We characterized transport and optical properties of atomic layer deposited Nb:TiO2 thin films on glass substrates. These promising transparent conducting oxide (TCO) materials show minimum resistivity of 1.0 × 10−3 Ω cm at 300 K and high transmittance in the visible range. Low-temperature (2–300 K) Hall measurements and the Drude fitting of the Vis-NIR optical spectra indicate a transition in the scattering mechanism from grain boundary scattering to intra-grain scattering with increasing Nb content, thus underlining enhancement of the grain size in the low doping regime as the key for further improved TCO properties.

1.
S. X.
Zhang
,
D. C.
Kundaliya
,
W.
Yu
,
S.
Dhar
,
S. Y.
Young
,
L. G.
Salamanca-Riba
,
S. B.
Ogale
,
R. D.
Vispute
, and
T.
Venkatesan
,
J. Appl. Phys.
102
,
013701
(
2007
).
2.
Y.
Furubayashi
,
T.
Hitosugi
,
Y.
Yamamoto
,
K.
Inaba
,
G.
Kinoda
,
Y.
Hirose
,
T.
Shimada
, and
T.
Hasegawa
,
Appl. Phys. Lett.
86
,
252101
(
2005
).
3.
M. A.
Gillispie
,
M. F. A. M.
van Hest
,
M. S.
Dabney
,
J. D.
Perkins
, and
D. S.
Ginley
,
J. Appl. Phys.
101
,
033125
(
2007
).
4.
T.
Hitosugi
,
N.
Yamada
,
S.
Nakao
,
Y.
Hirose
, and
T.
Hasegawa
,
Phys. Status Solidi A
207
,
1529
1537
(
2010
).
5.
V.
Miikkulainen
,
M.
Leskelä
,
M.
Ritala
, and
R. L.
Puurunen
,
J. Appl. Phys.
113
,
021301
(
2013
).
6.
M.
Ritala
,
T.
Asikainen
, and
M.
Leskelä
,
Electrochem. Solid State Lett.
1
(
3
),
156
157
(
1998
).
7.
K. S.
An
,
W.
Cho
,
B. K.
Lee
,
S. S.
Lee
, and
C. G.
Kim
,
J. Nanosci. Nanotechnol.
8
,
4856
4859
(
2008
).
8.
T.
Tynell
and
M.
Karppinen
,
Semicond. Sci. Technol.
29
,
043001
(
2014
).
9.
M.
Knez
,
K.
Nielsch
, and
L.
Niinistö
,
Adv. Mater.
19
,
3425
3438
(
2007
).
10.
P.
Sundberg
and
M.
Karppinen
,
Beilstein J. Nanotechnol.
5
,
1104
1136
(
2014
).
11.
J.-P.
Niemelä
and
M.
Karppinen
,
Dalton Trans.
44
,
591
597
(
2015
).
12.
T.
Tynell
,
I.
Terasaki
,
H.
Yamauchi
, and
M.
Karppinen
,
J. Mater. Chem. A
1
,
13619
13624
(
2013
).
13.
J.-P.
Niemelä
,
H.
Yamauchi
, and
M.
Karppinen
,
Thin Solid Films
551
,
19
22
(
2014
).
14.
V.
Pore
,
M.
Ritala
,
M.
Leskelä
,
T.
Saukkonen
, and
M.
Järn
,
Cryst. Growth Des.
9
,
2974
2978
(
2009
).
15.
See supplementary material at http://dx.doi.org/10.1063/1.4906865 for XRD patterns as well as for PLM and SEM images.
16.
Y.
Hirose
,
N.
Yamada
,
S.
Nakao
,
T.
Hitosugi
,
T.
Shimada
, and
T.
Hasegawa
,
Phys. Rev. B
79
,
165108
(
2009
).
17.
B. E.
Sernelius
,
K.-F.
Berggren
,
Z.-C.
Jin
,
I.
Hamberg
, and
C. G.
Granvqvist
,
Phys. Rev. B
37
(
17
),
10244
10248
(
1988
).
18.
H.
Tang
,
F.
Lévy
,
H.
Berger
, and
P. E.
Schmid
,
Phys. Rev. B
52
(
11
),
7771
7774
(
1995
).
19.
Y.
Furubayashi
,
N.
Yamada
,
Y.
Hirose
,
Y.
Yamamoto
,
M.
Otani
,
T.
Hitosugi
,
T.
Shimada
, and
T.
Hasegawa
,
J. Appl. Phys.
101
,
093705
(
2007
).
20.
H. P. R.
Frederikse
,
J. Appl. Phys.
32
,
2211
2215
(
1961
).
21.
Handbook of Transparent Conductors
, edited by
D. S.
Ginley
,
H.
Hosono
, and
D. C.
Paine
(
Springer
,
2010
), pp.
52
, 125.
22.
J.
Steinhauser
,
S.
Faÿ
,
N.
Oliveira
,
E.
Vallat-Sauvain
, and
C.
Ballif
,
Appl. Phys. Lett.
90
,
142107
(
2007
).
23.
N.
Hosaka
,
T.
Sekiya
,
C.
Satoko
, and
S.
Kurita
,
J. Phys. Soc. Jpn.
66
,
877
880
(
1997
).

Supplementary Material

You do not currently have access to this content.