Charge carriers trapped in polystyrene (PS) were investigated with Kelvin probe microscopy (KPM) and thermally stimulated discharge current (TSDC). Lateral heterojunctions of pentacene/PS were scanned using KPM, effectively observing polarization along a side view of a lateral nonvolatile organic field-effect transistor dielectric interface. TSDC was used to observe charge migration out of PS films and to estimate the trap energy level inside the PS, using the initial rise method.
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See supplementary material at http://dx.doi.org/10.1063/1.3684977 for the plot of offset surface potential, plots of the surface potentials of gold/PS samples, and the output curves for lateral transistors before and after charging.
© 2012 American Institute of Physics.
2012
American Institute of Physics
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