Multiple “collapsing” field domains are a physical reason for superfast switching and sub-terahertz (sub-THz) emission experimentally observed in powerfully avalanching GaAs structures. This phenomenon, however, has been studied so far without considering carrier energy relaxation and that essentially has restricted the possibility of correct interpretation of experimental results. Here, we apply a hydrodynamic approach accounting for non-local hot-carrier effects. The results confirm the collapsing domain concept, but show that the domains cannot reduce well below 100 nm in width, since a moving collapsing domain leaves behind it a tail of hot carriers, which causes broadening in the rear wall of the domain. This puts principal restrictions on the emission band achievable with our unique avalanche mm-wave source to about 1 THz. Another finding suggested here is a physical mechanism for the single collapsing domain's quasi-steady-state motion determined by powerful impact ionization. The results are of significance for physical interpretation of properties of our pulsed sub-THz source, which has recently demonstrated its application potential in mm-wave imaging in both amplitude and time-domain pulse modes with picosecond time-of-flight precision.
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4 May 2015
Research Article|
May 07 2015
Effect of hot-carrier energy relaxation on main properties of collapsing field domains in avalanching GaAs
V. Palankovski
;
V. Palankovski
a)
1Institute for Microelectronics,
Technical University Vienna
, 1040 Vienna, Austria
2Electronics Laboratory, Department of Electrical Engineering,
University of Oulu
, 90014 Oulu, Finland
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S. Vainshtein;
S. Vainshtein
2Electronics Laboratory, Department of Electrical Engineering,
University of Oulu
, 90014 Oulu, Finland
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V. Yuferev;
V. Yuferev
3Department of Applied Mathematics and Mathematical Physics,
Ioffe Institute
, 194021 St. Petersburg, Russia
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J. Kostamovaara;
J. Kostamovaara
2Electronics Laboratory, Department of Electrical Engineering,
University of Oulu
, 90014 Oulu, Finland
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V. Egorkin
V. Egorkin
4
National Research University of Electronic Technology MIET
, 124498 Zelenograd, Moscow, Russia
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a)
Electronic mail: [email protected]
Appl. Phys. Lett. 106, 183505 (2015)
Article history
Received:
December 03 2014
Accepted:
April 30 2015
Citation
V. Palankovski, S. Vainshtein, V. Yuferev, J. Kostamovaara, V. Egorkin; Effect of hot-carrier energy relaxation on main properties of collapsing field domains in avalanching GaAs. Appl. Phys. Lett. 4 May 2015; 106 (18): 183505. https://doi.org/10.1063/1.4921006
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