We report the growth of single-phase (0001)-oriented epitaxial films of the purported electronically driven multiferroic, LuFe2O4, on (111) MgAl2O4, (111) MgO, and (0001) 6H-SiC substrates. Film stoichiometry was regulated using an adsorption-controlled growth process by depositing LuFe2O4 in an iron-rich environment at pressures and temperatures where excess iron desorbs from the film surface during growth. Scanning transmission electron microscopy reveals reaction-free film-substrate interfaces. The magnetization increases rapidly below 240 K, consistent with the paramagnetic-to-ferrimagnetic phase transition of bulk LuFe2O4. In addition to the ∼0.35 eV indirect band gap, optical spectroscopy reveals a 3.4 eV direct band gap at the gamma point.
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These mismatch values correspond to the observed epitaxial orientation relationship for these systems (described in Fig. 2), where we have assumed near-coincident site lattices (NCSL) with σ-boundary ratios at the interfaces of , , and . The areas of the NCSL unit cells for these cases are 0.077 nm2, 0.283 nm2, and 0.081 nm2, respectively. For additional information on NCSL, see Ref. 22.
