Infrared-to-visible upconversion (IVU) possesses a variety of applications, spanning from bio-imaging to anti-counterfeiting, and has attracted great attention. However, the devices developed in previous studies suffer from several drawbacks, such as relatively weak optical absorption, requirement of a complicated design, and a costly fabrication process, which limit their potential practical application. To circumvent the existing difficulties, in this study, an IVU device based on infrared quantum dots (QDs) and a mixture of visible QD light-emitting diodes (QLEDs) with low operational voltage and multiple changeable visible colors is demonstrated. The emission color of this IVU-QLED can be easily manipulated under different input currents and power densities of incident infrared radiation. The IVU-QLED device can also be achieved with cost-effective and simple solution fabrication processes. In addition, this dual electrical-optical modulated IVU-QLED shows a fast response time. With the unexplored features of IVU, including infrared-visible upconversion, tunable visible color emission, dual functional modulation, and cost-effectiveness, the designed IVU-QLEDs shown here provide an alternative route for the development of untouched optoelectronic devices, which should be very useful and timely for future applications covering anti-counterfeiting, infrared sensing, bio-imaging, night vision, etc.

Through years of research, infrared radiation (IR) has been studied and has affected almost every aspect of technology. In the last two decades, infrared-to-visible upconversion (IVU) has attracted a great deal of attention and has been studied quite intensively, for it can lead to a wide range of applications, ranging from infrared sensing, night vision, bio-imaging, to anti-counterfeiting.1–8 With materials capable of achieving up-conversion, several types of devices based on quantum wells (QWs), quantum dots (QDs), graphene, and triplet–triplet annihilation (TTA) have been designed.9–13 For example, the Sun Group has designed an ultrahigh responsive IR photodetector based on hybrid QDs and graphene heterostructures.14 Dai’s research demonstrated a stable structure of QD light-emitting diodes (QLEDs) by inserting a layer between the hole transport layer (HTL) and the QD layers.9 Yu’s work on an up-conversion phototransistor by integrating an infrared photodetector with an organic light-emitting diode (OLED) demonstrated a considerable improvement in performance.2 Yang’s study presented an IVU device based on a type II/type I core–shell QD heterostructure.8 In addition, Wu’s article used a micro-cavity to enhance IVU efficiency.7 However, according to the published reports, even though great effort has been made, there still exist several shortcomings that prevent the developed devices from being used in practical applications, such as complicated design of the device structure, costly fabrication process, and weak optical absorption. In order to overcome the existing difficulties, in this study, we developed an IVU device based on the integration of IR QDs and a mixture of visible QDs of QLEDs. In addition to circumventing the previous drawbacks, the designed IVU QLED also contains several unexplored features as discussed below.

QD-based devices show great advantages in the fields of display, light harvesting, and many others because of their unique properties, such as size-dependent bandgap, easy processability, stability, color purity, high quantum yield, etc. With the advantages of QDs being used as emission materials, QLEDs are now one of the most intensive research topics.15–27 However, owing to the restriction of bulky integration and incompatible fabrication of IR-to-visible devices, until now, they have still not been able to meet the requirements of practical application of IVU devices. In this work, to overcome various obstacles, different QD materials, such as IR PbS QDs and a mixture of different sizes of CdSe/ZnS QDs, were integrated together, and with an appropriate design of the device structure, a high-performance IVU-QLED was achieved. PbS QDs have a small bandgap, which can be modulated with different ligands. Quite interestingly, this single device possesses a dual electrical-infrared modulation to control the emission color at a visible range, which has excellent characteristics without a complicated structure and complicated fabrication processes. Notably, an infrared-controllable QLED with a tunable emission color based on varying input IR radiation power density is an unprecedented device. With a pre-designed picture pattern and color index of the emitted light, the IVU-QLED developed here is very promising for visual signal encoding and anti-counterfeiting technology.

In the IVU-QLED device, PbS and a mixture of CdSe/ZnS QDs were selected as the carrier generation layer (CGL) and emission layer (EML), respectively, which were fabricated by all-solution processes. PbS QDs were used to absorb input IR radiation and generate electron–hole pairs. CdSe/ZnS core–shell QDs with two different emission wavelengths (540 and 630 nm) were selected as the emission material because of their high electroluminescence efficiency. Based on a well-designed band alignment among the light emitting layer and electron and hole transporting layers, this IVU-QLED device has excellent control of the emission behavior under varied IR illumination. An electron-to-photon (e-to-p) conversion efficiency of 4.77%, photon-to-photon (p-to-p) conversion efficiency of 0.2%, and responsivity of 0.43 (A/W) were achieved when the device was operated under a bias voltage of 4 V with a low turn-on voltage of 2 V. The proposed methodology shown here can be extended to many other combinations of QD systems, even with a mixture of more than two different kinds of light emitting QDs. Therefore, it is foreseeable that our study can pave a key step for the development of many other not-yet realized optoelectronic devices.

The IVU-QLED devices were made by all-solution processes. The pre-patterned ITO glass substrates were sonicated using soap water for 30 min, deionized water twice for 10 min, acetone for 30 min, ethanol for 10 min, and isopropanol for 15 min followed by oxygen plasma treatment for 15 min to obtain a better film formation. 10 mg ml−1 of PbS QDs (NNCrystal US, with a size of 2.7–5.7 nm) in toluene solution was spin-coated at 500 rpm for 10 s (first step) and 2000 rpm for 60 s (second step). Next, 20 µl of 1,3-benzenedithiol (Alfa Aesar™) mixed with methanol in 10 mM was dropped on the PbS QD film with a waiting time for 60 s to exchange the oleic acid ligand with the BDT ligand. The same spin-coating step as described in the PbS spin-process was carried out immediately after the 60 s. Finally, methanol was spin-coated using the same spin-process of PbS QDs to clean the un-exchanged ligands on the surface. The thickness of the PbS QD film is about 45 nm.

PEDOT:PSS solution (Heraeus Clevios TM PH1000) was spin-coated on the PbS QD film at 5000 rpm for 60 seconds and heated on a hot plate at 150 °C for 10 min. Poly-TPD (FMPV, 8 mg ml−1 in chlorobenzene) and PVK (Sigma-Aldrich, 1.5 mg ml−1 in toluene) were spin-coated at 3000 rpm for 60 s and heated at 150 °C and 120 °C, respectively. Two different emission wavelengths of CdSe/ZnS core–shell QDs were mixed in toluene (UniMat, 5 mg ml−1 for λ = 630 nm and 25 mg ml−1 for λ = 540 nm) and spin-coated at 700 rpm for 120 s. ZnO nanoparticles (15 mg ml−1 in isopropanol) were spin-coated at 800 rpm for 60 s. After all transport layers were spun on the indium tin oxide (ITO) substrate, 100 nm of silver film was thermally evaporated on the top as the electrode. Because the size of the sample in our study is designed as 2 × 2 mm2, we can fabricate a series of IVU-OLED arrays with many different samples on the same substrate for testing the reproducibility of our measurements.

The cross section image of the IVU-QLED was recorded by using a field emission scanning electron microscope (SEM) system (JEOL JSM-6500F) under an acceleration voltage of 15 kV. The electrical, electroluminescence (EL), and photoresponse measurements of the device were measured with a probe station at room temperature, consisting of a source measure unit (Keithley 2400) as the power supply, a 980 nm laser system, and a high-resolution spectrometer (HORIBA Jobin Yvon iHR550) to record the EL spectra.

Figure 1(a) presents the schematic illustration of the IVU-QLED structure. This IVU-QLED is an all-solution-process device with a working area of 0.04 cm2, which is defined by the overlapping area across indium tin oxide (ITO)-glass and the silver electrode. The IR-photoactive gate comprises PbS QDs, which were infrared-sensitive and served as the CGL. The relative band structure of each constituent material is shown in Fig. 1(b). During the operation, the device was exposed to IR irradiation with a wavelength of 980 nm. The infrared photons can pass through the transparent ITO-glass substrate (sheet resistance ≈15 Ω cm−1) and be absorbed by the PbS QDs, which exhibit an absorbance peak at 1000 nm, and thus can be used to generate photocarriers. The carriers will transport through the hole transport layers (HTLs) including poly (3,4-ethylenedioxythiophene):poly (styrene sulfonate) (PEDOT:PSS), poly (N,N′-bis-4-butylphenyl-N,N′-bisphenyl) benzidine (poly-TPD) and poly (N-vinylcarbazole) (PVK). These holes were gradually guided by HTLs to the light emitting layer (EML) (mixture of CdSe/ZnS QDs) and be confined in the EML by the large valence band offset arising from the zinc oxide (ZnO) layer, preventing the recombination of electrons and holes outside of the EML. ZnO nanoparticles serve as the electron transport layer (ETL) for its appropriate energy band. The electrons injected from the Ag cathode were transferred through the ETL (ZnO nanoparticles) and confined in the EML by the large conduction band offset of PVK. With the well-designed band alignment, the recombination in the mixture of CdSe/ZnS QDs was dominated; hence, the corresponding bright visible light emission is obtained. The cross-sectional scanning electron microscopy (SEM) image of PbS QDs with a thickness of about 45 nm and the mixture of the CdSe/ZnS QD layer with a thickness of 100 nm are shown in Figs. 1(c) and 1(d), respectively. The cross-sectional SEM image of the full QLED devices has been shown in our previous report.26 

FIG. 1.

(a) Schematics of the infrared-visible upconversion controllable QLED device structure. (b) The energy band diagram of the device. (c) Cross-sectional scanning electron microscopy (SEM) image shows the thickness of the PbS QDs layer. The inset figure shows the absorbance spectrum of the PbS QDs. (d) Cross-sectional scanning electron microscopy (SEM) image of the mixed CdSe/ZnS QD layer.

FIG. 1.

(a) Schematics of the infrared-visible upconversion controllable QLED device structure. (b) The energy band diagram of the device. (c) Cross-sectional scanning electron microscopy (SEM) image shows the thickness of the PbS QDs layer. The inset figure shows the absorbance spectrum of the PbS QDs. (d) Cross-sectional scanning electron microscopy (SEM) image of the mixed CdSe/ZnS QD layer.

Close modal

To compare the IR-sensing performance, QLEDs were made and measured with and without PbS QDs. Figure 2(a) shows the current density–voltage (J–V) characteristic of the reference device with and without the PbS QD layer (ITO/PEDOT:PSS/poly-TPD/PVK/mixed CdSe/ZnS core–shell QDs/ZnO/Ag). For the device without PbS QDs, the current density is being cut off when the voltage is less than 1.5 V. Note that the turn-on voltage required for the QLED to emit light is about 2.0 V. The injected current increases rapidly when the applied voltage exceeds 2.0 V. Both the results of Fig. 2(a) show that the QLEDs with and without PbS QDs can work at a relatively low voltage. For the device without PbS QDs, generally a turn on voltage of about 2 V is required for it to possess a diode behavior. If the applied voltage is larger than the turn on voltage, the current increases rapidly and shows a steeper slope. With the insertion of the PbS QD layer, the J–V curve will deviate far away from the ideal diode behavior because of the existence of the additional resistance layer. In addition, the J–V curve will not exhibit a clear cut-off and turn on voltage. For a pure LED, the diode-like curve is certainly preferred based on the conventional working principle of the LED. For LED devices with PbS QDs, the turn on voltage is not as obvious as pure LED devices, which can also be found in the previous reports.28 

FIG. 2.

(a) Current density–voltage (J–V) characteristic of the infrared-visible upconversion-QLED device with and without PbS QD layer (ITO/PEDOT:PSS/poly-TPD/PVK/mixed CdSe–ZnS-core-shell QDs/ZnO/Ag). (b) Characteristics of the photocurrent and the responsivity of the infrared-visible upconversion-QLED device (J-V-R) operated under the illumination of a λ = 980 nm laser with a fixed power density of 25.8 mW/cm2. (c) Responsive photocurrent vs time (I–T) curve of infrared-visible upconversion-QLED measured at 4.6 V exhibits the optically switchable characteristic of the device. The pumping power density of the 980 nm laser is 25.8 mW/cm2.

FIG. 2.

(a) Current density–voltage (J–V) characteristic of the infrared-visible upconversion-QLED device with and without PbS QD layer (ITO/PEDOT:PSS/poly-TPD/PVK/mixed CdSe–ZnS-core-shell QDs/ZnO/Ag). (b) Characteristics of the photocurrent and the responsivity of the infrared-visible upconversion-QLED device (J-V-R) operated under the illumination of a λ = 980 nm laser with a fixed power density of 25.8 mW/cm2. (c) Responsive photocurrent vs time (I–T) curve of infrared-visible upconversion-QLED measured at 4.6 V exhibits the optically switchable characteristic of the device. The pumping power density of the 980 nm laser is 25.8 mW/cm2.

Close modal
Responsivity (Rph) is an important parameter related to IR-sensitive IVU-QLED devices. It was acquired by the electrical output per optical input, which is usually expressed in units of amperes per watt of incident radiant power (A/W). The responsivity can be calculated using the following equation:29 
(1)
where ΔIph is the variation in the current under IR illumination with respect to the dark condition and P is the illumination power on the working area of the device. The characteristics of the photocurrent and the responsivity of the device (J-V-R) operated (λ = 980 nm) at a power density of 25.8 mW cm−2 are shown in Fig. 2(b). When a fixed voltage of 4.6 V was applied to the IVU-QLED, the responsive photocurrent of the IVU-QLED under the alternating 980 nm IR illumination with a power density of 25.8 mW cm−2 is as shown in Fig. 2(c). The device exhibits a fast rise time of about 110 ms and a fall time of about 550 ms to the incident IR. The response time shown here is comparable or faster than the previous reports with similar structures.25,29 However, it is slower than that of pure PbS QD photodetectors because the photogenerated carriers have to travel a longer distance to reach the electrodes. With several repeatable cycle tests, the device also reveals stable sensitivity of the QLED and is good enough for practical applications. Two different sizes of CdSe/ZnS QDs (emission wavelength of 540 and 630 nm) are mixed as the EML, and the QLED device hence has two peaks in the emission spectrum. Figure 3(a) shows the relative EL spectra under different intensities of IR illumination (λ = 980 nm) at a fixed voltage of 3.6 V. The result of color-changing behavior can be viewed clearly by normalization, as shown in Fig. 3(b). Note that those small peaks of the purple curve can be attributed to the emissions arising from different sizes of CdSe/ZnS QDs, for the size of QDs is in the range of 10–12 nm. The photograph of the working area (0.04 cm2) in the absence of room light is shown in Fig. 3(c). Photographs of the device working under different intensities of IR illumination (λ = 980 nm), ranging from 0 to 25.8 mW cm−2, and a fixed bias voltage of 3.6 V are shown in Fig. 3(d). The top right square is a copy of the center square with a rotated angle to show the uniform emission brightness. The ratio of 540 nm (green light) and 630 nm (red light) can be calculated by the relative intensities of the emission peaks, and the result of green/red ratio is shown in Fig. 4(a). To show the dependence of the emission ratio on the electrical input and optical input, the green/red ratio of the QLED without IR illumination under different voltages is shown in Fig. 4(b). The results show that there is a gradual blue shift of colors under increasing IR illumination and applied bias voltages. Note that Figs. 4(a) and 4(b) show measurements obtained with different samples; thus, the G/R ratios exhibit a slight difference between these two figures. The peak intensity of the green band vs the incident infrared power intensity shown in Fig. 4(c) also reveals the rising tendency with the increasing 980 nm laser power density.
FIG. 3.

(a) Electroluminescence spectra of the infrared-visible upconversion-QLED device operated under different intensities of IR illumination (λ = 980 nm, ranging from 0, 1.1, 2.23, 6.74, 14.1, 25.8 mW/cm2) at a fixed external bias of 3.6 V. (b) Normalized electroluminescence spectra of the device operated under different intensities of NIR illumination (λ = 980 nm) at a fixed bias voltage of 3.6 V. (c) Photographs of the working area (0.04 cm2). (d) Photographs of the device working under different intensities of IR illumination (λ = 980 nm) and a fixed bias voltage of 3.6 V. The serial color images are captured directly using a smart phone.

FIG. 3.

(a) Electroluminescence spectra of the infrared-visible upconversion-QLED device operated under different intensities of IR illumination (λ = 980 nm, ranging from 0, 1.1, 2.23, 6.74, 14.1, 25.8 mW/cm2) at a fixed external bias of 3.6 V. (b) Normalized electroluminescence spectra of the device operated under different intensities of NIR illumination (λ = 980 nm) at a fixed bias voltage of 3.6 V. (c) Photographs of the working area (0.04 cm2). (d) Photographs of the device working under different intensities of IR illumination (λ = 980 nm) and a fixed bias voltage of 3.6 V. The serial color images are captured directly using a smart phone.

Close modal
FIG. 4.

(a) Intensity ratios of 540 nm (green light) emission to 630 nm emission (red light) (G/R) under different intensities of IR illumination (λ = 980 nm) and a fixed bias voltage of 3.6 V. (b) Intensity ratio (G/R) with error bars under different applied bias voltages. (c) Peak intensities at 533 nm under different 980 nm laser power density excitations (at a fixed external bias of 3.6 V).

FIG. 4.

(a) Intensity ratios of 540 nm (green light) emission to 630 nm emission (red light) (G/R) under different intensities of IR illumination (λ = 980 nm) and a fixed bias voltage of 3.6 V. (b) Intensity ratio (G/R) with error bars under different applied bias voltages. (c) Peak intensities at 533 nm under different 980 nm laser power density excitations (at a fixed external bias of 3.6 V).

Close modal

The color change behavior observed above under different carrier injections can be understood as follows: The 630 nm CdSe/ZnS QDs have a bigger size and a larger probability to emit light due to the charge transfer from the smaller size of CdSe/ZnS QDs with a larger bandgap. The simultaneous emission of two kinds of CdSe/ZnS QDs leads to double peaks on electroluminescence (EL) at both 540 and 630 nm. During the operation, when a small voltage is applied on the device, the emission wavelength at 630 nm of CdSe/ZnS QDs is dominated, and hence, the red color can be observed first. As the applied voltage was gradually increased, more carriers reached the CdSe/ZnS QDs with an emission wavelength of 540 nm, and the probability of the green light emission was increased. Thus, the color-changing behavior of the IVU-QLED varied gradually from red to orange to yellow. Based on the mixture ratio of 1:5 for the 630 and 540 nm CdSe/ZnS QDs, the green light eventually becomes the dominant emission of the PbS-QLED device under voltage and infrared tuning. As the applied voltage is gradually increased, it generates more carriers. The electrons in the conduction band of 630 nm CdSe/ZnS QDs are saturated; then the excessive electrons move to the higher conduction band of 540 nm CdSe/ZnS QDs. Thus, the emission intensity of 540 nm increases and causes the color change. Similarly, as the illumination of the 980 nm laser increases, it can enhance the injection current and generate more carriers. When the carriers in the energy band of 630 nm CdSe/ZnS QDs are saturated, the injected carriers will move to the energy band of 540 nm CdSe/ZnS QDs and lead to a tunable emission property. The device works in a saturation region when the IR illumination exceeds 15 mW cm−2.

As the emission spectrum of the device can be manipulated by IR illuminations, the corresponding International Commission on Illumination (CIE) color coordinates can also be defined and sketched. Figure 5(a) shows the CIE color coordinates of the device from the emission results shown in Fig. 3, demonstrating that the IVU-QLED device can be used to recognize input IR signals with an unprecedented feature of tunable color emission. This unexplored characteristic should be very useful for anti-counterfeiting applications.

FIG. 5.

(a) Corresponding CIE color coordinates of the infrared-visible upconversion-QLED device under different intensities of IR illumination. The data were obtained from Fig. 3. (b) Photographs of patterned IR illuminations imaging on the infrared-visible upconversion-QLED with visible response taken using a high-resolution camera with a macro-lens. From left to right are, respectively, without IR illumination, letters of N, T, U, and two-dimensional QR codes (under an IR power density illumination of 10.5 mW/cm2).

FIG. 5.

(a) Corresponding CIE color coordinates of the infrared-visible upconversion-QLED device under different intensities of IR illumination. The data were obtained from Fig. 3. (b) Photographs of patterned IR illuminations imaging on the infrared-visible upconversion-QLED with visible response taken using a high-resolution camera with a macro-lens. From left to right are, respectively, without IR illumination, letters of N, T, U, and two-dimensional QR codes (under an IR power density illumination of 10.5 mW/cm2).

Close modal

According to the results in Fig. 4, the pronounced responses of the different intensities of IR illumination can be clearly seen. In front of the IR illumination, one can apply different patterns to obtain specific visual responses as shown in Fig. 5(b). Any other 2D patterns and different ratios of color-changing can also be demonstrated by using the IVU-QLED device with an appropriate IR source to achieve the realization of anti-counterfeiting and visual signal encoding. Note that only when the color ratio and picture pattern fit the pre-designed encoded signal, the information can be decoded and read. This characteristic can greatly enhance the security for the development of information technology in the future.

The e-to-p conversion efficiency, ηe-to-p, is the most representative performance indicator quantity when comparing quality of LEDs as it gives the ratio of extracted photons over injected charges. ηe-to-p can be calculated using the following expression:28,30
(2)
where P indicates the power of emitting light, λ is the wavelength of emitting light, I is the injected current, h is the Planck constant, and c is the speed of light in vacuum. The ηe-to-p of the device is found to be around 4.77% under a forward injection current of 11 mA and a bias voltage of 4 V. Compared with the highest ηe-to-p of other published QLEDs,9,12,28 the ηe-to-p of this IVU-QLED device is lower because of the increased resistance caused by the additional PbS QD layer. The result of the IVU-QLED reaches a p-to-e conversion efficiency of 54% with an applied voltage of 4 V and under an IR illumination (λ = 980 nm) power density of 25.8 mW cm−2. Compared with the other work,11 the p-to-e conversion efficiencies of our devices are reasonable under a low operational voltage. The IVU-QLED device leads to a p-to-p conversion efficiency of 0.2% at 4 V, which can be calculated as follows:28,
(3)
where ΔPe and ΔPi refer to the variation power of emitted photons and power of incident IR and λe and λi refer to the corresponding wavelength, respectively. Compared with several up-conversion devices with a similar structure or similar materials,9,31–35 our IVU-QLED device has great efficiency with the advantage of low working voltage. The specific detectivity (D*) can be calculated by assuming that the noise from dark current constitutes the major contribution to the total noise,36 
(4)
where R is the responsivity, S is the working area of the device, and Idark is the dark current. The detectivity of this work is found to be 4.6 × 1010 Jones under a bias voltage of 4 V. The obtained results match those of the previously reported devices fabricated with a similar structure and material components, as listed in Table I.9,29,30,36–41 In the table, PD, PC, and PT refer to the photodiode, photoconductor, and phototransistor, respectively.
TABLE I.

Comparison of PbS QD based up-conversion devices with published references.

Materials and refsStructureR (A/W)D* (Jones)
Hybrid organic/PbS QD9  PD 6.32 1.12 × 1013 
ZnO NWs/PbS QD28  PD 0.0072 4.90 × 107 
ZnO NPs/PbS QD29  PD ∼0.01 1.00 × 1010 
ZnO thin film/PbS QD36  PD 10.9 7.90 × 1012 
P3HT:PCBM:PbS QD:ZnO QD/PEDOT:PSS37  PD 0.0012 2.3 × 1011 
PbS QD/MoO338  PT 2.1 × 1010 
PbS QD/WS239  PT ⋯ 9.0 × 1011 
PbS QD40  PC 0.27 7.5 × 1011 
PbS QD/perovskite41  PC 1.58 3.0 × 1011 
This work QLED 0.43 4.60 × 1010 
Materials and refsStructureR (A/W)D* (Jones)
Hybrid organic/PbS QD9  PD 6.32 1.12 × 1013 
ZnO NWs/PbS QD28  PD 0.0072 4.90 × 107 
ZnO NPs/PbS QD29  PD ∼0.01 1.00 × 1010 
ZnO thin film/PbS QD36  PD 10.9 7.90 × 1012 
P3HT:PCBM:PbS QD:ZnO QD/PEDOT:PSS37  PD 0.0012 2.3 × 1011 
PbS QD/MoO338  PT 2.1 × 1010 
PbS QD/WS239  PT ⋯ 9.0 × 1011 
PbS QD40  PC 0.27 7.5 × 1011 
PbS QD/perovskite41  PC 1.58 3.0 × 1011 
This work QLED 0.43 4.60 × 1010 

Combing several advantages as shown above, including infrared-to-visible upconversion, dual function modulation, tunable color emission, fast response time, and cost-effective solution processes, the developed IVU-QLED device should be very valuable for the exploration of optoelectronic devices with great potential application, in particular for anti-counterfeiting information technology and bio-imaging.

In conclusion, an all-solution-processed IVU-QLED device possessing the ability of IR-detection and visual response was designed, fabricated, and demonstrated. By using the integration of IR QDs and the mixture of different sizes of CdSe/ZnS QDs as both the CGL and EML, respectively, in the designed configuration, the current through the IVU-QLED can be dual-modulated by both incident IR and external bias. The device can serve as an infrared sensor as well as a visible display, and it also possesses the unexplored feature of the tunable color emission characteristics. Furthermore, extra messages or patterns of visualized data can be added to the input signal to obtain a recognizable and visual response, which is very useful for the perfect security of anti-counterfeiting. Due to the versatility of semiconductor QDs, the functionalities of the IVU-QLED device, such as absorption and emission wavelength, can be manipulated by simply using different sizes or materials of QDs. Compared with the previous studies, our designed IVU-QLED device, which possesses several advantageous features, including cost-effectiveness, dual functional modulation, tunable color emission, patterning of visible display, infrared-visible upconversion, and fast response time, should be very useful and timely for the development of future generation optoelectronic devices with applications ranging from bio-imaging to anti-counterfeiting.

This work was financially supported by the “Advanced Research Centre for Green Materials Science and Technology” from the Featured Area Research Centre Program within the framework of the Higher Education Sprout Project by the Ministry of Education (Grant No. 111L9006) and the Ministry of Science and Technology in Taiwan (Grant Nos. MOST110-2634-F-002-043 and MOST 110-2112-M-002-044).

The authors have no conflicts to disclose.

Zun-Hong Jiang and Hsia Yu Lin contributed equally to this work.

Zun-Hong Jiang: Conceptualization (equal); Data curation (equal); Formal analysis (equal); Writing – original draft (equal). Hsia Yu Lin: Conceptualization (equal); Methodology (equal); Resources (equal); Writing – review & editing (equal). Yang Fang Chen: Conceptualization (equal); Project administration (equal); Resources (equal); Supervision (equal); Writing – review & editing (equal).

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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