High-efficient GaN-based laser diodes (LDs) with tunnel junction are designed by replacing conventional p-type AlGaN cladding layers and p-type GaN contact with lower-resistant n-type AlGaN cladding layers and n-type GaN contact. In addition, the characteristics of the LDs with tunnel junction are numerically investigated by using the commercial software lastip. It is found that the performance of these LDs is greatly improved. As a comparison, the absorption loss and non-radiative recombination are greatly reduced. The threshold current and series resistance are decreased by 12% and 59%, respectively, and the slope efficiency is raised up by 22.3%. At an injection current of 120 mA, the output power and wall-plug-efficiency are increased by 34% and 79%, respectively.
Skip Nav Destination
Article navigation
22 July 2013
Research Article|
July 23 2013
High efficient GaN-based laser diodes with tunnel junction
M. X. Feng;
M. X. Feng
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
3
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors
, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China
Search for other works by this author on:
J. P. Liu;
J. P. Liu
a)
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
S. M. Zhang;
S. M. Zhang
a)
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
D. S. Jiang;
D. S. Jiang
3
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors
, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China
Search for other works by this author on:
Z. C. Li;
Z. C. Li
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
K. Zhou;
K. Zhou
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
D. Y. Li;
D. Y. Li
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
L. Q. Zhang;
L. Q. Zhang
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
F. Wang;
F. Wang
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
H. Wang;
H. Wang
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
P. Chen;
P. Chen
3
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors
, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China
Search for other works by this author on:
Z. S. Liu;
Z. S. Liu
3
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors
, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China
Search for other works by this author on:
D. G. Zhao;
D. G. Zhao
3
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors
, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China
Search for other works by this author on:
Q. Sun;
Q. Sun
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
H. Yang
H. Yang
1
Key Laboratory of Nanodevices and Applications
, Chinese Academy of Sciences, Suzhou 215123, China
2
Suzhou Institute of Nano-tech and Nano-bionics
, Chinese Academy of Sciences, Suzhou 215123, China
Search for other works by this author on:
a)
Author to whom correspondence should be addressed. Electronic addresses: jpliu2010@sinano.ac.cn and smzhang2010@sinano.ac.cn
Appl. Phys. Lett. 103, 043508 (2013)
Article history
Received:
June 01 2013
Accepted:
July 08 2013
Citation
M. X. Feng, J. P. Liu, S. M. Zhang, D. S. Jiang, Z. C. Li, K. Zhou, D. Y. Li, L. Q. Zhang, F. Wang, H. Wang, P. Chen, Z. S. Liu, D. G. Zhao, Q. Sun, H. Yang; High efficient GaN-based laser diodes with tunnel junction. Appl. Phys. Lett. 22 July 2013; 103 (4): 043508. https://doi.org/10.1063/1.4816598
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Utilization of polarization-inverted AlInGaN or relatively thinner AlGaN electron blocking layer in InGaN-based blue–violet laser diodes
J. Vac. Sci. Technol. B (January 2015)
Improvement of characteristics of InGaN-based laser diodes with undoped InGaN upper waveguide layer
J. Appl. Phys. (December 2012)
The impact of the stress induced by lateral spatial hole burning on the degradation of broad-area AlGaAs/GaAs laser diodes
J. Appl. Phys. (December 2012)
Comparative study of the differential resistance of GaAs- and GaN-based laser diodes
J. Vac. Sci. Technol. B (May 2016)
Saturation of the junction voltage in GaN-based laser diodes
Appl. Phys. Lett. (May 2013)