The domain configuration of 50 nm thick films has been directly investigated using scanning electron microscopy with polarization analysis (SEMPA), with magnetic contrast obtained without the requirement for prior surface preparation. The large scale domain structure reflects a primarily four-fold anisotropy, with a small uniaxial component, consistent with magneto-optic Kerr effect measurements. We also determine the domain transition profile and find it to be in agreement with previous estimates of the domain wall width in this material. The temperature dependence of the image contrast is investigated and compared to superconducting-quantum interference device magnetometry data. A faster decrease in the SEMPA contrast is revealed, which can be explained by the technique's extreme surface sensitivity, allowing us to selectively probe the surface spin polarization which due to the double exchange mechanism exhibits a distinctly different temperature dependence than the bulk magnetization.
Skip Nav Destination
Article navigation
25 March 2013
Research Article|
March 28 2013
Magnetic domain structure of thin-films probed at variable temperature with scanning electron microscopy with polarization analysis
Robert M. Reeve;
Robert M. Reeve
Institut für Physik, Johannes Gutenberg-University Mainz
, 55099 Mainz, Germany
Search for other works by this author on:
Christian Mix;
Christian Mix
Institut für Physik, Johannes Gutenberg-University Mainz
, 55099 Mainz, Germany
Search for other works by this author on:
Markus König;
Markus König
Institut für Physik, Johannes Gutenberg-University Mainz
, 55099 Mainz, Germany
Search for other works by this author on:
Michael Foerster;
Michael Foerster
Institut für Physik, Johannes Gutenberg-University Mainz
, 55099 Mainz, Germany
Search for other works by this author on:
Gerhard Jakob;
Gerhard Jakob
Institut für Physik, Johannes Gutenberg-University Mainz
, 55099 Mainz, Germany
Search for other works by this author on:
Mathias Kläui
Mathias Kläui
a)
Institut für Physik, Johannes Gutenberg-University Mainz
, 55099 Mainz, Germany
Search for other works by this author on:
Appl. Phys. Lett. 102, 122407 (2013)
Article history
Received:
March 01 2013
Accepted:
March 13 2013
Citation
Robert M. Reeve, Christian Mix, Markus König, Michael Foerster, Gerhard Jakob, Mathias Kläui; Magnetic domain structure of thin-films probed at variable temperature with scanning electron microscopy with polarization analysis. Appl. Phys. Lett. 25 March 2013; 102 (12): 122407. https://doi.org/10.1063/1.4798538
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Could not validate captcha. Please try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Scanning electron microscopy with polarization analysis (SEMPA)
Rev Sci Instrum (October 1990)
SEMPA Imaging for Spintronics Applications
AIP Conference Proceedings (September 2007)
SEMPA studies of CoNiCr and its correlation with noise at different write currents (abstract)
Journal of Applied Physics (April 1991)
Magnetic‐field‐modulated written bits in TbFeCo thin films: Transmission electron microscopy Lorentz and scanning electron microscopy with polarization analysis studies
Journal of Applied Physics (November 1990)
Surface magnetic structure of epitaxial magnetite thin films grown on MgO(001)
J. Appl. Phys. (April 2009)