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Fourier Transform Scanning Tunneling Spectroscopy Studies of the Electronic Structure of Superconducting Bi₂Sr₂CaCu₂O_8+δ

K. McElroy; J. E. Hoffman; H. Eisaki; S. Uchida; J. C. Davis

AIP Conf. Proc. 696, 1–10 (2003) https://doi.org/10.1063/1.1639671

View articletitled, Fourier Transform Scanning Tunneling Spectroscopy Studies of the Electronic Structure of Superconducting Bi2Sr2CaCu2O8+δ

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Visualizing the Influence of Interactions on the Nanoscale: Simple Electron Systems

M. Morgenstern; J. Klijn; Chr. Meyer; D. Haude; R. Wiesendanger

AIP Conf. Proc. 696, 11–19 (2003) https://doi.org/10.1063/1.1639672

Abstract

View articletitled, Visualizing the Influence of Interactions on the Nanoscale: Simple Electron Systems

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Energy Resolved Imaging of Fullerene Molecular Orbitals

M. Grobis; Xinghua Lu; K. H. Khoo; Steven G. Louie; M. F. Crommie

AIP Conf. Proc. 696, 20–27 (2003) https://doi.org/10.1063/1.1639673

Abstract

View articletitled, Energy Resolved Imaging of Fullerene Molecular Orbitals

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Energy‐Filtered Scanning Tunneling Microscopy using a Semiconductor Tip

P. Sutter

AIP Conf. Proc. 696, 28–36 (2003) https://doi.org/10.1063/1.1639674

Abstract

View articletitled, Energy‐Filtered Scanning Tunneling Microscopy using a Semiconductor Tip

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Theory of STM‐Induced Light Emission from Na Overlayers on Cu

P. Johansson; G. Hoffmann; R. Berndt

AIP Conf. Proc. 696, 37–44 (2003) https://doi.org/10.1063/1.1639675

Abstract

View articletitled, Theory of STM‐Induced Light Emission from Na Overlayers on Cu

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Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy

D. Rugar; R. Budakian; H. J. Mamin; B. W. Chui

AIP Conf. Proc. 696, 45–52 (2003) https://doi.org/10.1063/1.1639676

Abstract

View articletitled, Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy

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Spin Polarized Surface States of Cobalt Nanoislands on Cu(111)

L. Diekhöner; M. A. Schneider; P. Wahl; A. N. Baranov; V. S. Stepanyuk; P. Bruno; K. Kern

AIP Conf. Proc. 696, 53–59 (2003) https://doi.org/10.1063/1.1639677

Abstract

View articletitled, Spin Polarized Surface States of Cobalt Nanoislands on Cu(111)

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Atomic Force Microscopy on Its Way to Adolescence

Franz J. Giessibl

AIP Conf. Proc. 696, 60–67 (2003) https://doi.org/10.1063/1.1639678

Abstract

View articletitled, Atomic Force Microscopy on Its Way to Adolescence

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Three‐Dimensional Force Field Spectroscopy

Alexander Schwarz; Hendrik Hölscher; S. M. Langkat; R. Wiesendanger

AIP Conf. Proc. 696, 68–78 (2003) https://doi.org/10.1063/1.1639679

Abstract

View articletitled, Three‐Dimensional Force Field Spectroscopy

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Ultra High‐Speed Scanning Probe Microscopy Capable of Over 100 Frames per Second

A. D. L. Humphris; J. K. Hobbs; M. J. Miles

AIP Conf. Proc. 696, 79–85 (2003) https://doi.org/10.1063/1.1639680

Abstract

View articletitled, Ultra High‐Speed Scanning Probe Microscopy Capable of Over 100 Frames per Second

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Functionalized One dimensional Wires and Their Interconnections

J. Lee; S. Lee; H. J. Chung; Y. J. Song; H. Kim; Y. D. Park; H. S. Suh; Y. S. Cho; Young Kuk

AIP Conf. Proc. 696, 86–93 (2003) https://doi.org/10.1063/1.1639681

Abstract

View articletitled, Functionalized One dimensional Wires and Their Interconnections

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Properties of Boron Nitride Nanotubes

Masa Ishigami; Shaul Aloni; A. Zettl

AIP Conf. Proc. 696, 94–99 (2003) https://doi.org/10.1063/1.1639682

Abstract

View articletitled, Properties of Boron Nitride Nanotubes

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Understanding the Hopping Mechanism of Molecule Cascades at Very Low Temperatures

A. J. Heinrich; C. P. Lutz; J. A. Gupta; D. M. Eigler

AIP Conf. Proc. 696, 100–108 (2003) https://doi.org/10.1063/1.1639683

Abstract

View articletitled, Understanding the Hopping Mechanism of Molecule Cascades at Very Low Temperatures

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Force, Current and Field Effects in Single Atom Manipulation

K.‐F. Braun; S.‐W. Hla; N. Pertaya; H.‐W. Soe; C. F. J. Flipse; K.‐H. Rieder

AIP Conf. Proc. 696, 109–116 (2003) https://doi.org/10.1063/1.1639684

Abstract

View articletitled, Force, Current and Field Effects in Single Atom Manipulation

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From Single Atoms to Nanoparticles — Spectroscopy on the Atomic Level

Niklas Nilius

AIP Conf. Proc. 696, 117–126 (2003) https://doi.org/10.1063/1.1639685

Abstract

View articletitled, From Single Atoms to Nanoparticles — Spectroscopy on the Atomic Level

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Single Molecules, Single Nanoparticles and Their Optical Interaction

C. Hettich; Th. Kalkbrenner; I. Gerhardt; S. Kühn; V. Sandoghdar

AIP Conf. Proc. 696, 127–135 (2003) https://doi.org/10.1063/1.1639686

Abstract

View articletitled, Single Molecules, Single Nanoparticles and Their Optical Interaction

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Chemistry of Single Molecules at Surfaces

Maki Kawai; T. Komeda; Y. Kim; Y. Sainoo

AIP Conf. Proc. 696, 136–143 (2003) https://doi.org/10.1063/1.1639687

Abstract

View articletitled, Chemistry of Single Molecules at Surfaces

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Supramolecular Engineering Of Metal‐Organic Networks At Surfaces

Nian Lin; Alexandre Dmitriev; Hannes Spillmann; Paolo Messina; Magali Lingenfelder; Sebastian Stepanow; Johannes V. Barth; Klaus Kern

AIP Conf. Proc. 696, 144–149 (2003) https://doi.org/10.1063/1.1639688

Abstract

View articletitled, Supramolecular Engineering Of Metal‐Organic Networks At Surfaces

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Scanning Probe Surface Modification: Chemical Conversion of Terminal Functional Groups on Organosilane Self‐Assembled Monolayers

Hiroyuki Sugimura; Nagahiro Saito; Kazuyuki Hayashi; Noriya Maeda; Osamu Takai

AIP Conf. Proc. 696, 150–157 (2003) https://doi.org/10.1063/1.1639689

Abstract

View articletitled, Scanning Probe Surface Modification: Chemical Conversion of Terminal Functional Groups on Organosilane Self‐Assembled Monolayers

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Folding, Structure and Function of Biological Nanomachines Examined by AFM

Daniel J. Müller; Harald Janovjak; Fedor Severin

AIP Conf. Proc. 696, 158–165 (2003) https://doi.org/10.1063/1.1639690

Abstract

View articletitled, Folding, Structure and Function of Biological Nanomachines Examined by AFM

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Insulated Conductive Probes for in situ Experiments in Structural Biology

T. Akiyama; M. R. Gullo; N. F. de Rooij; U. Staufer; A. Tonin; A. Engel; P. L. T. M. Frederix

AIP Conf. Proc. 696, 166–171 (2003) https://doi.org/10.1063/1.1639691

Abstract

View articletitled, Insulated Conductive Probes for in situ Experiments in Structural Biology

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Scanning Force Microscopy Studies of the Adsorption and Desorption of DNA at Solid‐Liquid Interfaces

Fabio Grandi; Anna Bergia; Andrea Giro; Giampaolo Zuccheri; Bruno Samorì

AIP Conf. Proc. 696, 172–179 (2003) https://doi.org/10.1063/1.1639692

Abstract

View articletitled, Scanning Force Microscopy Studies of the Adsorption and Desorption of DNA at Solid‐Liquid Interfaces

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Radio Frequency Circuitry for Atomic Force Microscopy up to 100 MHz

Dai Kobayashi; Shigeki Kawai; Hideki Kawakatsu

AIP Conf. Proc. 696, 180–187 (2003) https://doi.org/10.1063/1.1639693

Abstract

View articletitled, Radio Frequency Circuitry for Atomic Force Microscopy up to 100 MHz

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Cryogenic Magnetic Force Microscope

F. D. Callaghan; R. J. Turner; D. G. Walmsley

AIP Conf. Proc. 696, 188–195 (2003) https://doi.org/10.1063/1.1639694

Abstract

View articletitled, Cryogenic Magnetic Force Microscope

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Low‐Temperature Ultrahigh‐Vacuum Atomic Force Microscope

Laurent Libioulle; Alexandra Radenovic; Eva Bystrenova; Giovanni Dietler

AIP Conf. Proc. 696, 196–203 (2003) https://doi.org/10.1063/1.1639695

Abstract

View articletitled, Low‐Temperature Ultrahigh‐Vacuum Atomic Force Microscope

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Development of a Near‐Field Magneto‐Optical Microscopy for Studying Ultrafast Magnetization Dynamics

G. Zoriniants; D. Englund; O. Kurnosikov; C. F. J. Flipse; E. Riedo; H. Brune; W. J. M. de Jonge; B. Koopmans

AIP Conf. Proc. 696, 204–210 (2003) https://doi.org/10.1063/1.1639696

Abstract

View articletitled, Development of a Near‐Field Magneto‐Optical Microscopy for Studying Ultrafast Magnetization Dynamics

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SNOM Set‐up to Study Surface Plasmons on Nanostructured Surfaces

A. Englisch; R. Schön; U. Hartmann

AIP Conf. Proc. 696, 211–215 (2003) https://doi.org/10.1063/1.1639697

Abstract

View articletitled, SNOM Set‐up to Study Surface Plasmons on Nanostructured Surfaces

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Low Budget UHV STM Built by Physics Students for Use in a Laboratory Exercises Course

S. K. Becker; J. Grabowski; T.‐Y. Kim; L. Amsel; F. Bechtel; N. Tschirner; I. Mantouvalou; A. Lenz; R. Timm; K. Hodeck; F. Streicher; G. Pruskil; H. Eisele; M. Dähne

AIP Conf. Proc. 696, 216–222 (2003) https://doi.org/10.1063/1.1639698

Abstract

View articletitled, Low Budget UHV STM Built by Physics Students for Use in a Laboratory Exercises Course

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Nano‐scale Force Feedback Manipulator

M. Jobin; R. Foschia; A. Kulik

AIP Conf. Proc. 696, 223–226 (2003) https://doi.org/10.1063/1.1639699

Abstract

View articletitled, Nano‐scale Force Feedback Manipulator

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Tuning Fork AFM with Conductive Cantilever

Kaspar Suter; Terunobu Akiyama; Nicolaas F. de Rooij; Andreas Baumgartner; Thomas Ihn; Klaus Ensslin; Urs Staufer

AIP Conf. Proc. 696, 227–233 (2003) https://doi.org/10.1063/1.1639700

Abstract

View articletitled, Tuning Fork AFM with Conductive Cantilever

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2‐Dimension PZT Cantilever Array with New Piezoelectric Readback Method for Low Power and High Speed Nano‐Data‐Storage Application

Young‐Sik Kim; Caroline Sunyong Lee; Won‐Hyeog Jin; Hyo‐Jin Nam; Jong‐Uk Bu

AIP Conf. Proc. 696, 234–241 (2003) https://doi.org/10.1063/1.1639701

Abstract

View articletitled, 2‐Dimension PZT Cantilever Array with New Piezoelectric Readback Method for Low Power and High Speed Nano‐Data‐Storage Application

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Cantilever based SNOM Probes with Structured Apertures

P. Menon; H. Zhou; B. Casey; L. Donaldson; W. Smith; J. M. R. Weaver

AIP Conf. Proc. 696, 242–246 (2003) https://doi.org/10.1063/1.1639702

Abstract

View articletitled, Cantilever based SNOM Probes with Structured Apertures

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Technology “WhiskerProbes”

Michael E. Givargizov; Alla N. Stepanova; Lidia N. Obolenskaya; Eugene I. Givargizov

AIP Conf. Proc. 696, 247–255 (2003) https://doi.org/10.1063/1.1639703

Abstract

View articletitled, Technology “WhiskerProbes”

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Tungsten Deposited Scanning Probe Microscope Tips for Critical Dimension Measurement

M. Yasutake; T. Kaito; S. Wakiyama

AIP Conf. Proc. 696, 256–263 (2003) https://doi.org/10.1063/1.1639704

Abstract

View articletitled, Tungsten Deposited Scanning Probe Microscope Tips for Critical Dimension Measurement

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Microfabrication of Silicon/Ceramic Hybrid Cantilever for Scanning Probe Microscope and Sensor Applications

Takayuki Wakayama; Toshinari Kobayashi; Nobuya Iwata; Nozomi Tanifuji; Yasuaki Matsuda; Syoji Yamada

AIP Conf. Proc. 696, 264–270 (2003) https://doi.org/10.1063/1.1639705

Abstract

View articletitled, Microfabrication of Silicon/Ceramic Hybrid Cantilever for Scanning Probe Microscope and Sensor Applications

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Scanning Probe Microscopy Markup Language

T. Bolhuis; J. R. Pasop; L. Abelmann; J. C. Lodder

AIP Conf. Proc. 696, 271–278 (2003) https://doi.org/10.1063/1.1639706

Abstract

View articletitled, Scanning Probe Microscopy Markup Language

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A Batch Fabricated SECM‐AFM Probe

P. S. Dobson; J. V. Macpherson; M. Holder; J. M. R. Weaver

AIP Conf. Proc. 696, 279–284 (2003) https://doi.org/10.1063/1.1639707

Abstract

View articletitled, A Batch Fabricated SECM‐AFM Probe

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Oxide‐sharpened Silicon Nitride Cantilever Probe

Akitoshi Toda; Masashi Kitazawa

AIP Conf. Proc. 696, 285–291 (2003) https://doi.org/10.1063/1.1639708

Abstract

View articletitled, Oxide‐sharpened Silicon Nitride Cantilever Probe

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Fabrication of Metal Coated Carbon‐Nanotube Probe for Highly Conductive Tip

H. Negishi; S. Akita; N. Choi; Y. Nakayama

AIP Conf. Proc. 696, 292–297 (2003) https://doi.org/10.1063/1.1639709

Abstract

View articletitled, Fabrication of Metal Coated Carbon‐Nanotube Probe for Highly Conductive Tip

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Fabrication of Magnetic Probes for Spin‐Polarized STM Studies of the Fe₃O₄ (001) and (111) Surfaces

S. F. Ceballos; G. Mariotto; N. Berdunov; S. Murphy; K. Jordan; I. V. Shvets

AIP Conf. Proc. 696, 298–305 (2003) https://doi.org/10.1063/1.1639710

Abstract

View articletitled, Fabrication of Magnetic Probes for Spin‐Polarized STM Studies of the Fe3O4 (001) and (111) Surfaces

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Microfabrication of Gallium Arsenide Cantilever for Scanning Probe Microscope Application

Nobuya Iwata; Takayuki Wakayama; Takashi Ohnishi; Syoji Yamada

AIP Conf. Proc. 696, 306–312 (2003) https://doi.org/10.1063/1.1639711

Abstract

View articletitled, Microfabrication of Gallium Arsenide Cantilever for Scanning Probe Microscope Application

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Resolution of Magnetic Force Microscope with Metal‐Capped Carbon Nanotube Tips

N. Yoshida; S. Akita; Y. Nakayama

AIP Conf. Proc. 696, 313–319 (2003) https://doi.org/10.1063/1.1639712

Abstract

View articletitled, Resolution of Magnetic Force Microscope with Metal‐Capped Carbon Nanotube Tips

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High Resolution Magnetic Tips and Integrated Multi‐Wire Probes for Scanning Probe Microscopy

A. G. van den Bos; A. J. le Fèbre; H. Saito; K. Ramstöck; M. H. Siekman; L. Abelmann; J. C. Lodder

AIP Conf. Proc. 696, 320–327 (2003) https://doi.org/10.1063/1.1639713

Abstract

View articletitled, High Resolution Magnetic Tips and Integrated Multi‐Wire Probes for Scanning Probe Microscopy

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Development and Applications for the Remote Controllable Atomic Force Microscope

P. Fornaro; M. Guggisberg; T. Gyalog; Ch. Wattinger; E. Meyer; H.‐J. Güntherodt

AIP Conf. Proc. 696, 328–335 (2003) https://doi.org/10.1063/1.1639714

Abstract

View articletitled, Development and Applications for the Remote Controllable Atomic Force Microscope

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Nanofabrication of Al‐coated Oxide Aperture for NSOM Using Isotropic Etching Technique

Seong S. Choi; J. T. Ok; D. W. Kim; J. H. Boo

AIP Conf. Proc. 696, 336–342 (2003) https://doi.org/10.1063/1.1639715

Abstract

View articletitled, Nanofabrication of Al‐coated Oxide Aperture for NSOM Using Isotropic Etching Technique

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Nanometer‐scale Properties of Electrochromic Films Investigated by Current‐sensing Scanning Near‐field Optical Microscopy

F. Iwata; K. Mikage; M. Kitao; A. Sasaki

AIP Conf. Proc. 696, 343–348 (2003) https://doi.org/10.1063/1.1639716

Abstract

View articletitled, Nanometer‐scale Properties of Electrochromic Films Investigated by Current‐sensing Scanning Near‐field Optical Microscopy

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In‐situ Measurement of In‐Plane and Out‐of‐Plane Force Gradient with a Torsional Resonance Mode AFM

C. Su; L. Huang; P. Neilson; V. Kelley

AIP Conf. Proc. 696, 349–356 (2003) https://doi.org/10.1063/1.1639717

Abstract

View articletitled, In‐situ Measurement of In‐Plane and Out‐of‐Plane Force Gradient with a Torsional Resonance Mode AFM

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Torsional Resonance Mode Imaging for High‐Speed Atomic Force Microscopy

Lin Huang; Chanmin Su

AIP Conf. Proc. 696, 357–364 (2003) https://doi.org/10.1063/1.1639718

Abstract

View articletitled, Torsional Resonance Mode Imaging for High‐Speed Atomic Force Microscopy

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STM in a Gel Environment

J. W. Gerritsen; J. A. A. W. Elemans; B. Hulsken; A. M. Travaille; H. van Kempen; Th. Rasing; S. Speller

AIP Conf. Proc. 696, 365–368 (2003) https://doi.org/10.1063/1.1639719

Abstract

View articletitled, STM in a Gel Environment

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A High Resolution Multiple Analysis Approach Using Near‐Field Thermal Probes

A. Hammiche; M. Reading; D. Grandy; D. Price; M. German; L. Bozec; J. M. R. Weaver; P. Stopford; G. Mills; H. M. Pollock

AIP Conf. Proc. 696, 369–376 (2003) https://doi.org/10.1063/1.1639720

Abstract

View articletitled, A High Resolution Multiple Analysis Approach Using Near‐Field Thermal Probes

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Tuning the Tip‐Sample Forces in Dynamic Atomic Force Microscopy

Robert W. Stark; Georg Schitter; Andreas Stemmer

AIP Conf. Proc. 696, 377–384 (2003) https://doi.org/10.1063/1.1639721

Abstract

View articletitled, Tuning the Tip‐Sample Forces in Dynamic Atomic Force Microscopy

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Marking the Difference: Interferometric Detection vs Optical Beam Deflection in AFM

M. Stark; B. N. Bercu; F. Marchi; J. Chevrier; S. Huant

AIP Conf. Proc. 696, 385–391 (2003) https://doi.org/10.1063/1.1639722

Abstract

View articletitled, Marking the Difference: Interferometric Detection vs Optical Beam Deflection in AFM

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Effect of Probe Quality Factor on the Sensitivity of Variable Temperature Magnetic Force Microscopy

Fergal D. Callaghan; Xi Yu; Christopher J. Mellor

AIP Conf. Proc. 696, 392–395 (2003) https://doi.org/10.1063/1.1639723

Abstract

View articletitled, Effect of Probe Quality Factor on the Sensitivity of Variable Temperature Magnetic Force Microscopy

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Detecting Fluorescence of Protein Molecules Picked up at the Tip of AFM Probe

Hideo Arakawa; Takafumi Yamada; Toshiya Osada; Atsushi Ikai

AIP Conf. Proc. 696, 396–400 (2003) https://doi.org/10.1063/1.1639724

Abstract

View articletitled, Detecting Fluorescence of Protein Molecules Picked up at the Tip of AFM Probe

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Investigation of Enzyme Activities of the Enzyme Immobilized on an AFM Tip

Seiji Takeda; Chikashi Nakamura; Masami Kageshima; Hiroshi Tokumoto; Jun Miyake

AIP Conf. Proc. 696, 401–404 (2003) https://doi.org/10.1063/1.1639725

Abstract

View articletitled, Investigation of Enzyme Activities of the Enzyme Immobilized on an AFM Tip

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Atomic Force Microscopy as a Tool for Applied Virology and Microbiology

Boris Zaitsev

AIP Conf. Proc. 696, 405–410 (2003) https://doi.org/10.1063/1.1639726

Abstract

View articletitled, Atomic Force Microscopy as a Tool for Applied Virology and Microbiology

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Conductive AFM as Nano Tester for DNA Molecules

Dmitry V. Klinov; Alik Y. Kasumov; Victor V. Demin

AIP Conf. Proc. 696, 411–415 (2003) https://doi.org/10.1063/1.1639727

Abstract

View articletitled, Conductive AFM as Nano Tester for DNA Molecules

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Temperature Dependent AFM of Single Lipid and Mixed Lipid‐Peptide Bilayers

F. Yarrow; J. P. J. M. van der Eerden; M. M. E. Snel

AIP Conf. Proc. 696, 416–421 (2003) https://doi.org/10.1063/1.1639728

Abstract

View articletitled, Temperature Dependent AFM of Single Lipid and Mixed Lipid‐Peptide Bilayers

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Different Membrane Modifications Revealed by AFM/LFM After Doping of Pancreatic Cells With Cd, Zn or Pb

A. Cricenti; M. Girasole; R. Generosi; S. Cotesta; A. Congiu Castellano

AIP Conf. Proc. 696, 422–427 (2003) https://doi.org/10.1063/1.1639729

Abstract

View articletitled, Different Membrane Modifications Revealed by AFM/LFM After Doping of Pancreatic Cells With Cd, Zn or Pb

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Atomic Force Microscopy for Investigation of Ribosome‐inactivating Proteins’ Type II Tetramerization

M. Savvateev; N. Kozlovskaya; M. Moisenovich; A. Tonevitsky; I. Agapov; N. Maluchenko; V. Bykov; M. Kirpichnikov

AIP Conf. Proc. 696, 428–432 (2003) https://doi.org/10.1063/1.1639730

Abstract

View articletitled, Atomic Force Microscopy for Investigation of Ribosome‐inactivating Proteins’ Type II Tetramerization

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In‐Situ Observation of Freeze Fractured and Deep Etched Red Blood Cells with a High‐Vacuum Low‐Temperature Atomic Force Microscope

Keiichi Nakamoto; Charles B. Mooney; Shin‐ichi Kitamura; Masaru Date

AIP Conf. Proc. 696, 433–437 (2003) https://doi.org/10.1063/1.1639731

Abstract

View articletitled, In‐Situ Observation of Freeze Fractured and Deep Etched Red Blood Cells with a High‐Vacuum Low‐Temperature Atomic Force Microscope

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Force Analyses of the Interaction between the Surface of a Living Cell and Modified AFM Probes

Ikuo Obataya; Han Sunwoong; Chikashi Nakamura; Noriyuki Nakamura; Jun Miyake

AIP Conf. Proc. 696, 438–441 (2003) https://doi.org/10.1063/1.1639732

Abstract

View articletitled, Force Analyses of the Interaction between the Surface of a Living Cell and Modified AFM Probes

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Development of a Gene Transfer Technique Using AFM

S. Han; C. Nakamura; I. Obataya; S. Takeda; M. Kageshima; N. Nakamura; H. Tokumoto; J. Miyake

AIP Conf. Proc. 696, 442–446 (2003) https://doi.org/10.1063/1.1639733

Abstract

View articletitled, Development of a Gene Transfer Technique Using AFM

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Tip‐Induced Artifacts Associated with the AFM Imaging of Lipid Vesicles

Michael Zäch; Bengt Kasemo

AIP Conf. Proc. 696, 447–451 (2003) https://doi.org/10.1063/1.1639734

Abstract

View articletitled, Tip‐Induced Artifacts Associated with the AFM Imaging of Lipid Vesicles

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Scanning Probe Microscopy of DNA on Mica and Graphite

D. V. Klinov; E. V. Dubrovin; I. V. Yaminsky

AIP Conf. Proc. 696, 452–456 (2003) https://doi.org/10.1063/1.1639735

Abstract

View articletitled, Scanning Probe Microscopy of DNA on Mica and Graphite

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Self‐Assembly of Epicuticular Waxes on Living Plant Surfaces by Atomic Force Microscopy

Kerstin Koch; Aarnoud Dommisse; Christoph Neinhuis; Wilhelm Barthlott

AIP Conf. Proc. 696, 457–460 (2003) https://doi.org/10.1063/1.1639736

Abstract

View articletitled, Self‐Assembly of Epicuticular Waxes on Living Plant Surfaces by Atomic Force Microscopy

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Importance of Substrate for Biological Imaging by AFM at Low Temperature

E. Bystrenova; A. Radenovic; L. Libioulle; G. Dietler

AIP Conf. Proc. 696, 461–466 (2003) https://doi.org/10.1063/1.1639737

Abstract

View articletitled, Importance of Substrate for Biological Imaging by AFM at Low Temperature

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Low Roughness Values of RBCs Membrane in Cells with Cytoskeleton Alterations

M. Girasole; A. Cricenti; A. Congiu‐Castellano; S. Fenu; F. Mancini; F. Mandelli; G. Boumis; G. Amiconi

AIP Conf. Proc. 696, 467–473 (2003) https://doi.org/10.1063/1.1639738

Abstract

View articletitled, Low Roughness Values of RBCs Membrane in Cells with Cytoskeleton Alterations

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Measurement of the Physical and Chemical Properties of Hybrid Lipid Membranes with the Atomic Force Microscope

Jin‐Won Park; Gil U. Lee

AIP Conf. Proc. 696, 474–481 (2003) https://doi.org/10.1063/1.1639739

Abstract

View articletitled, Measurement of the Physical and Chemical Properties of Hybrid Lipid Membranes with the Atomic Force Microscope

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DNA and Other Thread‐like Objects SPM Image Recognition and Automatic Length Calculation by Means of Stochastic Geometry

A. D. Volkov; N. G. Fedotov; A. V. Roy; L. A. Shulga

AIP Conf. Proc. 696, 482–488 (2003) https://doi.org/10.1063/1.1639740

Abstract

View articletitled, DNA and Other Thread‐like Objects SPM Image Recognition and Automatic Length Calculation by Means of Stochastic Geometry

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Scanning Tunnelling Microscopy and Spectroscopy on Alkali Doped Copper Phthalocyanine

M. F. Craciun; S. Rogge; D. A. Wismeijer; M. J. L. den Boer; T. M. Klapwijk; A. F. Morpurgo

AIP Conf. Proc. 696, 489–493 (2003) https://doi.org/10.1063/1.1639741

Abstract

View articletitled, Scanning Tunnelling Microscopy and Spectroscopy on Alkali Doped Copper Phthalocyanine

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A Study of Alkanedithiol Films on Au(111) by STM‐induced Luminescence

R. Nishitani; Y. Tateishi; H. Arakawa; A. Kasuya; K. Sumiyama

AIP Conf. Proc. 696, 494–501 (2003) https://doi.org/10.1063/1.1639742

Abstract

View articletitled, A Study of Alkanedithiol Films on Au(111) by STM‐induced Luminescence

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In Situ EC‐AFM Observation on Pb Electrodes in Sulfuric Acid Solution with or without Lignin

Daiji Tabayashi; Nobumitsu Hirai; Masashi Shiota; Toshihiro Tanaka

AIP Conf. Proc. 696, 502–507 (2003) https://doi.org/10.1063/1.1639743

Abstract

View articletitled, In Situ EC‐AFM Observation on Pb Electrodes in Sulfuric Acid Solution with or without Lignin

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STM Studies on Nanosized Porphyrin Wheels at the Solid‐Liquid Interface

Johannes A. A. W. Elemans; Marga C. Lensen; Sandra J. T. van Dingenen; Jan W. Gerritsen; Herman van Kempen; Roeland J. M. Nolte; Alan E. Rowan; Sylvia Speller

AIP Conf. Proc. 696, 508–512 (2003) https://doi.org/10.1063/1.1639744

Abstract

View articletitled, STM Studies on Nanosized Porphyrin Wheels at the Solid‐Liquid Interface

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Structure and Ordering of a Molecule Layer with Adsorbate‐Induced Reconstruction: C₆₀/Ag(100)

Woei Wu Pai; Ching‐Ling Hsu; L. Y. Sin; T. B. Tang; K. C. Lin

AIP Conf. Proc. 696, 513–520 (2003) https://doi.org/10.1063/1.1639745

Abstract

View articletitled, Structure and Ordering of a Molecule Layer with Adsorbate‐Induced Reconstruction: C60/Ag(100)

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Growth of Organic Molecules on Ferromagnetic Metallic Substrates — A Combined STM/AFM Study

M. V. Tiba; O. Kurnosikov; C. F. J. Flipse; H. J. M. Swagten; J. T. Kohlhepp; R. A. J. Janssen; P. M. Koenraad; W. J. M. de Jonge; B. Koopmans

AIP Conf. Proc. 696, 521–528 (2003) https://doi.org/10.1063/1.1639746

Abstract

View articletitled, Growth of Organic Molecules on Ferromagnetic Metallic Substrates — A Combined STM/AFM Study

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The AFM Observation of Single Polyethylene Molecules in Coiled State on Mica

V. V. Prokhorov; I. V. Yaminsky

AIP Conf. Proc. 696, 529–536 (2003) https://doi.org/10.1063/1.1639747

Abstract

View articletitled, The AFM Observation of Single Polyethylene Molecules in Coiled State on Mica

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Stability of the Self‐Organized Two‐Dimensional Structures of Porphyrin and Phthalocyanine Derivatives on Graphite for the Directed Arrangement of Rotaxanes

Koji Miyake; Taichi Ikeda; Masumi Asakawa; Toshimi Shimizu; Takao Ishida; Shinya Sasaki

AIP Conf. Proc. 696, 537–544 (2003) https://doi.org/10.1063/1.1639748

Abstract

View articletitled, Stability of the Self‐Organized Two‐Dimensional Structures of Porphyrin and Phthalocyanine Derivatives on Graphite for the Directed Arrangement of Rotaxanes

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Theoretical Predictions of Transport Properties of Oligoporphyrin Molecular Bridges

K. Tagami; M. Tsukada

AIP Conf. Proc. 696, 545–549 (2003) https://doi.org/10.1063/1.1639749

Abstract

View articletitled, Theoretical Predictions of Transport Properties of Oligoporphyrin Molecular Bridges

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Nanopatterning on Flat Surfaces by AFM Tip

D. V. Sheglov; A. V. Latyshev; A. L. Aseev

AIP Conf. Proc. 696, 550–555 (2003) https://doi.org/10.1063/1.1639750

Abstract

View articletitled, Nanopatterning on Flat Surfaces by AFM Tip

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Tunneling Currents through a Single Molecule Isolated in a New Matrix

S. Wakamatsu; S. Fujii; U. Akiba; M. Fujihira

AIP Conf. Proc. 696, 556–563 (2003) https://doi.org/10.1063/1.1639751

Abstract

View articletitled, Tunneling Currents through a Single Molecule Isolated in a New Matrix

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Atomic Scale Simulations of Silicon Nanotubes under Axial Compression: AFM Application

Ki Ryang Byun; Jeong Won Kang; Ki Oh Song; Ho Jung Hwang

AIP Conf. Proc. 696, 564–571 (2003) https://doi.org/10.1063/1.1639752

Abstract

View articletitled, Atomic Scale Simulations of Silicon Nanotubes under Axial Compression: AFM Application

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Measurements of Electrical Conductivity of a Nanometer‐Scale Water Meniscus by Atomic Force Microscopy

Cristina Martín; Francesc Pérez‐Murano

AIP Conf. Proc. 696, 572–579 (2003) https://doi.org/10.1063/1.1639753

Abstract

View articletitled, Measurements of Electrical Conductivity of a Nanometer‐Scale Water Meniscus by Atomic Force Microscopy

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SPM Probing of Interfacial Strengths of Individual Carbon Nanotubes in a Polymer Matrix

Asa H. Barber; Carole A. Cooper; Sidney R. Cohen; H. Daniel Wagner

AIP Conf. Proc. 696, 580–587 (2003) https://doi.org/10.1063/1.1639754

Abstract

View articletitled, SPM Probing of Interfacial Strengths of Individual Carbon Nanotubes in a Polymer Matrix

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A Study of Nanocontact Printing Using Adhesive Force Mapping

Fuminobu Sato; Masamichi Fujihira

AIP Conf. Proc. 696, 588–593 (2003) https://doi.org/10.1063/1.1639755

Abstract

View articletitled, A Study of Nanocontact Printing Using Adhesive Force Mapping

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The Factors Influence Investigation on a Tip‐induced Oxidation Process and Its Applications for Nanoscale Image Creation

S. Lemeshko; V. Bykov; S. Gavrilov; V. Roschin; S. Saunin; V. Shevyakov

AIP Conf. Proc. 696, 594–601 (2003) https://doi.org/10.1063/1.1639756

Abstract

View articletitled, The Factors Influence Investigation on a Tip‐induced Oxidation Process and Its Applications for Nanoscale Image Creation

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STM at the Liquid/Solid and Air/Solid Interface: Exploring 2D Phase‐Behavior, Templating, and Tip‐Induced Reactivity

S. De Feyter; M. M. Abdel‐Mottaleb; M. Miura; H. Uji‐i; W. Mamdouh; M. Zdanowska; F. C. De Schryver

AIP Conf. Proc. 696, 602–607 (2003) https://doi.org/10.1063/1.1639757

Abstract

View articletitled, STM at the Liquid/Solid and Air/Solid Interface: Exploring 2D Phase‐Behavior, Templating, and Tip‐Induced Reactivity

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Data Evaluation for Spin‐Polarized Scanning Tunneling Spectroscopy Measurements

T. K. Yamada; A. L. Vázquez de Parga; M. M. J. Bischoff; T. Mizoguchi; H. van Kempen

AIP Conf. Proc. 696, 608–614 (2003) https://doi.org/10.1063/1.1639758

Abstract

View articletitled, Data Evaluation for Spin‐Polarized Scanning Tunneling Spectroscopy Measurements

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Noise Spectroscopy of a Single Spin with Spin Polarized STM

Z. Nussinov; M. F. Crommie; A. V. Balatsky

AIP Conf. Proc. 696, 615–622 (2003) https://doi.org/10.1063/1.1639759

Abstract

View articletitled, Noise Spectroscopy of a Single Spin with Spin Polarized STM

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MFM Study of Locally Modified Interlayer Exchange Coupling in Fe/Cr/Fe Trilayers

V. E. Demidov; D. I. Kholin; S. O. Demokritov; B. Hillebrands; F. Wegelin; J. Marien; A. M. Alexeev; A. E. Efimov

AIP Conf. Proc. 696, 623–628 (2003) https://doi.org/10.1063/1.1639760

Abstract

View articletitled, MFM Study of Locally Modified Interlayer Exchange Coupling in Fe/Cr/Fe Trilayers

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Surface Morphology and Magnetic Anisotropy

R. A. Lukaszew; Z. Zhang; V. Stoica; R. Clarke

AIP Conf. Proc. 696, 629–633 (2003) https://doi.org/10.1063/1.1639761

Abstract

View articletitled, Surface Morphology and Magnetic Anisotropy

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The Computer Analysis of MFM Images of Separate Ferromagnetic Nanoparticles

D. V. Ovchinnikov; A. A. Bukharaev

AIP Conf. Proc. 696, 634–641 (2003) https://doi.org/10.1063/1.1639762

Abstract

View articletitled, The Computer Analysis of MFM Images of Separate Ferromagnetic Nanoparticles

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Enhancement of Superconductivity in a Nanosized Bridge Formed by an STM Tip

V. R. Misko; V. M. Fomin; J. T. Devreese

AIP Conf. Proc. 696, 642–649 (2003) https://doi.org/10.1063/1.1639763

Abstract

View articletitled, Enhancement of Superconductivity in a Nanosized Bridge Formed by an STM Tip

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Imaging of the (Mn²⁺3d⁵ + Hole) Complex in GaAs by Cross‐Sectional Scanning Tunneling Microscopy

A. M. Yakunin; A. Yu. Silov; P. M. Koenraad; W. Van Roy; J. De Boeck; J. H. Wolter

AIP Conf. Proc. 696, 650–655 (2003) https://doi.org/10.1063/1.1639764

Abstract

View articletitled, Imaging of the (Mn2+3d5 + Hole) Complex in GaAs by Cross‐Sectional Scanning Tunneling Microscopy

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STM‐BH Imaging of Subsurface Dopant Atoms on Hydrogen‐Terminated Si(111)

Shu Kurokawa; Tomohiro Takei; Akira Sakai

AIP Conf. Proc. 696, 656–662 (2003) https://doi.org/10.1063/1.1639765

Abstract

View articletitled, STM‐BH Imaging of Subsurface Dopant Atoms on Hydrogen‐Terminated Si(111)

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Novel C Induced Structures on Si(111)

M. Flores; P. Häberle

AIP Conf. Proc. 696, 663–668 (2003) https://doi.org/10.1063/1.1639766

Abstract

View articletitled, Novel C Induced Structures on Si(111)

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Scanning Probe Microscopies for the Electrical Characterization of GaAs pn Junctions

N. Barreau; O. Douhéret; S. Sadewasser; Th. Glatzel; H. Steigert; K. Maknys; S. Anand; M. Ch. Lux‐Steiner

AIP Conf. Proc. 696, 669–676 (2003) https://doi.org/10.1063/1.1639767

Abstract

View articletitled, Scanning Probe Microscopies for the Electrical Characterization of GaAs pn Junctions

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Digital Alloy InGaAs/InAlAs Laser Structures Studied by Cross‐Sectional Scanning Tunneling Micropscopy

P. Offermans; P. M. Koenraad; J. H. Wolter; J. D. Song; Jong Min Kim; Seong Ju Bae; Yong Tak Lee; M. Beck; T. Aellen; J. Faist

AIP Conf. Proc. 696, 677–684 (2003) https://doi.org/10.1063/1.1639768

Abstract

View articletitled, Digital Alloy InGaAs/InAlAs Laser Structures Studied by Cross‐Sectional Scanning Tunneling Micropscopy

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Carriers In 2D‐Semiconductor Structures: A Scanning Capacitance Microscopy Study

S. Anand; K. Maknys; O. Douhéret

AIP Conf. Proc. 696, 685–690 (2003) https://doi.org/10.1063/1.1639769

Abstract

View articletitled, Carriers In 2D‐Semiconductor Structures: A Scanning Capacitance Microscopy Study

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Determination of Electron Transport Parameters in Al_0.3Ga_0.7As by Scanning‐Tunneling‐Microscope Light‐Emission Spectroscopy

Hidenori Hashimoto; Tohru Tsuruoka; Yoshitsugu Ohizumi; Ryuichi Arafune; Sukekatsu Ushioda

AIP Conf. Proc. 696, 691–698 (2003) https://doi.org/10.1063/1.1639770

Abstract

View articletitled, Determination of Electron Transport Parameters in Al0.3Ga0.7As by Scanning‐Tunneling‐Microscope Light‐Emission Spectroscopy

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Room‐Temperature Observation of Standing Electron Waves on GaAs(110) at Surface Steps

O. Flebbe; H. Eisele; R. Timm; M. Dähne

AIP Conf. Proc. 696, 699–706 (2003) https://doi.org/10.1063/1.1639771

Abstract

View articletitled, Room‐Temperature Observation of Standing Electron Waves on GaAs(110) at Surface Steps

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Simulation of XSTS Imaging of Self‐Assembled Quantum Dot Electronic States

Mervyn Roy; P. A. Maksym; D. M. Bruls; P. Offermans; P. M. Koenraad

AIP Conf. Proc. 696, 707–714 (2003) https://doi.org/10.1063/1.1639772

Abstract

View articletitled, Simulation of XSTS Imaging of Self‐Assembled Quantum Dot Electronic States

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New Structural Model of the Si(112)6 × 1‐Ga Interface

P. C. Snijders; C. González; M. C. Falub; S. Rogge; J. Ortega; F. Flores; H. H. Weitering

AIP Conf. Proc. 696, 715–719 (2003) https://doi.org/10.1063/1.1639773

Abstract

View articletitled, New Structural Model of the Si(112)6 × 1‐Ga Interface

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Charge Storage in SiO₂ Layers with Embedded Nanoclusters Studied by Scanning Capacitance Microscopy

E. Beyreuther; R. Beyer; J. von Borany; J. Weber

AIP Conf. Proc. 696, 720–727 (2003) https://doi.org/10.1063/1.1639774

Abstract

View articletitled, Charge Storage in SiO2 Layers with Embedded Nanoclusters Studied by Scanning Capacitance Microscopy

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Electronic States Origin of Electrochemical Capacitances of Nanostructures

N. Nakaoka; S. Yaginuma; K. Watanabe

AIP Conf. Proc. 696, 728–733 (2003) https://doi.org/10.1063/1.1639775

Abstract

View articletitled, Electronic States Origin of Electrochemical Capacitances of Nanostructures

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The Hidden Properties of the Au(100) Surface

Emile D. L. Rienks; Gilbert P. van Berkel; Johan W. Bakker; Bernard. E. Nieuwenhuys

AIP Conf. Proc. 696, 734–737 (2003) https://doi.org/10.1063/1.1639776

Abstract

View articletitled, The Hidden Properties of the Au(100) Surface

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The Origin of the Structural Phase Transition in the Growth of Ultra‐Thin Bi Films on Si(111)

Jerzy T. Sadowski; Tadaaki Nagao; Mineo Saito; Shin Yaginuma; Yasunori Fujikawa; Gayle E. Thayer; Rudolf M. Tromp; Kazuo Nakajima; Gen Sazaki; Takahisa Ohno; Toshio Sakurai

AIP Conf. Proc. 696, 738–744 (2003) https://doi.org/10.1063/1.1639777

Abstract

View articletitled, The Origin of the Structural Phase Transition in the Growth of Ultra‐Thin Bi Films on Si(111)

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Surface Localization of Alloy Phases Using Electrostatic Force Microscopy

K. Unal; Y. Mugnier; B. O. Aronsson; P. Descouts

AIP Conf. Proc. 696, 745–751 (2003) https://doi.org/10.1063/1.1639778

Abstract

View articletitled, Surface Localization of Alloy Phases Using Electrostatic Force Microscopy

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Theoretical Analysis of the Bias Voltage Dependence of Apparent Barrier Height

H. Totsuka; Y. Gohda; S. Furuya; S. Watanabe

AIP Conf. Proc. 696, 752–759 (2003) https://doi.org/10.1063/1.1639779

Abstract

View articletitled, Theoretical Analysis of the Bias Voltage Dependence of Apparent Barrier Height

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Scanning Tunneling Microscope Study of Structural Transformations on One Monolayer Pb/Si(111)

Ing‐Souh Hwang; Shih‐Hsin Chang; Chung‐Kai Fang; Tien T. Tsong; Lih‐Juann Chen

AIP Conf. Proc. 696, 760–767 (2003) https://doi.org/10.1063/1.1639780

Abstract

View articletitled, Scanning Tunneling Microscope Study of Structural Transformations on One Monolayer Pb/Si(111)

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Forces and Currents between Two Metal Surfaces

A. García‐Lekue; W. A. Hofer; A. J. Fisher

AIP Conf. Proc. 696, 768–774 (2003) https://doi.org/10.1063/1.1639781

Abstract

View articletitled, Forces and Currents between Two Metal Surfaces

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STM Studies of Self‐Organization of Ge Nanoislands and Nanostrips before Formation Wetting Layer on Si(111) Surfaces

S. A. Teys; K. N. Romanyuk; A. B. Talochkin; B. Z. Olshanetsky

AIP Conf. Proc. 696, 775–782 (2003) https://doi.org/10.1063/1.1639782

Abstract

View articletitled, STM Studies of Self‐Organization of Ge Nanoislands and Nanostrips before Formation Wetting Layer on Si(111) Surfaces

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Studies of the Facetting of the Polished (100) Face of CaF₂

H. Dabringhaus; M. Schick; K. Wandelt; V. Deuster; Th. Kayser; H. Klapper

AIP Conf. Proc. 696, 783–790 (2003) https://doi.org/10.1063/1.1639783

Abstract

View articletitled, Studies of the Facetting of the Polished (100) Face of CaF2

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A Study of Polycrystalline W Surface with STM/STS

D. Okuyama; Y. Ishii; T. K. Yamada; H. van Kempen; T. Mizoguchi

AIP Conf. Proc. 696, 791–794 (2003) https://doi.org/10.1063/1.1639784

Abstract

View articletitled, A Study of Polycrystalline W Surface with STM/STS

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Energy‐Level Splitting of Ligand‐Stabilized Au₅₅ Clusters Observed by Low‐Temperature Scanning Tunneling Spectroscopy

Huijing Zhang; Holger Grzeschik; Pranab Sarkar; Michael Springborg; Uwe Hartmann

AIP Conf. Proc. 696, 795–801 (2003) https://doi.org/10.1063/1.1639785

Abstract

View articletitled, Energy‐Level Splitting of Ligand‐Stabilized Au55 Clusters Observed by Low‐Temperature Scanning Tunneling Spectroscopy

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Correlation between Photoactivity and STM Topographic Parameters of TiO₂ Polycrystalline Film

Alberto Pasquini; Gian Bartolo Picotto; Marco Pisani; Valter Maurino; Claudio Minero

AIP Conf. Proc. 696, 802–809 (2003) https://doi.org/10.1063/1.1639786

Abstract

View articletitled, Correlation between Photoactivity and STM Topographic Parameters of TiO2 Polycrystalline Film

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In Situ‐STM of Growth, Atomic and Electronic Structure of Thin NiO Films on Ag(001) at Elevated Temperatures (350 – 475 K)

Ch. Hagendorf; R. Shantyr; H. Neddermeyer

AIP Conf. Proc. 696, 810–817 (2003) https://doi.org/10.1063/1.1639787

Abstract

View articletitled, In Situ‐STM of Growth, Atomic and Electronic Structure of Thin NiO Films on Ag(001) at Elevated Temperatures (350 – 475 K)

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The Influences of Tip Scan and Tunneling Current by Adsorbing Kr on a Si (111)‐7×7 Surface at Low Temperature

Y. J. Li; O. Takeuchi; D. N. Futaba; K. Miyake; H. Shigekawa; Y. Kuk; M. Komiyama; T. Urisu

AIP Conf. Proc. 696, 818–822 (2003) https://doi.org/10.1063/1.1639788

Abstract

View articletitled, The Influences of Tip Scan and Tunneling Current by Adsorbing Kr on a Si (111)‐7×7 Surface at Low Temperature

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Gold Nanoparticles on Al₂O₃/Nb(110): An STM Study of Dynamic Charging Effects at Room Temperature

Ch. Dietrich; B. Koslowski

AIP Conf. Proc. 696, 823–828 (2003) https://doi.org/10.1063/1.1639789

Abstract

View articletitled, Gold Nanoparticles on Al2O3/Nb(110): An STM Study of Dynamic Charging Effects at Room Temperature

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Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot‐Electron Lifetimes in Metals

P. F. de Pablos; P. L. de Andres; F. Ladstädter; U. Hohenester; P. Puschnig; C. Ambrosch‐Draxl; F. J. García‐Vidal; F. Flores

AIP Conf. Proc. 696, 829–836 (2003) https://doi.org/10.1063/1.1639790

Abstract

View articletitled, Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot‐Electron Lifetimes in Metals

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An STM Study of the 2×7 Dysprosium‐Silicide Nanowire Superstructure on Si(001)

C. Preinesberger; S. K. Becker; M. Dähne

AIP Conf. Proc. 696, 837–844 (2003) https://doi.org/10.1063/1.1639791

Abstract

View articletitled, An STM Study of the 2×7 Dysprosium‐Silicide Nanowire Superstructure on Si(001)

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Co Growth on Ag/Cu Striped Nanostructures

J. Cordón; J. E. Ortega

AIP Conf. Proc. 696, 845–852 (2003) https://doi.org/10.1063/1.1639792

Abstract

View articletitled, Co Growth on Ag/Cu Striped Nanostructures

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VT STM Investigations of Ag Film Growth on Bi₂Te₃

R. Czajka; S. Suto; S. Winiarz; J. Vaniś; J. Walachová; A. Shiwa; H. Nagashima; S. Szuba; A. Kasuya

AIP Conf. Proc. 696, 853–858 (2003) https://doi.org/10.1063/1.1639793

Abstract

View articletitled, VT STM Investigations of Ag Film Growth on Bi2Te3

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Identification of Individual Iron Atoms within a Permalloy Surface: Surface State Dispersion

M. Dreyer; H. Pandana; R. D. Gomez

AIP Conf. Proc. 696, 859–864 (2003) https://doi.org/10.1063/1.1639794

Abstract

View articletitled, Identification of Individual Iron Atoms within a Permalloy Surface: Surface State Dispersion

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Polaronic Superlattice Formed on Oxidised Magnetite (111) Surface

N. Berdunov; G. Mariotto; S. Murphy; S. F. Ceballos; K. Jordan; I. V. Shvets

AIP Conf. Proc. 696, 865–872 (2003) https://doi.org/10.1063/1.1639795

Abstract

View articletitled, Polaronic Superlattice Formed on Oxidised Magnetite (111) Surface

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Charge Ordering on the (√ × √)R45° Reconstructed Fe₃O₄ (001) Surface

G. Mariotto; K. Jordan; S. F. Ceballos; S. Murphy; N. Berdunov; I. V. Shvets

AIP Conf. Proc. 696, 873–878 (2003) https://doi.org/10.1063/1.1639796

Abstract

View articletitled, Charge Ordering on the (√ × √)R45° Reconstructed Fe3O4 (001) Surface

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Contaminants Induced Onset of Nanostripes and Nanotrenches on the Fe₃O₄ (001) Surface

S. F. Ceballos; G. Mariotto; K. Jordan; S. Murphy; C. Seoighe; I. V. Shvets

AIP Conf. Proc. 696, 879–887 (2003) https://doi.org/10.1063/1.1639797

Abstract

View articletitled, Contaminants Induced Onset of Nanostripes and Nanotrenches on the Fe3O4 (001) Surface

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STM/STS Observations of Atomic Impurities in High‐T_c Superconductor Bi₂Sr₂CaCu₂O_y Single Crystals

G. Kinoda; H. Mashima; S. Nakao; K. Shimizu; J. Shimoyama; K. Kishio; T. Hanaguri; K. Kitazawa; T. Hasegawa

AIP Conf. Proc. 696, 888–893 (2003) https://doi.org/10.1063/1.1639798

Abstract

View articletitled, STM/STS Observations of Atomic Impurities in High‐Tc Superconductor Bi2Sr2CaCu2Oy Single Crystals

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Inhomogeneity of Tunneling Spectroscopy of Bi₂Sr₂CaCu₂O_8+δ

Z. Z. Wang; J. C. Girard; P. S. Luo; F. Rullier‐Albenque; H. Alloul

AIP Conf. Proc. 696, 894–898 (2003) https://doi.org/10.1063/1.1639799

Abstract

View articletitled, Inhomogeneity of Tunneling Spectroscopy of Bi2Sr2CaCu2O8+δ

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Damping Contribution in the Interaction between Probe and Ligand‐Stabilized Clusters in NC‐AFM

G. Radu; U. Hartmann

AIP Conf. Proc. 696, 899–905 (2003) https://doi.org/10.1063/1.1639800

Abstract

View articletitled, Damping Contribution in the Interaction between Probe and Ligand‐Stabilized Clusters in NC‐AFM

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Polarization Properties Of Fully Metal Coated Scanning Near‐Field Optical Microscopy Probes

Laure Aeschimann; Luciana Vaccaro; Terunobu Akiyama; Urs Staufer; Nicolaas F. De Rooij; Rolf Eckert; Harry Heinzelmann

AIP Conf. Proc. 696, 906–910 (2003) https://doi.org/10.1063/1.1639801

Abstract

View articletitled, Polarization Properties Of Fully Metal Coated Scanning Near‐Field Optical Microscopy Probes

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Light Emission Intensity Imaging of Individual InAs/AlGaAs Quantum Dots Using Scanning Tunneling Microscope

Tohru Tsuruoka; Yoshitsugu Ohizumi; Ryuichi Arafune; Sukekatsu Ushioda

AIP Conf. Proc. 696, 911–918 (2003) https://doi.org/10.1063/1.1639802

Abstract

View articletitled, Light Emission Intensity Imaging of Individual InAs/AlGaAs Quantum Dots Using Scanning Tunneling Microscope

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Electroluminescence Spectra of an STM‐Tip‐Induced Quantum Dot

M. D. Croitoru; V. N. Gladilin; V. M. Fomin; J. T. Devreese; M. Kemerink; P. M. Koenraad; K. Sauthoff; J. H. Wolter

AIP Conf. Proc. 696, 919–926 (2003) https://doi.org/10.1063/1.1639803

Abstract

View articletitled, Electroluminescence Spectra of an STM‐Tip‐Induced Quantum Dot

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STM‐Induced Luminescence Spectra from Au(111) with STM Tips of Pt‐Ir Alloys

R. Nishitani; Y. Tateishi; H. Arakawa; A. Kasuya; K. Sumiyama

AIP Conf. Proc. 696, 927–933 (2003) https://doi.org/10.1063/1.1639804

Abstract

View articletitled, STM‐Induced Luminescence Spectra from Au(111) with STM Tips of Pt‐Ir Alloys

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First‐Principles Theory for Quantum Transport and Field Emission of Nanostructures

Kenji Hirose; Nobuhiko Kobayashi; Masaru Tsukada

AIP Conf. Proc. 696, 934–941 (2003) https://doi.org/10.1063/1.1639805

Abstract

View articletitled, First‐Principles Theory for Quantum Transport and Field Emission of Nanostructures

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First‐Principles Calculation of Electron Emission from Atoms Adsorbed on Metallic Electrode

Nobuhiko Kobayashi; Kenji Hirose; Masaru Tsukada

AIP Conf. Proc. 696, 942–946 (2003) https://doi.org/10.1063/1.1639806

Abstract

View articletitled, First‐Principles Calculation of Electron Emission from Atoms Adsorbed on Metallic Electrode

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A Theoretical Analysis of Scanning Capacitance Microscopy

A. Shik; H. E. Ruda

AIP Conf. Proc. 696, 947–954 (2003) https://doi.org/10.1063/1.1639807

Abstract

View articletitled, A Theoretical Analysis of Scanning Capacitance Microscopy

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Nonlinear analysis of Electrostatic Force Microscopy

R. Dianoux; F. Martins; F. Marchi; C. Alandi; F. Comin; J. Chevrier

AIP Conf. Proc. 696, 955–962 (2003) https://doi.org/10.1063/1.1639808

Abstract

View articletitled, Nonlinear analysis of Electrostatic Force Microscopy

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Dynamic Image Forces near Semiconductor‐Vacuum Interfaces: Role of Quantum‐Mechanical Corrections

A. M. Gabovich; V. M. Rozenbaum; A. I. Voitenko

AIP Conf. Proc. 696, 963–970 (2003) https://doi.org/10.1063/1.1639809

Abstract

View articletitled, Dynamic Image Forces near Semiconductor‐Vacuum Interfaces: Role of Quantum‐Mechanical Corrections

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Selective resonance‐tunneling microscopy

I. Onosov; V. Vysotskii

AIP Conf. Proc. 696, 971–978 (2003) https://doi.org/10.1063/1.1639810

Abstract

View articletitled, Selective resonance‐tunneling microscopy

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Symmetry‐Break‐Induced Variation Of Energy‐Level Degeneracy Observed On Individual Molecules By Low‐Temperature STM

D. Mautes; H. Zhang; U. Hartmann

AIP Conf. Proc. 696, 979–984 (2003) https://doi.org/10.1063/1.1639811

Abstract

View articletitled, Symmetry‐Break‐Induced Variation Of Energy‐Level Degeneracy Observed On Individual Molecules By Low‐Temperature STM

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