We characterized transport and optical properties of atomic layer deposited Nb:TiO2 thin films on glass substrates. These promising transparent conducting oxide (TCO) materials show minimum resistivity of 1.0 × 10−3 Ω cm at 300 K and high transmittance in the visible range. Low-temperature (2–300 K) Hall measurements and the Drude fitting of the Vis-NIR optical spectra indicate a transition in the scattering mechanism from grain boundary scattering to intra-grain scattering with increasing Nb content, thus underlining enhancement of the grain size in the low doping regime as the key for further improved TCO properties.
References
1.
S. X.
Zhang
, D. C.
Kundaliya
, W.
Yu
, S.
Dhar
, S. Y.
Young
, L. G.
Salamanca-Riba
, S. B.
Ogale
, R. D.
Vispute
, and T.
Venkatesan
, J. Appl. Phys.
102
, 013701
(2007
).2.
Y.
Furubayashi
, T.
Hitosugi
, Y.
Yamamoto
, K.
Inaba
, G.
Kinoda
, Y.
Hirose
, T.
Shimada
, and T.
Hasegawa
, Appl. Phys. Lett.
86
, 252101
(2005
).3.
M. A.
Gillispie
, M. F. A. M.
van Hest
, M. S.
Dabney
, J. D.
Perkins
, and D. S.
Ginley
, J. Appl. Phys.
101
, 033125
(2007
).4.
T.
Hitosugi
, N.
Yamada
, S.
Nakao
, Y.
Hirose
, and T.
Hasegawa
, Phys. Status Solidi A
207
, 1529
–1537
(2010
).5.
V.
Miikkulainen
, M.
Leskelä
, M.
Ritala
, and R. L.
Puurunen
, J. Appl. Phys.
113
, 021301
(2013
).6.
M.
Ritala
, T.
Asikainen
, and M.
Leskelä
, Electrochem. Solid State Lett.
1
(3
), 156
–157
(1998
).7.
K. S.
An
, W.
Cho
, B. K.
Lee
, S. S.
Lee
, and C. G.
Kim
, J. Nanosci. Nanotechnol.
8
, 4856
–4859
(2008
).8.
T.
Tynell
and M.
Karppinen
, Semicond. Sci. Technol.
29
, 043001
(2014
).9.
M.
Knez
, K.
Nielsch
, and L.
Niinistö
, Adv. Mater.
19
, 3425
–3438
(2007
).10.
P.
Sundberg
and M.
Karppinen
, Beilstein J. Nanotechnol.
5
, 1104
–1136
(2014
).11.
J.-P.
Niemelä
and M.
Karppinen
, Dalton Trans.
44
, 591
–597
(2015
).12.
T.
Tynell
, I.
Terasaki
, H.
Yamauchi
, and M.
Karppinen
, J. Mater. Chem. A
1
, 13619
–13624
(2013
).13.
J.-P.
Niemelä
, H.
Yamauchi
, and M.
Karppinen
, Thin Solid Films
551
, 19
–22
(2014
).14.
V.
Pore
, M.
Ritala
, M.
Leskelä
, T.
Saukkonen
, and M.
Järn
, Cryst. Growth Des.
9
, 2974
–2978
(2009
).15.
See supplementary material at http://dx.doi.org/10.1063/1.4906865 for XRD patterns as well as for PLM and SEM images.
16.
Y.
Hirose
, N.
Yamada
, S.
Nakao
, T.
Hitosugi
, T.
Shimada
, and T.
Hasegawa
, Phys. Rev. B
79
, 165108
(2009
).17.
B. E.
Sernelius
, K.-F.
Berggren
, Z.-C.
Jin
, I.
Hamberg
, and C. G.
Granvqvist
, Phys. Rev. B
37
(17
), 10244
–10248
(1988
).18.
H.
Tang
, F.
Lévy
, H.
Berger
, and P. E.
Schmid
, Phys. Rev. B
52
(11
), 7771
–7774
(1995
).19.
Y.
Furubayashi
, N.
Yamada
, Y.
Hirose
, Y.
Yamamoto
, M.
Otani
, T.
Hitosugi
, T.
Shimada
, and T.
Hasegawa
, J. Appl. Phys.
101
, 093705
(2007
).20.
H. P. R.
Frederikse
, J. Appl. Phys.
32
, 2211
–2215
(1961
).21.
Handbook of Transparent Conductors
, edited by D. S.
Ginley
, H.
Hosono
, and D. C.
Paine
(Springer
, 2010
), pp. 52
, 125.22.
J.
Steinhauser
, S.
Faÿ
, N.
Oliveira
, E.
Vallat-Sauvain
, and C.
Ballif
, Appl. Phys. Lett.
90
, 142107
(2007
).23.
N.
Hosaka
, T.
Sekiya
, C.
Satoko
, and S.
Kurita
, J. Phys. Soc. Jpn.
66
, 877
–880
(1997
).© 2015 AIP Publishing LLC.
2015
AIP Publishing LLC
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