We demonstrate robust, high-speed random number generation using interference of the steady-state emission of guaranteed random phases, obtained through gain-switching a semiconductor laser diode. Steady-state emission tolerates large temporal pulse misalignments and therefore significantly improves the interference quality. Using an 8-bit digitizer followed by a finite-impulse-response unbiasing algorithm, we achieve random number generation rates of 8 and 20 Gb/s, for laser repetition rates of 1 and 2.5 GHz, respectively, with a ±20% tolerance in the interferometer differential delay. We also report a generation rate of 80 Gb/s using partially phase-correlated short pulses. In relation to the field of quantum key distribution, our results confirm the gain-switched laser diode as a suitable light source, capable of providing phase-randomized coherent pulses at a clock rate of up to 2.5 GHz.
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30 June 2014
Research Article|
July 02 2014
Robust random number generation using steady-state emission of gain-switched laser diodes Available to Purchase
Z. L. Yuan;
Z. L. Yuan
a)
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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M. Lucamarini;
M. Lucamarini
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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J. F. Dynes;
J. F. Dynes
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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B. Fröhlich;
B. Fröhlich
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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A. Plews;
A. Plews
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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A. J. Shields
A. J. Shields
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
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Z. L. Yuan
a)
M. Lucamarini
J. F. Dynes
B. Fröhlich
A. Plews
A. J. Shields
Toshiba Research Europe Limited, Cambridge Research Laboratory
, 208 Cambridge Science Park, Milton Road, Cambridge CB4 0GZ, United Kingdom
Appl. Phys. Lett. 104, 261112 (2014)
Article history
Received:
May 20 2014
Accepted:
June 19 2014
Citation
Z. L. Yuan, M. Lucamarini, J. F. Dynes, B. Fröhlich, A. Plews, A. J. Shields; Robust random number generation using steady-state emission of gain-switched laser diodes. Appl. Phys. Lett. 30 June 2014; 104 (26): 261112. https://doi.org/10.1063/1.4886761
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