The confinement effect and electrical characteristics of heterostructure-emitter bipolar transistors with an AlGaInP bulk-confinement layer and an AlGaInP/GaAs superlattice-confinement layer are first demonstrated and compared by experimentally results. In the two devices, the relatively large valence band discontinuity at AlGaInP/GaAs heterojunction provides excellent confinement effect for holes to enhance current gain. As to the AlGaInP/GaAs superlattice-confinement device, part of thermionic-emission electrons will be trapped in the GaAs quantum wells of the superlattice. This will result in lower collector current and current gain as compared with the bulk-confinement device. Nevertheless, the superlattice-confinement device exhibits a larger current-gain cutoff frequency, which can be attributed that the tunneling behavior is included in the carrier transportation and transporting time across the emitter region could be substantially reduced.

1.
G.
Attolini
,
C.
Bocchi
,
F.
Germini
,
C.
Pelosi
,
A.
Parisini
,
L.
Tarricone
,
R.
Kùdela
, and
S.
Hasenohrl
,
Mater. Chem. Phys.
66
,
246
(
2000
).
2.
H.
Yamada
,
N.
Fukuhara
, and
M.
Hata
,
J. Cryst. Growth
298
,
857
(
2007
).
3.
L. T.
Manera
,
L. B.
Zoccal
,
J. A.
Diniz
,
P. J.
Tatsch
, and
I.
Doi
,
Appl. Surf.
254
,
6063
(
2008
).
4.
S. Y.
Cheng
,
Solid-State Electron.
48
,
1087
(
2004
).
5.
J. H.
Tsai
,
K. P.
Zhu
,
Y. C.
Chu
, and
S. Y.
Chiu
,
Mater. Chem. Phys.
87
,
435
(
2004
).
6.
J. J.
Liou
,
C. S.
Ho
,
L. L.
Liou
, and
C. I.
Huang
,
Solid-State Electron.
36
,
819
(
1993
).
7.
N.
Bovolon
,
R.
Schultheis
,
J. E.
Muller
,
P.
Zwicknagl
, and
E.
Zanoni
,
IEEE Trans. Electron Devices
46
,
622
(
1999
).
8.
B. P.
Yan
,
E. S.
Yang
,
Y. F.
Yang
,
X. Q.
Wang
, and
C. C.
Hsu
,
IEEE Trans. Electron Devices
50
,
2154
(
2003
).
9.
J. H.
Tsai
,
C. H.
Huang
,
Y. C.
Ma
, and
Y. R.
Wu
,
Semiconductors
46
,
1539
(
2012
).
10.
J. H.
Tsai
and
Y. J.
Chu
,
Mater. Chem. Phys.
91
,
431
(
2005
).
11.
Y. S.
Lin
,
Y. J.
Jou
, and
P. C.
Hung
,
Appl. Phys. Lett.
94
,
063506
(
2009
).
12.
M. O.
Watanabe
and
Y.
Ohba
:
Appl. Phys. Lett.
50
,
906
(
1987
).
13.
H. K.
Yow
,
P. A.
Houston
,
C. M.
Sidney Ng
,
C.
Button
, and
J. S.
Roberts
,
IEEE Trans. Electron Devices
43
,
2
(
1996
).
14.
Y. S.
Lin
and
J. J.
Jiang
,
IEEE Electron Device Lett.
29
,
671
(
2008
).
15.
L. L.
Liou
,
J.
Ebel
, and
C. I.
Huang
,
IEEE Trans. Electron Devices
39
,
742
(
1992
).
You do not currently have access to this content.