach based on simulations using the dynamical theory of electron diffraction. This procedure results in a distinct assignment of the local orientation according to the non-centrosymmetric point group of the crystal structure under investigation.
References
1.
2.
Electron Backscatter Diffraction in Materials Science
, 2nd ed., edited by A. J.
Schwartz
, M.
Kumar
, B. L.
Adams
, and D. P.
Field
(Springer
, Berlin
, 2009
).3.
B.
Adams
, S.
Wright
, and K.
Kunze
, Metall. Trans. A
24
, 819
(1993
).4.
D. J.
Dingley
and S. I.
Wright
, J. Appl. Crystallogr.
42
, 234
(2009
).5.
M. N.
Alam
, M.
Blackman
, and D. W.
Pashley
, Proc. R. Soc. London, Ser. A
221
, 224
(1954
).6.
K.
Marthinsen
and R.
Høier
, Acta Crystallogr., Sect. A
44
, 700
(1988
).7.
K. Z.
Baba-Kishi
and D. J.
Dingley
, Scanning
11
, 305
(1989
).8.
A.
Winkelmann
, C.
Trager-Cowan
, F.
Sweeney
, A. P.
Day
, and P.
Parbrook
, Ultramicroscopy
107
, 414
(2007
).9.
A. J.
Wilkinson
and T. B.
Britton
, Mater. Today
15
, 366
(2012
).10.
S. U.
Park
, D.
Wei
, M.
De Graef
, M.
Shah
, J.
Simmons
, and A.
Hero
, in 20th IEEE International Conference on Image Processing (ICIP)
(2013
), pp. 3780
–3784
.11.
P. G.
Callahan
and M.
De Graef
, Microsc. Microanal.
19
, 1255
(2013
).12.
G.
Nolze
and A.
Winkelmann
, Cryst. Res. Technol.
49
, 490
(2014
).13.
A.
Winkelmann
and G.
Nolze
, Ultramicroscopy
149
, 58
(2015
).14.
L. T.
Romano
, J. E.
Northrup
, and M. A.
O'Keefe
, Appl. Phys. Lett.
69
, 2394
(1996
).15.
R. M.
Kemper
, T.
Schupp
, M.
Häberlen
, T.
Niendorf
, H.-J.
Maier
, A.
Dempewolf
, F.
Bertram
, J.
Christen
, R.
Kirste
, A.
Hoffmann
, J.
Lindner
, and D.
Josef As
, J. Appl. Phys.
110
, 123512
(2011
).16.
F.
Liu
, R.
Collazo
, S.
Mita
, Z.
Sitar
, S. J.
Pennycook
, and G.
Duscher
, Adv. Mater.
20
, 2162
(2008
).17.
A.
Beyer
, B.
Haas
, K. I.
Gries
, K.
Werner
, M.
Luysberg
, W.
Stolz
, and K.
Volz
, Appl. Phys. Lett.
103
, 032107
(2013
).18.
D.
Dingley
, J. Microsc.
213
, 214
(2004
).19.
M.
De Graef
and M. E.
McHenry
, Structure of Materials. An Introduction to Crystallography, Diffraction and Symmetry
, 2nd ed. (Cambridge University Press
, 2012
).20.
O.
Engler
and V.
Randle
, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping
, 2nd ed. (CRC Press
, Boston, MA, USA
, 2009
).21.
N. C.
Krieger Lassen
, Micron Microsc. Acta
23
, 191
(1992
).22.
R. C.
Gonzalez
and R. E.
Woods
, Digital Image Processing
, 2nd ed. (Addison-Wesley Longman Publishing Co., Inc.
, Boston, MA, USA
, 1992
).© 2015 AIP Publishing LLC.
2015
AIP Publishing LLC
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