We have performed the site-specific, quantitative measurement of a local surface potential induced by atomic dipoles on a Si(111)-(7 × 7) surface by non-contact scanning nonlinear dielectric microscopy (NC-SNDM) combined with an atom-tracking technique. The measured potentials were quantitatively consistent with those estimated by a simultaneous measurement of the tunneling current, which validates a previously proposed hypothetical mechanism that explains the unexpected resemblance between the dipole and time-averaged tunneling current images in NC-SNDM imaging. The results show that an asymmetry arising in the current-voltage characteristics within the tunneling regime is governed by the local surface potential induced by atomic dipoles.
References
1.
J.
Bardeen
, Phys. Rev.
49
, 653
(1936
).2.
J.
Tersoff
, Phys. Rev. B
30
, 4874
(1984
).3.
D.
Jena
, A. C.
Gossard
, and U. K.
Mishra
, J. Appl. Phys.
88
, 4734
(2000
).4.
H.
Ota
, A.
Hirano
, Y.
Watanabe
, N.
Yasuda
, K.
Iwamoto
, K.
Akiyama
, K.
Okada
, S.
Migita
, T.
Nabatame
, and A.
Toriumi
, IEEE Int. Electron Devices Meet.
2007
, 65
–68
.5.
I. H.
Campbell
, S.
Rubin
, T. A.
Zawodzinski
, J. D.
Kress
, R. L.
Martin
, D. L.
Smith
, N. N.
Barashkov
, and J. P.
Ferraris
, Phys. Rev. B
54
, R14321
(1996
).6.
B. E.
Coss
, W.-Y.
Loh
, R. M.
Wallace
, J.
Kim
, P.
Majhi
, and R.
Jammy
, Appl. Phys. Lett.
95
, 222105
(2009
).7.
T.
Yajima
, Y.
Hikita
, and H. Y.
Hwang
, Nat. Mater.
10
, 198
(2011
).8.
C.
Ganzorig
, K.-J.
Kwak
, K.
Yagi
, and M.
Fujihira
, Appl. Phys. Lett.
79
, 272
(2001
).9.
I.
De
, D.
Johri
, A.
Srivastava
, and C.
Osburn
, Solid-State Electron.
44
, 1077
(2000
).10.
T.
Susaki
, A.
Makishima
, and H.
Hosono
, Phys. Rev. B
84
, 115456
(2011
).11.
Y.
Yamamoto
, K.
Kita
, K.
Kyuno
, and A.
Toriumi
, Jpn. J. Appl. Phys., Part 1
46
, 7251
(2007
).12.
K.
Iwamoto
, Y.
Kamimuta
, A.
Ogawa
, Y.
Watanabe
, S.
Migita
, W.
Mizubayashi
, Y.
Morita
, M.
Takahashi
, H.
Ota
, T.
Nabatame
, and A.
Toriumi
, Appl. Phys. Lett.
92
, 132907
(2008
).13.
K.
Kita
and A.
Toriumi
, Appl. Phys. Lett.
94
, 132902
(2009
).14.
K.
Ohara
and Y.
Cho
, Nanotechnology
16
, S54
(2005
).15.
Y.
Cho
and R.
Hirose
, Phys. Rev. Lett.
99
, 186101
(2007
).16.
S.-i.
Kobayashi
and Y.
Cho
, Phys. Rev. B
82
, 245427
(2010
).17.
N.
Kin
, Y.
Osa
, and Y.
Cho
, J. Appl. Phys.
106
, 014302
(2009
).18.
K.
Yamasue
and Y.
Cho
, J. Appl. Phys.
113
, 014307
(2013
).19.
D.
Mizuno
, K.
Yamasue
, and Y.
Cho
, Appl. Phys. Lett.
103
, 101601
(2013
).20.
S.
Sadewasser
, P.
Jelinek
, C.-K.
Fang
, O.
Custance
, Y.
Yamada
, Y.
Sugimoto
, M.
Abe
, and S.
Morita
, Phys. Rev. Lett.
103
, 266103
(2009
).21.
D. W.
Pohl
and R.
Möller
, Rev. Sci. Instrum.
59
, 840
(1988
).22.
B. S.
Swartzentruber
, Phys. Rev. Lett.
76
, 459
(1996
).23.
M.
Abe
, Y.
Sugimoto
, Ó.
Custance
, and S.
Morita
, Nanotechnology
16
, 3029
(2005
).24.
M.
Abe
, Y.
Sugimoto
, O.
Custance
, and S.
Morita
, Appl. Phys. Lett.
87
, 173503
(2005
).25.
Y.
Cho
, A.
Kirihara
, and T.
Saeki
, Rev. Sci. Instrum.
67
, 2297
(1996
).26.
D.
Nečas
and P.
Klapetek
, Cent. Eur. J. Phys.
10
, 181
(2012
).27.
I.
Horcas
, R.
Fernández
, J. M.
Gómez-Rodríguez
, J.
Colchero
, J.
Gómez-Herrero
, and A. M.
Baro
, Rev. Sci. Instrum.
78
, 013705
(2007
).28.
M.
McEllistrem
, G.
Haase
, D.
Chen
, and R. J.
Hamers
, Phys. Rev. Lett.
70
, 2471
(1993
).29.
M.
Nonnenmacher
, M. P.
O'Boyle
, and H. K.
Wickramasinghe
, Appl. Phys. Lett.
58
, 2921
(1991
).30.
G.
Binnig
, H.
Rohrer
, C.
Gerber
, and E.
Weibel
, Phys. Rev. Lett.
49
, 57
(1982
).© 2014 AIP Publishing LLC.
2014
AIP Publishing LLC
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