Vertical gate-all-around (GAA) junctionless nanowire transistors (JNTs) with different diameters and underlap lengths are investigated using three-dimensional device simulations. The source-side diameter determines the on-current and drain-induced barrier lowering characteristics, whereas the drain-side diameter controls the band-to-band tunneling current during off-state conditions. The JNTs with short drain-side underlap lengths decrease the source/drain series resistance but increase the off-current values, especially due to large band-gap narrowing effects at the drain extension region. Proper device design of vertical GAA JNTs considering the device structure and underlap is needed to improve both on/off and short channel characteristics.
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8 September 2014
Research Article|
September 09 2014
Vertical gate-all-around junctionless nanowire transistors with asymmetric diameters and underlap lengths Available to Purchase
Jun-Sik Yoon;
Jun-Sik Yoon
1Department of Creative IT Engineering and Future IT Innovation Lab,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
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Taiuk Rim;
Taiuk Rim
1Department of Creative IT Engineering and Future IT Innovation Lab,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
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Jungsik Kim;
Jungsik Kim
2Division of IT Convergence Engineering,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
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Meyya Meyyappan;
Meyya Meyyappan
2Division of IT Convergence Engineering,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
3
NASA Ames Research Center
, Moffett Field, California 94035, USA
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Chang-Ki Baek;
Chang-Ki Baek
1Department of Creative IT Engineering and Future IT Innovation Lab,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
4Department of Electrical Engineering,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
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Yoon-Ha Jeong
Yoon-Ha Jeong
4Department of Electrical Engineering,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
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Jun-Sik Yoon
1
Taiuk Rim
1
Jungsik Kim
2
Meyya Meyyappan
2,3
Chang-Ki Baek
1,4
Yoon-Ha Jeong
4
1Department of Creative IT Engineering and Future IT Innovation Lab,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
2Division of IT Convergence Engineering,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
3
NASA Ames Research Center
, Moffett Field, California 94035, USA
4Department of Electrical Engineering,
Pohang University of Science and Technology
, Pohang 790-784, South Korea
Appl. Phys. Lett. 105, 102105 (2014)
Article history
Received:
July 14 2014
Accepted:
August 26 2014
Citation
Jun-Sik Yoon, Taiuk Rim, Jungsik Kim, Meyya Meyyappan, Chang-Ki Baek, Yoon-Ha Jeong; Vertical gate-all-around junctionless nanowire transistors with asymmetric diameters and underlap lengths. Appl. Phys. Lett. 8 September 2014; 105 (10): 102105. https://doi.org/10.1063/1.4895030
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