We report on the effect of the substrate temperature on the growth dynamics and dielectric properties of BaTiO3 epitaxial films on Nb:SrTiO3 (001) substrates. By real-time reflection high energy electron diffraction analysis, we quantitatively estimated the adatoms surface diffusivity as a function of temperature. The increase of the substrate temperature promotes surface diffusion, which reflects in the improvement of BaTiO3 ferroelectric properties up to 680 °C. Above this temperature, Ba re-evaporation occurs, leading to a rapid deterioration of the dielectric and ferroelectric properties. This work shed light on thermally activated physical mechanisms which determine the ferroelectric properties of BaTiO3 films.
REFERENCES
1.
C. H.
Ahn
, K. M.
Rabe
, and J. M.
Triscone
, Science
303
, 488
(2004
).2.
J.
Ma
, J.
Hu
, Z.
Li
, and C. W.
Nan
, Adv. Mater.
23
, 1062
(2011
).3.
Y.
Zhang
, J.
Liu
, X. H.
Xiao
, T. C.
Peng
, C. Z.
Jiang
, Y. H.
Lin
, and C. W.
Nan
, J. Phys. D: Appl. Phys.
43
, 08200
(2010
).4.
S.
Brivio
, D.
Petti
, R.
Bertacco
, and J. C.
Cezar
, Appl. Phys. Lett.
98
, 092505
(2011
).5.
V.
Garcia
, S.
Fusil
, K.
Bouzehouane
, S.
Enouz-Vedrenne
, N. D.
Mathur
, A.
Barthélémy
, and M.
Bibes
, Nature
460
, 81
(2009
).6.
V.
Garcia
, M.
Bibes
, L.
Bocher
, S.
Valencia
, F.
Kronast
, A.
Crassous
, X.
Moya
, S.
Enouz-Vedrenne
, A.
Gloter
, D.
Imhoff
et al., Science
327
, 1106
(2010
).7.
S.
Valencia
, A.
Crassous
, L.
Bocher
, V.
Garcia
, X.
Moya
, R. O.
Cherifi
, C.
Deranlot
, K.
Bouzehouane
, S.
Fusil
, A.
Zobelli
et al., Nature Mater.
10
, 753
(2011
).8.
D. F.
Cui
, C. L.
Li
, Y. L.
Zhou
, M.
He
, and Z. H.
Chen
, Ferroelectrics
271
, 93
(2002
).9.
J.
Berge
, A.
Vorobiev
, and S.
Gevorgian
, Thin Solid Film
515
, 6302
(2007
).10.
R.
Bertacco
, M.
Cantoni
, M.
Riva
, A.
Tagliaferri
, and F.
Ciccacci
, Appl. Surf. Sci.
252
, 1754
(2005
).11.
K. J.
Choi
, M.
Biegalski
, Y. L.
Li
, A.
Sharan
, J.
Schubert
, R.
Uecker
, P.
Reiche
, Y. B.
Chen
, X. Q.
Pan
, V.
Gopalan
et al., Science
305
, 1005
(2004
).12.
J. B.
Neaton
, C. L.
Hsueh
, and K. M.
Rabe
, in MRS Proceedings
, edited by K.
Poeppelmeier
, A.
Navrotsky
, and R.
Wentzcovitch
(Cambridge University Press
, Cambridge, United Kingdom
, 2002
), Vol. 718.13.
R.
Schmidt
, W.
Eerenstein
, T.
Winiecki
, F. D.
Morrison
, and P. A.
Midgley
, Phys. Rev. B
75
, 245111
(2007
).14.
R.
Meyer
, R.
Waser
, K.
Prume
, T.
Schmitz
, and S.
Tiedke
, Appl. Phys. Lett.
86
, 142907
(2005
);I.
Fina
, L.
Fàbrega
, E.
Langenberg
, X.
Martí
, F.
Sánchez
, M.
Varela
, and J.
Fontcuberta
, J. Appl. Phys.
109
, 074105
(2011
).15.
A. E.
Molag
, Ph.D. dissertation, Universiteit Twente
, Nederland, 2003
.16.
J. L.
Li
, J. H.
Hao
, Z.
Ying
, and Y.
Li
, Appl. Phys. Lett.
91
, 201919
(2007
).17.
W.
Heywang
, J. Mater. Sci.
6
, 1214
(1971
).18.
In these measurements, C represents the equivalent capacitance of the overall device seen by the LCR meter which uses a simple R-C model to fit the experimental complex impedance vs voltage curve. In this sense, this value of C includes the contributions from both R-CPE elements, but its characteristic butterfly shape depends mainly on BTO, and these C-V measurements have been used for initial check of the ferroelectricity.
19.
Y. S.
Kim
, D. H.
Kim
, J. D.
Kim
, Y. J.
Chang
, T. W.
Noh
, J. H.
Kong
, K.
Char
, Y. D.
Park
, S. D.
Bu
, J. G.
Yoon
et al., Appl. Phys. Lett.
86
, 102907
(2005
).20.
B. H.
Hoerman
, G. M.
Ford
, L. D.
Kaufmann
, and B. W.
Wessels
, Appl. Phys. Lett
73
, 2248
(1998
);T. X.
Li
, M.
Zhang
, Z.
Hu
, K. S.
Li
, D. B.
Yu
, and H.
Yan
, Solid State Commun.
151
, 1659
(2011
).21.
Reciprocal space maps of the samples investigated in the present paper (data not shown) display two components: a truncation rod representative of the ideal BTO plus substantial diffuse scattering.
22.
H.
Beltrán
, M.
Prades
, N.
Masó
, E.
Cordoncillo
, and A. R.
West
, J. Am. Ceram. Soc.
94
, 2951
(2011
).© 2012 American Institute of Physics.
2012
American Institute of Physics
You do not currently have access to this content.