We report on a method for the determination of ion track radii, formed in amorphous materials by ion-beam irradiation. The method is based on the addition to an amorphous matrix of a small amount of foreign atoms, which easily diffuse and form clusters when the temperature is sufficiently increased. The irradiation causes clustering of these atoms, and the final separations of the formed clusters are dependent on the parameters of the ion-beam. Comparison of the separations between the clusters that are formed by ions with different properties in the same type of material enables the determination of ion-track radii.

Topics
Plasmonics, Phonons, Crystal lattices, Amorphous materials, Annealing, Quantum dots, Ion beam analysis, X-ray scattering, Ion source, Descriptive statistics
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© 2012 American Institute of Physics.
2012
American Institute of Physics
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