Electronic properties of fullerene derivatives containing oligothiophene pendant chain (1–3 thiophene moieties) were investigated using the Kelvin probe technique and quantum chemistry methods. For electrochemical examination of these systems, Langmuir–Blodgett (LB) layers were prepared by the deposition on a gold substrate. The analysis of the experimental data shows that the value of the work function depends strongly on the length of oligothiophene chain. Similar dependence was also found for the surface photovoltage measurements conducted for the layers consisting of multiple LB films of the examined compounds deposited on gold surfaces. The assumption has been made that these changes are associated with the influence of oligothiophene chain on the electrostatic potential distribution near the surface of the sample. The hypothesis was confirmed by the results of DFT calculations, which revealed that the value of Fermi level energy shifts in the opposite direction to the determined work function. The key highlights of this study are as follows: electronic structure tuning by oligothiophene side chain; DFT calculation on fullerene-thiophene system; work function measurements of thin molecular layers.
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26 January 2015
Research Article|
January 28 2015
Tuning of electronic properties of fullerene-oligothiophene layers Available to Purchase
Kornelia Lewandowska;
Kornelia Lewandowska
1
Institute of Molecular Physics
, Polish Academy of Sciences, ul. Smoluchowskiego 17, 60-179 Poznań, Poland
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Kacper Pilarczyk;
Kacper Pilarczyk
a)
2Faculty of Physics and Applied Computer Science,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
3Academic Centre for Materials and Nanotechnology,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
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Agnieszka Podborska;
Agnieszka Podborska
4Faculty of Non-Ferrous Metals,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
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Tae-Dong Kim;
Tae-Dong Kim
5Department of Advanced Materials,
Hannam University
, 305-811 Daejeon, South Korea
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Kwang-Sup Lee;
Kwang-Sup Lee
5Department of Advanced Materials,
Hannam University
, 305-811 Daejeon, South Korea
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Konrad Szaciłowski
Konrad Szaciłowski
a)
3Academic Centre for Materials and Nanotechnology,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
4Faculty of Non-Ferrous Metals,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
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Kornelia Lewandowska
1
Kacper Pilarczyk
2,3,a)
Agnieszka Podborska
4
Tae-Dong Kim
5
Kwang-Sup Lee
5
Konrad Szaciłowski
3,4,a)
1
Institute of Molecular Physics
, Polish Academy of Sciences, ul. Smoluchowskiego 17, 60-179 Poznań, Poland
2Faculty of Physics and Applied Computer Science,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
3Academic Centre for Materials and Nanotechnology,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
4Faculty of Non-Ferrous Metals,
AGH University of Science and Technology
, al. A. Mickiewicza 30, 30-059 Kraków, Poland
5Department of Advanced Materials,
Hannam University
, 305-811 Daejeon, South Korea
a)
Authors to whom correspondence should be addressed. Electronic addresses: [email protected] and [email protected]
Appl. Phys. Lett. 106, 041602 (2015)
Article history
Received:
September 11 2014
Accepted:
January 16 2015
Citation
Kornelia Lewandowska, Kacper Pilarczyk, Agnieszka Podborska, Tae-Dong Kim, Kwang-Sup Lee, Konrad Szaciłowski; Tuning of electronic properties of fullerene-oligothiophene layers. Appl. Phys. Lett. 26 January 2015; 106 (4): 041602. https://doi.org/10.1063/1.4906867
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