This paper reports optical emission spectroscopy measurements resolved laterally within a single microdischarge during the negative half-cycle of a sinusoidally driven dielectric barrier discharge. The maximum values of the reduced electric field, vibrational temperature of , and rotational temperature of were approximately 300 Td, 3500 K, and 1200 K, respectively. These values were correlated to the outer-edges of the microdischarge near the plasma-dielectric surface interface. These maximum values were significantly greater than measurements made elsewhere within the microdischarge and suggest a strong sheath at the outer-edges of the microdischarge.
REFERENCES
1.
T. C.
Corke
, C. L.
Enloe
, and S. P.
Wilkinson
, Annu. Rev. Fluid Mech.
42
, 505
–529
(2010
).2.
C. L.
Enloe
, M. G.
McHarg
, and T. E.
McLaughlin
, J. Appl. Phys.
103
, 073302
(2008
).3.
W.
Kim
, H.
Do
, M. G.
Mungal
, and M. A.
Cappelli
, Appl. Phys. Lett.
91
, 181501
(2007
).4.
A. V.
Likhanskii
, M. N.
Shneider
, S. O.
Macheret
, and R. B.
Miles
, J. Appl. Phys.
103
, 053305
(2008
).5.
J. P.
Boeuf
and L. C.
Pitchford
, J. Appl. Phys.
97
, 103307
(2005
).6.
S. A.
Stanfield
, J.
Menart
, C.
DeJoseph
, R. L.
Kimmel
, and J.
Hayes
, AIAA J.
47
, 1107
–1115
(2009
).7.
B.
Dong
, J.
Bauchire
, J.
Pouvesle
, P.
Magnier
, and D.
Hong
, J. Phys. D: Appl. Phys.
41
, 155201
(2008
).8.
G.
Neretti
, A.
Cristofolini
, and C. A.
Borghi
, IEEE Trans. Plasma Sci.
40
, 1678
–1687
(2012
).9.
S. A.
Stanfield
and J.
Menart
, “Spectroscopic investigation of a dielectric barrier discharge
,” AIAA J.
(to be published) .10.
S. M.
Starikovskaia
, K.
Allegraud
, O.
Guaitella
, and A.
Rousseau
, J. Phys. D: Appl. Phys.
43
, 124007
(2010
).11.
M.
Forte
, J.
Jolibois
, J.
Pons
, E.
Moreau
, G.
Touchard
, and M.
Cazalens
, Exp. Fluids
43
, 917
–928
(2007
).12.
S. A.
Stanfield
, PhD dissertation, Wright State University
, 2009
.13.
S. V.
Pancheshnyi
, S. V.
Sobakin
, S. M.
Starikovskaya
, and A. Y.
Starikovskii
, Plasma Phys. Rep.
26
, 1054
–1065
(2000
).14.
J. S.
Bendat
and A. G.
Piersol
, Random Data Analysis and Measurement Procedure
, 4th ed. (John Wiley & Sons Inc
, Hoboken
, 2010
), pp. 403
–404
.15.
G. H.
Wannier
, Bell. Syst. Techn. J.
32
, 170
(1953
).16.
K. V.
Kozlov
, H.-E.
Wagner
, R.
Brandenburg
, and P.
Michel
, J. Phys, D: Appl. Phys.
34
, 3164
–3176
(2001
).17.
V. I.
Gibalov
and G. J.
Pietsch
, J. Phys. D: Appl. Phys.
33
, 2618
–2636
(2000
).18.
C. L.
Enloe
, G.
Font
, T. E.
McLaughlin
, and D.
Orlov
, AIAA J.
46
, 2730
–2740
(2008
).© 2013 AIP Publishing LLC.
2013
AIP Publishing LLC
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