Single or few-layer hexagonal boron nitride sheets usually have very large band gaps, which greatly hinders their applications in electronic circuits. In this letter, we propose a way to significantly reduce the band gap of hexagonal boron-nitride bilayer (BNBL) by applying an interlayer bias voltage. In the presence of the intrinsic and Rashba spin-orbit couplings, we demonstrate whether gated BNBL is topologically nontrivial depends strongly on its stacking type. For AA-stacking BNBL with inversion symmetry, the strong topological insulator phase is obtained, and phase boundaries are analytically given. We also observe a re-entrant phase behavior from a normal insulator to a topological insulator then to a normal insulator, which is switched by the gate voltage. For AB-stacking BNBL, it is always topologically trivial but exhibits an unusual quantum Hall phase with four degenerate low-energy states localized at a single edge. These findings provide potential applications of BNBLs in electronics and spintronics.
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14 January 2013
Research Article|
January 15 2013
Gate voltage induced topological phase transition in hexagonal boron-nitride bilayers Available to Purchase
Xuechao Zhai;
Xuechao Zhai
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
, Nanjing 210093, China
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Guojun Jin
Guojun Jin
a)
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
, Nanjing 210093, China
Search for other works by this author on:
Xuechao Zhai
Guojun Jin
a)
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
, Nanjing 210093, China
a)
Author to whom correspondence should be addressed. Electronic mail: [email protected].
Appl. Phys. Lett. 102, 023104 (2013)
Article history
Received:
November 06 2012
Accepted:
December 26 2012
Citation
Xuechao Zhai, Guojun Jin; Gate voltage induced topological phase transition in hexagonal boron-nitride bilayers. Appl. Phys. Lett. 14 January 2013; 102 (2): 023104. https://doi.org/10.1063/1.4775689
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