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Low Frequency Noise Resolution Of Ru‐Based Low‐Temperature Thick Film Sensors
AIP Conf. Proc. 780, 163–166 (2005)
https://doi.org/10.1063/1.2036723
Modeling and characterization of noise in 90‐nm RF CMOS technology
A. J. Scholten; L. F. Tiemeijer; A. T. A. Zegers‐van Duijnhoven; R. J. Havens; R. de Kort; R. van Langevelde; D. B. M. Klaassen; W. Jeamsaksiri; R. M. D. A. Velghe
AIP Conf. Proc. 780, 735–740 (2005)
https://doi.org/10.1063/1.2036855
Noise‐induced patterns in semiconductor nanostructures and time‐delayed feedback control
AIP Conf. Proc. 780, 37–40 (2005)
https://doi.org/10.1063/1.2036693
RTS in Submicron MOSFETs: High Field Effects
AIP Conf. Proc. 780, 339–342 (2005)
https://doi.org/10.1063/1.2036764
1/f Noise In Low Density Two‐Dimensional Hole Systems In GaAs
AIP Conf. Proc. 780, 139–142 (2005)
https://doi.org/10.1063/1.2036717
Extensions of the Stochastic Model of the Overdamped Oscillator Applied to AC Ionic Conductivity in Solids
AIP Conf. Proc. 780, 59–62 (2005)
https://doi.org/10.1063/1.2036698
Low Frequency Noise Of AlGaN/GaN HEMT Grown On Al2O3, Si And SiC Substrates
AIP Conf. Proc. 780, 299–302 (2005)
https://doi.org/10.1063/1.2036754
Noise Enhancement as Indicator of Instability Onset in Semiconductor Structures
AIP Conf. Proc. 780, 791–794 (2005)
https://doi.org/10.1063/1.2036867
Decoherence and current fluctuations in tunneling through coupled quantum dots
AIP Conf. Proc. 780, 439–441 (2005)
https://doi.org/10.1063/1.2036787
Model of the 1/f Noise in GaN/AlGaN Heterojunction Field Effect Transistors
AIP Conf. Proc. 780, 291–294 (2005)
https://doi.org/10.1063/1.2036752
Investigation of Shot Noise Reduction in InGaP HBTs with different Base Thickness
AIP Conf. Proc. 780, 303–306 (2005)
https://doi.org/10.1063/1.2036755
Low‐frequency Noise Characterization of Hot‐electron Degradation in GaN‐based HEMTs
AIP Conf. Proc. 780, 295–298 (2005)
https://doi.org/10.1063/1.2036753
Generation of Interface States Due to Quantum‐Dot Growth in Au/GaAs Schottky Diode Structures
AIP Conf. Proc. 780, 109–112 (2005)
https://doi.org/10.1063/1.2036710
1/f ‐ type Noise in View of Phonons Interface Percolation Dynamics
AIP Conf. Proc. 780, 87–90 (2005)
https://doi.org/10.1063/1.2036705
Unusual Fluctuations of Flux Flow at Low Temperature in Superconducting Films
AIP Conf. Proc. 780, 117–120 (2005)
https://doi.org/10.1063/1.2036712
Shot Noise Experiments in Multi‐barrier Semiconductor Heterostructures
AIP Conf. Proc. 780, 431–434 (2005)
https://doi.org/10.1063/1.2036785
Control of noise‐induced oscillations in superlattices by delayed feedback
AIP Conf. Proc. 780, 41–44 (2005)
https://doi.org/10.1063/1.2036694
Current Noise in Non‐Chiral Luttinger Liquids: Appearance of Fractional Charge
AIP Conf. Proc. 780, 421–424 (2005)
https://doi.org/10.1063/1.2036783
Photo‐assisted shot noise in the fractional quantum Hall regime
AIP Conf. Proc. 780, 488–491 (2005)
https://doi.org/10.1063/1.2036799
Acoustic Noise Spectrum of the Liquid Helium Boiling Process on Superconducting Bolometer Surface
AIP Conf. Proc. 780, 147–150 (2005)
https://doi.org/10.1063/1.2036719
Foil Capacitors Reliability Prediction Based On Fluctuation And Non‐Linear Phenomena
AIP Conf. Proc. 780, 725–728 (2005)
https://doi.org/10.1063/1.2036853
Study of dendritic avalanches by current noise measurements in High Tc Superconductors
AIP Conf. Proc. 780, 121–124 (2005)
https://doi.org/10.1063/1.2036713
Low Frequency Noise in Contacted Single‐Wall Carbon Nanotube
S. Soliveres; A. Hoffmann; F. Pascal; C. Delseny; A. Salesse; M. S. Kabir; S. Bengtsson; O. Nur; M. Willander; J. Deen
AIP Conf. Proc. 780, 462–465 (2005)
https://doi.org/10.1063/1.2036793
Modelization of Thermal Fluctuations in G Protein‐Coupled Receptors
AIP Conf. Proc. 780, 611–614 (2005)
https://doi.org/10.1063/1.2036827
Novel Transimpedance amplifier for Noise Measurements on Bio‐Electronic devices
AIP Conf. Proc. 780, 653–656 (2005)
https://doi.org/10.1063/1.2036836
Gate and drain low frequency noise in HfO2 NMOSFETs
T. Nguyen; M. Valenza; F. Martinez; G. Neau; J. C. Vildeuil; G. Ribes; V. Cosnier; T. Skotnicki; M. Müller
AIP Conf. Proc. 780, 235–238 (2005)
https://doi.org/10.1063/1.2036739
Drain and Gate Current LF Noise in Advanced CMOS devices with Ultrathin gate Oxides
AIP Conf. Proc. 780, 315–318 (2005)
https://doi.org/10.1063/1.2036758
Intrinsic fluctuations induced by a high‐κ gate dielectric in sub‐100 nm Si MOSFETs
AIP Conf. Proc. 780, 239–242 (2005)
https://doi.org/10.1063/1.2036740
Effect of Oxide Thickness and Nitridation Process on PMOS Gate and Drain Low Frequency Noise
F. Martinez; C. Leyris; M. Valenza; A. Hoffmann; F. Boeuf; T. Skotnicki; M. Bidaud; D. Barge; B. Tavel
AIP Conf. Proc. 780, 323–326 (2005)
https://doi.org/10.1063/1.2036760
Suppression of Offset and Drift in a dc Amplifier by Combination of Multiple Amplifiers
AIP Conf. Proc. 780, 657–660 (2005)
https://doi.org/10.1063/1.2036837
Current and noise suppression in ac‐driven coherent transport
AIP Conf. Proc. 780, 45–50 (2005)
https://doi.org/10.1063/1.2036695
Characterization of Low‐Frequency Noise Sources in Planar Devices Using Cross‐Shaped 4‐Terminal Devices
AIP Conf. Proc. 780, 327–330 (2005)
https://doi.org/10.1063/1.2036761
Acoustic Emission, Electrical And Light Fluctuations In Optoelectronic Devices
AIP Conf. Proc. 780, 389–392 (2005)
https://doi.org/10.1063/1.2036776
Analytical Model of Noise Spectrum in Schottky‐Barrier Diodes
AIP Conf. Proc. 780, 759–762 (2005)
https://doi.org/10.1063/1.2036860
Non‐linear noise in nanometric Schottky‐barrier diodes
S. Pérez; T. González; P. Shiktorov; E. Starikov; V. Gruzinskis; L. Reggiani; L. Varani; J. C. Vaissière
AIP Conf. Proc. 780, 753–758 (2005)
https://doi.org/10.1063/1.2036859
Observation of 1/fα Noise of GaInP/GaAs Triple Barrier Resonant Tunneling Diodes
AIP Conf. Proc. 780, 492–495 (2005)
https://doi.org/10.1063/1.2036800
Fundamental Effects in the Dependence of the 1/f Noise Spectrum on the Bias Current in Semiconductor Diodes
AIP Conf. Proc. 780, 347–350 (2005)
https://doi.org/10.1063/1.2036766
Low Frequency Noise sensitivity to technology induced mechanical stress in MOSFETs
AIP Conf. Proc. 780, 191–194 (2005)
https://doi.org/10.1063/1.2036729
Governing Equations of the Green’s Functions for the Short‐Circuit Terminal Noise Currents in Semiconductor Devices
AIP Conf. Proc. 780, 787–790 (2005)
https://doi.org/10.1063/1.2036866
A Fast Stochastic Digital Signal Generator Based on Chaotic Iteration
AIP Conf. Proc. 780, 95–98 (2005)
https://doi.org/10.1063/1.2036707
Evolution of R.T.S Source Activities in Saturation Range in N‐MOSFETs for Different Oxidation Temperatures
AIP Conf. Proc. 780, 213–216 (2005)
https://doi.org/10.1063/1.2036734
Noise in SOI MOSFETs and Gate‐All Around Transistors
AIP Conf. Proc. 780, 269–274 (2005)
https://doi.org/10.1063/1.2036747
Nonlinear Noise in SiGe Bipolar Devices and its Impact on Radio‐Frequency Amplifier Phase Noise
AIP Conf. Proc. 780, 513–516 (2005)
https://doi.org/10.1063/1.2036804
Noise Performance at Cryogenic Temperature of Microwave SiGeC Low Noise Amplifier using BiCMOS Technology
AIP Conf. Proc. 780, 509–512 (2005)
https://doi.org/10.1063/1.2036803
Transition between Pauli exclusion and Coulomb interaction in the noise behavior of resonant tunneling devices
AIP Conf. Proc. 780, 435–438 (2005)
https://doi.org/10.1063/1.2036786
Light transport through Photonic Liquids
L. S. Froufe‐Pérez; S. Albaladejo; E. Sahagún; P. García‐Mochales; M. Reufer; F. Scheffold; J. J. Sáenz
AIP Conf. Proc. 780, 357–360 (2005)
https://doi.org/10.1063/1.2036768
TeraHertz emission from nanometric HEMTs analyzed by noise spectra
J.‐F. Millithaler; L. Varani; C. Palermo; J. Mateos; T. González; S. Perez; D. Pardo; W. Knap; J. Lusakowski; N. Dyakonova; S. Bollaert; A. Cappy
AIP Conf. Proc. 780, 335–338 (2005)
https://doi.org/10.1063/1.2036763
Noise Properties Of High Resistivity Cl‐doped Cadmium Telluride
AIP Conf. Proc. 780, 155–158 (2005)
https://doi.org/10.1063/1.2036721
Noise Modelling of Absolute High‐Tc Superconducting Measuring Instrument for X‐ray Synchrotron Radiation
AIP Conf. Proc. 780, 373–376 (2005)
https://doi.org/10.1063/1.2036772
Fluctuations in Neuronal Activity: Clues to Brain Function
José L. Pérez Velazquez; Ramón Guevara; Jason Belkas; Richard Wennberg; Goran Senjanoviè; Luis García Dominguez
AIP Conf. Proc. 780, 595–598 (2005)
https://doi.org/10.1063/1.2036823
Geometry Dependence of 1/f Noise in n‐ and p‐channel MuGFETs
V. Subramanian; A. Mercha; A. Dixit; K. G. Anil; M. Jurczak; K. De Meyer; S. Decoutere; H. Maes; G. Groeseneken; W. Sansen
AIP Conf. Proc. 780, 279–282 (2005)
https://doi.org/10.1063/1.2036749
Low Frequency Noise Measurements in La0.7Sr0.3MnO3 Thin Films on (100) SrTiO3
AIP Conf. Proc. 780, 143–146 (2005)
https://doi.org/10.1063/1.2036718
Noise and I‐V Characteristic as Characterization Tools for GaSb based Laser Diodes
AIP Conf. Proc. 780, 721–724 (2005)
https://doi.org/10.1063/1.2036852
Nanoscale electronic noise measurements
AIP Conf. Proc. 780, 575–578 (2005)
https://doi.org/10.1063/1.2036818
Excess Noise In Carbon Nanotubes
AIP Conf. Proc. 780, 458–461 (2005)
https://doi.org/10.1063/1.2036792
Hanbury Brown and Twiss Noise Correlations to Probe the Statistics of GHz Photons Emitted by Quantum Conductors
AIP Conf. Proc. 780, 466–471 (2005)
https://doi.org/10.1063/1.2036794
An Analytical Thermal Noise Model of the MOS Transistor Valid in All Modes of Operation
AIP Conf. Proc. 780, 741–744 (2005)
https://doi.org/10.1063/1.2036856
Accuracy of 1/f Noise Parameter Extraction in the Presence of Background Noise
AIP Conf. Proc. 780, 665–668 (2005)
https://doi.org/10.1063/1.2036839
Hooge Noise Parameter of GaN HFETs on SiC
Nobuhisa Tanuma; Jan Pavelka; Shuichi Yagi; Hajime Okumura; T. Uemura; Munecazu Tacano; Sumihisa Hashiguchi; Josef Sikula
AIP Conf. Proc. 780, 343–346 (2005)
https://doi.org/10.1063/1.2036765
Low‐Frequency Noise Characterization of 90 nm Multiple Gate Oxide CMOS Transistors
AIP Conf. Proc. 780, 331–334 (2005)
https://doi.org/10.1063/1.2036762
A Frequency Domain Spherical Harmonics Solver for the Langevin Boltzmann Equation
AIP Conf. Proc. 780, 777–782 (2005)
https://doi.org/10.1063/1.2036864
The Low‐frequency Noise of Strained Silicon n‐MOSFETs
E. Simoen; G. Eneman; P. Verheyen; R. Delhougne; R. Rooyackers; R. Loo; W. Vandervorst; K. De Meyer; C. Claeys
AIP Conf. Proc. 780, 187–190 (2005)
https://doi.org/10.1063/1.2036728
Noise and Charge Storage in Nb2O5 Thin Films
AIP Conf. Proc. 780, 135–138 (2005)
https://doi.org/10.1063/1.2036716
Analytical Calculations For The Influence Of Carrier’s Phase Noise On Modulating Signals
AIP Conf. Proc. 780, 525–528 (2005)
https://doi.org/10.1063/1.2036807
Analysis and Design of a Frequency Synthesizer with Internal and External Noise Sources
AIP Conf. Proc. 780, 521–524 (2005)
https://doi.org/10.1063/1.2036806
Comparative Analysis of Sequential and Coherent tunneling Models of Shot Noise in Resonant Diodes
AIP Conf. Proc. 780, 425–430 (2005)
https://doi.org/10.1063/1.2036784
Noise in Si and SiGe MOSFETs with High‐k Gate Dielectrics
AIP Conf. Proc. 780, 225–230 (2005)
https://doi.org/10.1063/1.2036737
High Magnetic Field Dependence of Capture/Emission Fluctuations of a Single Defect in Silicon MOSFETs
AIP Conf. Proc. 780, 221–224 (2005)
https://doi.org/10.1063/1.2036736
Influence of Carbon Incorporation on the Low Frequency Noise of Si/SiGe:C HBTs based on 0.25 μm BiCMOS Technology
AIP Conf. Proc. 780, 257–260 (2005)
https://doi.org/10.1063/1.2036744
A Method Of Two‐Terminal Excess Noise Measurement With A Reduction Of Measurement System And Contact Noise
AIP Conf. Proc. 780, 677–680 (2005)
https://doi.org/10.1063/1.2036842
Low‐Frequency Noise in SOI SiGe HBTs Made by Selective Growth of the Si Collector and Non‐Selective Growth of SiGe Base
N. Lukyanchikova; N. Garbar; A. Smolanka; M. Lokshin; S. Hall; O. Buiu; I. Z. Mitrovic; H. A. W. Mubarek; P. Ashburn
AIP Conf. Proc. 780, 265–268 (2005)
https://doi.org/10.1063/1.2036746
Microwave Induced Effects on the Random Telegraph Signal in a MOSFET
AIP Conf. Proc. 780, 171–174 (2005)
https://doi.org/10.1063/1.2036725
Chaotic‐to‐regular crossover of shot noise in mesoscopic conductors
AIP Conf. Proc. 780, 454–457 (2005)
https://doi.org/10.1063/1.2036791
Noise Simulation of Continuous‐Time ΣΔ Modulators
AIP Conf. Proc. 780, 505–508 (2005)
https://doi.org/10.1063/1.2036802
Low Frequency Noise Considerations for CMOS Analog Circuit Design
AIP Conf. Proc. 780, 703–708 (2005)
https://doi.org/10.1063/1.2036848
−190 dBV2/Hz Preamplifier for Low Frequency Noise Measurements
Saburo Yokokura; Nobuhisa Tanuma; Munecazu Tacano; Sumihisa Hashiguchi; Josef Sikula; Yoko Kajiwara; Masami Hirasita
AIP Conf. Proc. 780, 693–696 (2005)
https://doi.org/10.1063/1.2036846
Accelerated Aging of GaN Light Emitting Diodes Studied by 1/f and RTS Noise
AIP Conf. Proc. 780, 709–712 (2005)
https://doi.org/10.1063/1.2036849
Experimental Study Of Hysteretic Josephson Junctions As Threshold Detectors Of Shot Noise
AIP Conf. Proc. 780, 661–664 (2005)
https://doi.org/10.1063/1.2036838
Impact of interface micro‐roughness on low frequency noise in (110) and (100) pMOSFETs
AIP Conf. Proc. 780, 199–202 (2005)
https://doi.org/10.1063/1.2036731
Low‐Frequency Current Fluctuations in Post‐Hard Breakdown Thin Silicon Oxide Films
AIP Conf. Proc. 780, 131–134 (2005)
https://doi.org/10.1063/1.2036715
Fluctuations of the Single Photon Response in Visual Transduction
AIP Conf. Proc. 780, 553–556 (2005)
https://doi.org/10.1063/1.2036813
Fluctuation of the Electron Scattering Probability in One‐dimensional Atomic Chain Having Plural Degree of Freedom
AIP Conf. Proc. 780, 795–798 (2005)
https://doi.org/10.1063/1.2036868
Transmittances Distributions at the Diffusive‐Localized Crossover in Disordered Wave‐guides with Absorption
AIP Conf. Proc. 780, 381–384 (2005)
https://doi.org/10.1063/1.2036774
Progress toward “optical beam induced noise” measurement set‐up
AIP Conf. Proc. 780, 681–684 (2005)
https://doi.org/10.1063/1.2036843
Photonic Propagation Noise On Long Atmospheric Paths
AIP Conf. Proc. 780, 353–356 (2005)
https://doi.org/10.1063/1.2036767
Contributions of Channel Gate and Overlap Gate Currents on 1/f Gate Current Noise for Thin Oxide Gate p‐MOSFETs
AIP Conf. Proc. 780, 243–246 (2005)
https://doi.org/10.1063/1.2036741
Can 1/f noise in MOSFETs be reduced by gate oxide and channel optimization?
AIP Conf. Proc. 780, 195–198 (2005)
https://doi.org/10.1063/1.2036730
LF Noise and Tunneling Current in Nanometric SiO2 Layers
AIP Conf. Proc. 780, 209–212 (2005)
https://doi.org/10.1063/1.2036733
Baseline Noise in High‐Performance Liquid Chromatography with Electrochemical Detection
AIP Conf. Proc. 780, 643–646 (2005)
https://doi.org/10.1063/1.2036834
Chaos and Resonance in the Model for Current Oscillations at the Si/Electrolyte Contact
AIP Conf. Proc. 780, 635–638 (2005)
https://doi.org/10.1063/1.2036832
The Noise Diagnostics of Organic Electrolytes for Rechargeable Lithium Batteries
AIP Conf. Proc. 780, 647–650 (2005)
https://doi.org/10.1063/1.2036835
Stochastic resonances and highly selective separation methods: application to the detection of DNA mutations
AIP Conf. Proc. 780, 639–642 (2005)
https://doi.org/10.1063/1.2036833
Functional Roles of Noise and Fluctuations in the Human Brain
Yoshiharu Yamamoto; Rika Soma; Keiichi Kitajo; Leonid A. Safonov; Kentaro Yamanaka; Ichiro Hidaka; Kyoko Ohashi; Daichi Nozaki; Zbigniew R. Struzik; Lawrence M. Ward; Shin Kwak
AIP Conf. Proc. 780, 535–540 (2005)
https://doi.org/10.1063/1.2036809
Effect of Base/Collector Implant and Emitter‐Poly Overlap on Low Frequency Noise in SiGe HBTs
AIP Conf. Proc. 780, 261–264 (2005)
https://doi.org/10.1063/1.2036745
Impact of Lateral Scaling on Low Frequency Noise of 200 GHz SiGe:C HBTs
AIP Conf. Proc. 780, 253–256 (2005)
https://doi.org/10.1063/1.2036743
Starting and Stopping a Bistable Pacemaker: Stochastic Stimulation Identifies Critical Perturbations
AIP Conf. Proc. 780, 571–574 (2005)
https://doi.org/10.1063/1.2036817
Uncertainty In Measuring Noise Parameters Of a Communication Receiver
AIP Conf. Proc. 780, 689–692 (2005)
https://doi.org/10.1063/1.2036845
Fano factor reduction on the 0.7 structure
P. Roche; J. Ségala; D. C. Glattli; J. T. Nicholls; M. Pepper; A. C. Graham; K. J. Thomas; M. Y. Simmons; D. A. Ritchie
AIP Conf. Proc. 780, 417–420 (2005)
https://doi.org/10.1063/1.2036782
Current‐driven Large Density Fluctuations of Vortices and Antivortices in the Corbino Disk
AIP Conf. Proc. 780, 167–170 (2005)
https://doi.org/10.1063/1.2036724
Changes in the Hurst Exponent of Heart Rate Variability during Physical Activity
AIP Conf. Proc. 780, 599–602 (2005)
https://doi.org/10.1063/1.2036824
What Information Is Hidden in Chaotic Signals of Biological Systems?
AIP Conf. Proc. 780, 579–582 (2005)
https://doi.org/10.1063/1.2036819
Sleep Stage Dependence of Invariance Characteristics in Fluctuations of Healthy Human Heart Rate
AIP Conf. Proc. 780, 545–548 (2005)
https://doi.org/10.1063/1.2036811
Mapping of Synaptic‐Neuronal Impairment on the Brain Surface through Fluctuation Analysis
AIP Conf. Proc. 780, 541–544 (2005)
https://doi.org/10.1063/1.2036810
Low‐frequency Noise in SiGe Channel pMOSFETs on Ultra‐Thin Body SOI with Ni‐Silicided Source/Drain
AIP Conf. Proc. 780, 307–310 (2005)
https://doi.org/10.1063/1.2036756
HF Noise Performance and Modelling of SiGe HFETs
AIP Conf. Proc. 780, 287–290 (2005)
https://doi.org/10.1063/1.2036751
Hot electron noise in n‐type semiconductors in crossed electric and magnetic fields
AIP Conf. Proc. 780, 159–162 (2005)
https://doi.org/10.1063/1.2036722
Noise Scattering Patterns Method for Recognition of RTS Noise in Semiconductor Components
AIP Conf. Proc. 780, 673–676 (2005)
https://doi.org/10.1063/1.2036841
Non‐Gaussian Fluctuations in Biased Resistor Networks: Size Effects Versus Universal Behavior
AIP Conf. Proc. 780, 125–130 (2005)
https://doi.org/10.1063/1.2036714
Criticality and Universality in Healthy Heart Rate Dynamics
AIP Conf. Proc. 780, 549–552 (2005)
https://doi.org/10.1063/1.2036812
Stochastic Resonance of Artificial Ion Channels inserted in Small Membrane Patches
AIP Conf. Proc. 780, 567–570 (2005)
https://doi.org/10.1063/1.2036816
Brownian dynamics simulations of ionic current through an open channel
AIP Conf. Proc. 780, 563–566 (2005)
https://doi.org/10.1063/1.2036815
The implementation of reflective assessment using Gibbs’ reflective cycle in assessing students’ writing skill
Lala Nurlatifah, Pupung Purnawarman, et al.
Effect of coupling agent type on the self-cleaning and anti-reflective behaviour of advance nanocoating for PV panels application
Taha Tareq Mohammed, Hadia Kadhim Judran, et al.
Design of a 100 MW solar power plant on wetland in Bangladesh
Apu Kowsar, Sumon Chandra Debnath, et al.