Carrier mobility in organic solar cells is almost exclusively determined with the Charge Extraction by Linearly Increasing Voltage (CELIV) technique; indeed much of our understanding of the recombination and charge transport mechanisms in organic solar cells is based on CELIV measurements. However, since the conception of the CELIV method, our understanding of organic semiconductors has significantly advanced. In this work, we critically examine the CELIV methods ability to provide accurate material data in the light of recent advances in our understanding of trap states and their influence on mobility in organic semiconductors. We then apply this knowledge to understand the mechanisms responsible for degradation in organic solar cells.

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