The preparation of nanocomposite thin films that phase-separate Pt and α-Fe2O3 was investigated. These films were prepared on water-cooled glass substrates by radio frequency sputtering in an Ar atmosphere. X-ray diffraction patterns reveal that iron oxide forms Fe3O4 in the as-deposited state and undergoes a phase transition to α-Fe2O3 after heat treatment in the air. Pt is phase-separated from iron oxides in the as-deposited state and during heat treatment in the air, with a crystallite size of less than 2 nm in the as-deposited state, which varies between 2 and 15 nm after heat treatment in the air, estimated from the x-ray diffraction peaks. High-resolution transmission electron microscopy of the sample after heat treatment in the air reveals that spherical particles with a relatively uniform size are dispersed, which are assigned to Pt from fast Fourier transform analysis, while the surrounding area is assigned to α-Fe2O3. Thus, the thin film forms a nanocomposite thin film in which Pt nanoparticles are dispersed in α-Fe2O3.

Because of efforts toward a sustainable society, iron oxides, which are relatively low-cost and abundant resources, have attracted a lot of attention because they exhibit ferrimagnetic and semiconducting characteristics depending on the degree of oxidation. In particular, α-Fe2O3 has an energy bandgap of 2.2 eV,1 which allows it to absorb near the maximum intensity of sunlight, making it a promising candidate for photoelectrochemical water splitting. Specifically, electrons generated in α-Fe2O3 are transported from the conduction band to the electrode (e.g., Pt) for reduction reaction with water, while holes in the valence band undergo oxidation reaction. However, since the water splitting efficiency needs improvement due to the low mobility of minority carriers and the short lifetime of carriers generated in α-Fe2O3,2 a lot of research has focused on improving its transport properties through impurity doping3–11 and heterostructuring to introduce band offsets.12–16 Considering the device of the water splitting system, the Pt electrode and α-Fe2O3 should be structurally integrated. In fact, in the nanoparticle form, a structure in which Pt is supported on α-Fe2O3 has been configured,17–20 and in the thin film form, a structure in which a Pt layer is stacked on an α-Fe2O3 thin film has been demonstrated.21 Since the latter is a one-dimensional electron capture in the stacking direction, it is more efficient to place Pt electrodes three-dimensionally in the thin film, which corresponds to a nanocomposite structure with Pt nanoparticles dispersed in α-Fe2O3. In addition, the oxidation and reduction reactions of photoelectrochemical water splitting occur on opposite sides in one-dimensional stacked structures, whereas nanocomposite structures should cause both reduction and oxidation reactions at the photo-irradiated surface. Therefore, nanocomposites are also effective from a practical standpoint because they can be fabricated in large areas on low-cost substrates such as glass. According to the phase diagram of the Pt–Fe–O system,22 α-Fe2O3 and the Pt phase separate in thermal equilibrium, allowing the formation of nanocomposite structures. However, in chemically synthesized thin films, Pt is solidly dissolved in α-Fe2O3, which ionizes to a tetravalent and behaves as an n-type dopant.23–26 

In this study, preparation of nanocomposite thin films of Pt nanoparticles dispersed in α-Fe2O3 is investigated by employing radio frequency (RF) sputtering, which is a physical vapor deposition method. When α-Fe2O3 is used as a sputtering target, oxygen defects are often introduced into the thin film, which are compensated for by subsequent heat treatment in the air. In selecting the heat treatment temperature, the oxidation of Pt nanoparticles and the phase transition of iron oxide to α-Fe2O3 should be considered. Specifically, Pt nanoparticles with sizes below 15 nm prepared by vacuum deposition turn into PtOx upon thermal oxidation exceeding 673 K,27 whereas iron oxide undergoes a phase transition to α-Fe2O3 at 673 K.28 Hence, a heat treatment temperature of 673 K was employed in this study. Therefore, the relationship between heat treatment time, improvement in oxygen loss, and oxidation of Pt was investigated in detail over a relatively long period of time, in excess of 100 days.

Thin films were prepared by RF sputtering using a target with a Pt metal chip on a 4-in. diameter α-Fe2O3 disk. The area of the metal chip was 5 × 5 mm2. The chamber was evacuated to 1.5 × 10−7 Torr before introducing 6N pure Ar, and the film was deposited on a Corning glass substrate cooled by water circulation at 293 K. The distance between the target and substrate was kept constant at 73 mm. The total Ar pressure was fixed at 2.0 × 10−3 Torr. The RF power was maintained at 200 W, the deposition time was kept constant at 60 min, and no RF bias was applied to the substrate. The thickness of the thin films varied from 0.54 to 1.1 µm with an increase with increasing Pt concentration.

The film was structurally characterized using x-ray diffraction (XRD) with Cu Kα radiation (Rigaku, MiniFlex600, Japan). The magnetization of the film was measured at room temperature using a vibrating sample magnetometer (Tamagawa, TM-VSM-2430, Japan). The composition of the film in the as-deposited state was analyzed by energy dispersive spectroscopy (EDAX, Phoenix, USA) operating at 10 kV, using α-Fe2O3 and Pt as standard samples to calibrate the results of Pt, Fe, and O analyses. The spectral intensities of the O–K, Fe–L, and Pt–M lines generated by electron beam irradiation on the thin film surface were used to estimate the composition. After calibration with the standard samples and ZAF correction (Z: atomic number correction, A: absorption correction, F: x-ray fluorescence correction), the units were converted from wt. % to at. %. The analysis point observed at a magnification of 2000×, corresponding to the electron beam irradiation area, was near the center of the thin film sample (1 cm square). The microstructures of the samples heat-treated in air were observed by transmission electron microscopy (TEM) (JEOL, JEM-ARM200F, Japan) at an acceleration voltage of 200 kV.

Figure 1 shows the results of compositional analysis of Pt-added α-Fe2O3 thin films in as-deposited states. As shown in the figure, the Pt concentration tends to increase as the number of Pt chips increases. The composition change in the thin film is closer to the line assuming phase separation of Pt and α-Fe2O3 than to the line assuming a solid solution of Pt and α-Fe2O3. In addition, the oxygen concentration in the thin film tends to decrease with increasing Pt concentration, approaching the line where Pt and Fe3O4 are assumed to phase separate, despite the use of α-Fe2O3 as the target. This result suggests that oxygen defects are introduced into the thin film as the Pt concentration increases.

FIG. 1.

Compositional analysis of Pt-added α-Fe2O3 thin films in as-deposited states.

FIG. 1.

Compositional analysis of Pt-added α-Fe2O3 thin films in as-deposited states.

Close modal

Figure 2(a) shows the optical transmittance spectra of α-Fe2O3 thin film without Pt addition heat-treated at 673 K in air. The optical transmittance in the as-deposited state is relatively low, even though the composition shows an excess of oxygen compared to α-Fe2O3 at 0 at. % Pt, as shown in Fig. 1. The difference between the two results may be attributed to the relatively thin thickness (0.54 µm), which incorporates oxygen from the glass substrate in the oxygen analysis. The optical transmittance increases with increasing annealing time, reaching almost saturation at 210 m, and the optical absorption edge of α-Fe2O3 is clearly observed. This result suggests that the oxygen defects in the α-Fe2O3 thin film are compensated for through heat treatment in the air. Figure 2(b) shows the optical transmittance spectra of the α-Fe2O3 thin film added with 6.3 at. % Pt heat-treated at 673 K in the air. As in the case without Pt, optical transmittance increases with increasing heat treatment time and almost reaches saturation after 53 days of heat treatment. In other words, the time required to compensate for oxygen defects in the case of Pt addition is longer than that in the case of no Pt addition. This would be closely related to the reductive phase transition from α-Fe2O3 to Fe3O4 as the oxygen concentration decreases with increasing Pt addition concentration in the as-deposited state (Fig. 1). Since the optical absorption edge is not clear, Raman spectra are shown in Fig. 2(c) to clarify how the iron oxide is formed by heat treatment in the air. In the as-deposited state, a broad peak is observed at 665 cm−1, assigned to the A1g mode of Fe3O4,29 whereas peaks appear at 225, 245, 292, 410, 500, and 612 cm−1, assigned to the A1g and Eg modes of α-Fe2O329 in the sample annealed at 673 K for 113 days. In addition, the broad peak at 660 cm−1 in the heat-treated sample is attributed to lattice distortions introduced by the many defects in α-Fe2O3.30 

FIG. 2.

Optical transmittance spectra of α-Fe2O3 thin film (a) without Pt addition and (b) with 6.3 at. % Pt heat-treated at 673 K in air. (c) Raman spectra of thin film with 6.3 at. % Pt in the as-deposited state and after annealing at 673 K in air for 113 days.

FIG. 2.

Optical transmittance spectra of α-Fe2O3 thin film (a) without Pt addition and (b) with 6.3 at. % Pt heat-treated at 673 K in air. (c) Raman spectra of thin film with 6.3 at. % Pt in the as-deposited state and after annealing at 673 K in air for 113 days.

Close modal

Figure 3(a) shows the XRD patterns focusing on the Pt peak in the α-Fe2O3 thin film added with 6.3 at. % Pt with respect to the annealing time at 673 K in the air. The diffraction peak at (111) (closed square) is broad in the as-deposited state, whereas it becomes more distinct with an increase in annealing time. In the peak of iron oxide [Fig. 3(b)], it can be seen that while Fe3O4 (closed circle) is present in the as-deposited state, α-Fe2O3 (open circle) appears after 82 h of heat treatment, and after 53 days, Fe3O4 disappears and finally arrives at a single phase of α-Fe2O3. The magnetization at 10 kOe is shown in Fig. 3(c). In the as-deposited state [Fig. 3(b)], the Fe3O4 is ferrimagnetic (inset) with 321 emu cm−3, whereas the magnetization decreases with annealing time and disappears (inset) after annealing for 113 days. This result is in good agreement with that of the XRD results [Fig. 3(b)]. Therefore, it is clear that heat treatment over a relatively long period of time is needed to compensate for the oxygen deficiency in α-Fe2O3.

FIG. 3.

XRD patterns focusing on (a) Pt peaks (closed squares) and (b) iron oxides in 6.3 at. % Pt added thin film with respect to annealing time at 673 K in air. Closed circles are Fe3O4 and open circles are α-Fe2O3. (c) Magnetization of thin films added with 6.3 at. % Pt as a function of annealing time in air at 673 K. The inset indicates the magnetization curves of the as-deposited and 113 days annealed thin film.

FIG. 3.

XRD patterns focusing on (a) Pt peaks (closed squares) and (b) iron oxides in 6.3 at. % Pt added thin film with respect to annealing time at 673 K in air. Closed circles are Fe3O4 and open circles are α-Fe2O3. (c) Magnetization of thin films added with 6.3 at. % Pt as a function of annealing time in air at 673 K. The inset indicates the magnetization curves of the as-deposited and 113 days annealed thin film.

Close modal

Figure 4(a) shows the optical transmittance spectra of α-Fe2O3 thin films added with Pt after heat treatment in the air at 673 K for 113 days. All spectra also show relatively high optical transmittance regardless of Pt concentration. The optical absorption edge becomes more gradual with an increase in Pt concentration. Figure 4(b) shows the XRD pattern of α-Fe2O3 thin film added with Pt after annealing at 673 K in the air for 113 days. Since the XRD patterns at all Pt concentrations consist of α-Fe2O3 (open circles) and Pt (closed squares), the oxygen defects that occur in the as-deposited state are ameliorated by heat treatment in the air. The Pt grain size estimated from the Pt (111) diffraction peak by employing Scherrer's formula is shown in Fig. 4(c). While the overall Pt concentration is less than 2 nm in the as-deposited state, it varies from 2 to 15 nm after heat treatment, indicating that the size tends to increase with increasing Pt concentration.

FIG. 4.

(a) Optical transmittance spectra of thin films annealed for 113 days at 673 K in air with different Pt addition concentrations. (b) XRD patterns of thin films annealed for 113 days at 673 K in air with different concentration of Pt. (c) Pt particle size estimated from Pt(111) diffraction peaks in as-deposited state and after annealing for 113 days at 673 K in air.

FIG. 4.

(a) Optical transmittance spectra of thin films annealed for 113 days at 673 K in air with different Pt addition concentrations. (b) XRD patterns of thin films annealed for 113 days at 673 K in air with different concentration of Pt. (c) Pt particle size estimated from Pt(111) diffraction peaks in as-deposited state and after annealing for 113 days at 673 K in air.

Close modal

Figure 5(a) shows a high-resolution TEM plan-view of a 6.3 at. % Pt-added α-Fe2O3 thin film annealed in the air for 113 days at 673 K. It can be seen that spherical particles of ∼5 nm in size with a relatively dark contrast are dispersed in the film. Fast Fourier transform (FFT) analysis results for the area enclosed by the green circle are shown in the inset. The plane widths of the spots labeled A, B, and C were 0.222, 0.117, and 0.136 nm, respectively, and the angles between the spots were 59° at AOB, 91° at AOC, and 32° at BOC. These values are close to (11-1), (3-1-1), and (2-20) of the standard data for Pt (PDF No. 00-004-0802), suggesting that this nanoparticle is Pt. The observed size is in good agreement with the size of 4.8 nm [Fig. 4(c)] estimated from the XRD peaks. The different image [Fig. 5(b)] shows that an extensive region with a relatively bright contrast is crystallized surrounding the nanoparticles. The results of the FFT analysis of the region marked by the green circle are shown in the inset. The plane widths of spots A, B, and C were 0.181, 0.146, and 0.145 nm, respectively, and the lattice plane angles AOB, AOC, and BOC were 67°, 114°, and 47°, respectively. These values are close to those for spots in the lattice planes (2-24), (-1-24), and (-300) of the standard data for α-Fe2O3 (PDF No. 00-033-0664) when the electron beam is incident from [021]. Thus, spots A, B, and C are assigned to (2-24), (-1-24), and (300) of α-Fe2O3, respectively. These observations indicate that the fabricated thin film forms a nanocomposite with Pt nanoparticles dispersed in α-Fe2O3.

FIG. 5.

(a) High-resolution TEM plan view of a 6.3 at. % Pt-added α-Fe2O3 thin film annealed in air for 113 days at 673 K (b) Observed images of different region. The inset in both figures shows the results of FFT analysis of the region surrounded by the green circle.

FIG. 5.

(a) High-resolution TEM plan view of a 6.3 at. % Pt-added α-Fe2O3 thin film annealed in air for 113 days at 673 K (b) Observed images of different region. The inset in both figures shows the results of FFT analysis of the region surrounded by the green circle.

Close modal

Figure 6(a) shows the high-angle annular dark field scanning TEM plan-view of the α-Fe2O3 thin film added with 6.3 at. % Pt after heat treatment in the air for 113 days at 673 K. Densely dispersed spherical particles with relatively bright contrasts are observed, which are detected in Pt [Fig. 6(c)] in the energy dispersive x-ray spectroscopy (EDS) elemental mapping analysis, whereas O [Fig. 6(b)] and Fe [Fig. 6(d)] are observed in the other regions. In other words, nanocomposite thin films with Pt nanoparticles dispersed in α-Fe2O3 can be fabricated by sputter deposition using an α-Fe2O3 target attached with Pt chips, followed by heat treatment in the air.

FIG. 6.

(a) HAADF-STEM plan-view of α-Fe2O3 thin film with 6.3 at. % Pt after heat treatment in air for 113 days at 673 K. EDS elemental mapping of (b) O, (c) Pt, and (d) Fe.

FIG. 6.

(a) HAADF-STEM plan-view of α-Fe2O3 thin film with 6.3 at. % Pt after heat treatment in air for 113 days at 673 K. EDS elemental mapping of (b) O, (c) Pt, and (d) Fe.

Close modal

In a similar study, when a target with Pt wires placed on a TiO2 disk was employed for sputtering, Pt ionizes in TiO2 in the as-deposited state, while Pt phase-separates from TiO2 to form a composite after heat treatment.31 Even though the Pt elements are thermodynamically more stable in the TiO2 matrix because the difference between the heat of formation of the Pt oxide (i.e., PtO2) and that of TiO2 is larger than that of α-Fe2O3,32 the Pt elements phase-separate in the α-Fe2O3 matrix both in the as-deposited state and after heat treatment. In particular, it should be noted that the Pt nanoparticles are nanoscaled and relatively uniform in size [Figs. 5(a) and 6(a)]. This structure should effectively capture the carriers generated in α-Fe2O3 by light absorption. Specifically, for pure α-Fe2O3 films without Pt, a thickness of 20 nm33 or 50 nm34 is optimal due to the relatively short carrier lifetime,2 whereas in this study, high-resolution TEM images (Fig. 5) show that Pt nanoparticle electrodes can be brought close to those values. The distance between nanoparticles can be technically controlled by varying the number of Pt chips in the sputter deposition process. Considering photoelectrochemical water splitting, it is expected that the electrons captured by the Pt nanoparticle electrode will cause a reduction reaction at the film surface, while the holes generated in α-Fe2O3 will cause an oxidation reaction. Hence, Pt nanoparticles embedded inside the film would not contribute directly to the reduction reaction but might be supplied to the Pt electrode at the surface through the electrical pathway associated with the partial segregation of the Pt nanoparticles. Oxygen defects in α-Fe2O3 could be compensated for in a shorter time by increasing the heat treatment temperature, although this study took a relatively long time (i.e., 113 days).

We investigated the preparation of nanocomposite thin films in which Pt nanoparticles are dispersed in α-Fe2O3. In the as-deposited state, the increase in Pt addition concentration induces oxygen deficiency in the iron oxide to form Fe3O4, followed by heat treatment in the air to transform the iron oxide into a single phase α-Fe2O3. The added Pt phase separates from the iron oxide both in the as-deposited state and after annealing in the air, with particle size varying from 2 to 15 nm. In particular, TEM images after heat treatment of the thin film with 6.3 at. % Pt in the air for 113 days show that spherical particles of ∼5 nm in size are dispersed. Thus, it is concluded that the thin films form nanocomposites in which Pt nanoparticles are dispersed in α-Fe2O3.

I am grateful to N. Makabe [Research Institute for Electromagnetic Materials (DENJIKEN), Sendai, Japan] for assisting in the experiments.

The author has no conflicts to disclose.

Seishi Abe: Conceptualization (lead).

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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