The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e.g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.
REFERENCES
1.
D. J.
Dingley
and V.
Randle
, J. Mater. Sci.
27
, 4545
(1992
).2.
J. A.
Venables
and C. J.
Harland
, Philos. Mag.
27
, 1193
(1973
).3.
L.
Reimer
, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
(Springer
, Berlin
, 1998
), Chapters 9 and 3.4.
J.
Wagner
, W.
Stummer
, M.
Völkerer
, A.
Hanke
, and J.
Wernisch
, Scanning
27
, 298
(2005
).5.
I.
Müllerová
and I.
Konvalina
, J. Microsc.
236
, 203
(2009
).6.
7.
I.
Müllerová
and L.
Frank
, Adv. Imaging Electron Phys.
128
, 309
(2003
).8.
Š.
Mikmeková
, M.
Hovorka
, I.
Müllerová
, O.
Man
, L.
Pantělejev
, and L.
Frank
, Mater. Trans.
51
, 292
(2010
).9.
E.
Bauer
, Rep. Prog. Phys.
57
, 895
(1994
).10.
I.
Bartoš
, Prog. Surf. Sci.
59
, 197
(1998
).11.
R. C.
Jaklevic
and L. C.
Davis
, Phys. Rev. B
26
, 5391
(1982
).12.
Z.
Pokorná
and L.
Frank
, Mater. Trans.
51
, 214
(2010
).13.
H.-J.
Fitting
, E.
Schreiber
, J. -Ch.
Kuhr
, and A.
von Czarnowski
, J. Electron Spectrosc. Relat. Phenom.
119
, 35
(2001
).14.
T. J.
Collins
, BioTechniques
43
, 25
(2007
).15.
E. E.
Krasovskii
and W.
Schattke
, Phys. Rev. B
56
, 12874
(1997
).© 2012 American Institute of Physics.
2012
American Institute of Physics
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