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PRELIMINARY
Preface: SiliconPV 2019, The 9th International Conference on Crystalline Silicon Photovoltaics
AIP Conf. Proc. 2147, 010001 (2019)
https://doi.org/10.1063/1.5123805
ADVANCED CHARACTERIZATION AND SIMULATION
Dependence of coil sensitivity on sample thickness in inductively coupled photoconductance measurements
AIP Conf. Proc. 2147, 020002 (2019)
https://doi.org/10.1063/1.5123807
GD-OES depth profiling and calibration of B doped dielectric layers
AIP Conf. Proc. 2147, 020003 (2019)
https://doi.org/10.1063/1.5123808
An advanced LED-based setup enabling characterization of full-size modules at different temperatures and spectra
AIP Conf. Proc. 2147, 020004 (2019)
https://doi.org/10.1063/1.5123809
Impact of non-uniform carrier density on the determination of metal induced recombination losses
AIP Conf. Proc. 2147, 020005 (2019)
https://doi.org/10.1063/1.5123810
Accurate contact and contactless methods for emitter sheet resistance testing of PV wafers
AIP Conf. Proc. 2147, 020006 (2019)
https://doi.org/10.1063/1.5123811
Study of changes in PL spectrum from defects in PERC solar cells with respect to LeTID
AIP Conf. Proc. 2147, 020008 (2019)
https://doi.org/10.1063/1.5123813
On the effects of the asymptotic behavior of local ideality factor for a two-diode model in silicon solar cells
Alona Otaegi; Vanesa Fano; Nekane Azkona; Eneko Cereceda; Lourdes Pérez; Pedro Rodríguez; Federico Recart; José Rubén Gutiérrez; Juan Carlos Jimeno
AIP Conf. Proc. 2147, 020010 (2019)
https://doi.org/10.1063/1.5123815
Evaluation of the non-uniformity of rear-side irradiance in outdoor mounted bifacial silicon PV modules
AIP Conf. Proc. 2147, 020011 (2019)
https://doi.org/10.1063/1.5123816
Re-evaluation of the SRH-parameters for the FeGa defect
AIP Conf. Proc. 2147, 020012 (2019)
https://doi.org/10.1063/1.5123817
Injection resolved spatial lifetime mapping using photoluminescence
AIP Conf. Proc. 2147, 020015 (2019)
https://doi.org/10.1063/1.5123820
Excess charge carrier injection densities in PERC solar cells at open-circuit voltage and maximum power point
AIP Conf. Proc. 2147, 020018 (2019)
https://doi.org/10.1063/1.5123823
Averaging the unaverageable: Defining a meaningful local series resistance for large-area silicon solar cells
AIP Conf. Proc. 2147, 020019 (2019)
https://doi.org/10.1063/1.5123824
Simulation of solar cell performance based on in the field measured ambience parameters
AIP Conf. Proc. 2147, 020020 (2019)
https://doi.org/10.1063/1.5123825
Comparison of magnetic field imaging (MFI) and magnetic field simulation of silicon solar cells
AIP Conf. Proc. 2147, 020021 (2019)
https://doi.org/10.1063/1.5123826
ADVANCED LIGHT MANAGEMENT
Impact of the oxygen content on the optoelectronic properties of the indium-tin-oxide based transparent electrodes for silicon heterojunction solar cells
Brahim Aïssa; Amir A. Abdallah; Yahya Zakaria; Maulid M. Kivambe; Ayman Samara; Akshath Raghu Shetty; Jean Cattin; Jan Haschke; Mathieu Boccard; Christophe Ballif
AIP Conf. Proc. 2147, 030001 (2019)
https://doi.org/10.1063/1.5123827
CARRIER SELECTIVE CONTACTS AND CONTACT FORMATION
Screen printed Ag contacts for n-type polysilicon passivated contacts
AIP Conf. Proc. 2147, 040002 (2019)
https://doi.org/10.1063/1.5123829
P-type SiOx front emitters for Si heterojunction solar cells
Marco Della Noce; Eugenia Bobeico; Laura Lancellotti; Lucia V. Mercaldo; Iurie Usatii; Paola Delli Veneri
AIP Conf. Proc. 2147, 040003 (2019)
https://doi.org/10.1063/1.5123830
Characterization of absorption losses in rear side n-type polycrystalline silicon passivating contacts
AIP Conf. Proc. 2147, 040004 (2019)
https://doi.org/10.1063/1.5123831
Sputtering of silicon thin films for passivated contacts
Jan Hoß; Jens Baumann; Markus Berendt; Uwe Graupner; René Köhler; Jan Lossen; Martin Thumsch; Eric Schneiderlöchner
AIP Conf. Proc. 2147, 040007 (2019)
https://doi.org/10.1063/1.5123834
Hydrogen passivation effect on p-type poly-Si/SiOx stack for crystalline silicon solar cells
AIP Conf. Proc. 2147, 040010 (2019)
https://doi.org/10.1063/1.5123837
Improvement of PERC solar cell efficiency based on laser-doped selective emitter
AIP Conf. Proc. 2147, 040011 (2019)
https://doi.org/10.1063/1.5123838
SiOxNy:B layers for ex-situ doping of hole-selective poly silicon contacts: A passivation study
Audrey Morisset; Raphaël Cabal; Valentin Giglia; Bernadette Grange; José Alvarez; Marie-Estelle Gueunier-Farret; Sébastien Dubois; Jean-Paul Kleider
AIP Conf. Proc. 2147, 040012 (2019)
https://doi.org/10.1063/1.5123839
Investigation of contact resistivity on a laser doped boron emitter from CVD doping layers
AIP Conf. Proc. 2147, 040013 (2019)
https://doi.org/10.1063/1.5123840
Evaluation of the burnout phase of the contact firing process for industrial PERC
AIP Conf. Proc. 2147, 040015 (2019)
https://doi.org/10.1063/1.5123842
Study on the interfacial oxide in passivating contacts
AIP Conf. Proc. 2147, 040016 (2019)
https://doi.org/10.1063/1.5123843
Evaluation of localized vertical current formation in carrier selective passivation layers of silicon solar cells by conductive AFM
Susanne Richter; Yevgeniya Larionova; Stephan Großer; Matthias Menzel; Henning Schulte-Huxel; Robby Peibst; Rolf Brendel; Christian Hagendorf
AIP Conf. Proc. 2147, 040017 (2019)
https://doi.org/10.1063/1.5123844
Compensation of the sputter damage during a-Si deposition for poly-Si/SiOx passivating contacts by ex-situ p-doping
AIP Conf. Proc. 2147, 040018 (2019)
https://doi.org/10.1063/1.5123845
Ex situ phosphorus doped polysilicon films by plasma immersion ion implantation (PIII): Controlling and simplifying passivated contacts integration
Antoine Veau; Thibaut Desrues; Audrey Morisset; Frank Torregrosa; Laurent Roux; Anne Kaminski-Cachopo; Quentin Rafhay; Sébastien Dubois
AIP Conf. Proc. 2147, 040021 (2019)
https://doi.org/10.1063/1.5123848
A simple method with analytical model to extract heterojunction solar cell series resistance components and to extract the A-Si:H(i/p) to transparent conductive oxide contact resistivity
Er-Chien Wang; Anna B. Morales-Vilches; Sebastian Neubert; Alexandros Cruz; Rutger Schlatmann; Bernd Stannowski
AIP Conf. Proc. 2147, 040022 (2019)
https://doi.org/10.1063/1.5123849
CLEANING, ETCHING, SURFACE MORPHOLOGY AND SURFACE PASSIVATION
Improved passivation for SHJ utilizing dual intrinsic a-Si:H layers on an inline PECVD tool
AIP Conf. Proc. 2147, 050001 (2019)
https://doi.org/10.1063/1.5123850
Composition limited hydrogen effusion rate of a-SiNx:H passivation stack
AIP Conf. Proc. 2147, 050004 (2019)
https://doi.org/10.1063/1.5123853
Silicon films for heterojunction solar cells by hot-wire CVD
AIP Conf. Proc. 2147, 050006 (2019)
https://doi.org/10.1063/1.5123855
Numerical simulation of an ozone-based wet-chemical etching
AIP Conf. Proc. 2147, 050007 (2019)
https://doi.org/10.1063/1.5123856
Characterization of atomic layer deposited alumina thin films on black silicon textures using helium ion microscopy
AIP Conf. Proc. 2147, 050009 (2019)
https://doi.org/10.1063/1.5123858
Industrial demonstration of 18.5% maximum efficiency inline-diffused additive-free acid-textured DWS multicrystalline silicon solar cells
K. P. Sreejith; Ashok Kumar Sharma; Sandeep Kumbhar; Anzar Gani; D. N. Singh; Anil Kottantharayil; Prabir Kanti Basu
AIP Conf. Proc. 2147, 050010 (2019)
https://doi.org/10.1063/1.5123859
Low-temperature silicon surface passivation for bulk lifetime studies based on Corona-charged Al2O3
AIP Conf. Proc. 2147, 050011 (2019)
https://doi.org/10.1063/1.5123860
HIGH AND RECORD EFFICIENCY DEVICES
JUNCTION FORMATION
Role of thermal SiO2 on passivation of highly doped layer
AIP Conf. Proc. 2147, 070001 (2019)
https://doi.org/10.1063/1.5123862
Laser doping from as-deposited CVD layers for high-efficiency crystalline silicon solar cells
AIP Conf. Proc. 2147, 070002 (2019)
https://doi.org/10.1063/1.5123863
A novel approach for the evaluation of a phosphorus diffusion design of experiment
AIP Conf. Proc. 2147, 070003 (2019)
https://doi.org/10.1063/1.5123864
MODULE PROCESSING AND MATERIALS
Overlap modules: A unique cell layup using smart wire connection technology
Pierre Papet; Simon Hänni; Ludovic Andreetta; Till Kossler; Damien Lachenal; Boris Legradic; Derk Bätzner; Walter Frammelsberger; Robert Kramer; Niels Holm; Bénédicte Bonnet-Eymard; Benjamin Strahm
AIP Conf. Proc. 2147, 080001 (2019)
https://doi.org/10.1063/1.5123867
MODULE RELIABILITY AND PRODUCTION YIELD
Stability investigations of Cz-PERC modules during damp heat testing and transport: The impact of the boron-oxygen defect
Friederike Kersten; Felix Frühauf; Ronny Lantzsch; Matthias Schütze; Christian Taubitz; Fabian Fertig; Martin Schaper; Jörg W. Müller
AIP Conf. Proc. 2147, 090001 (2019)
https://doi.org/10.1063/1.5123869
Analysis of shingle interconnections in solar modules by scanning acoustic microscopy
AIP Conf. Proc. 2147, 090003 (2019)
https://doi.org/10.1063/1.5123871
Estimation of most frequent operating conditions of different technology silicon photovoltaic module in India using IEC 61853-1 approach
Humaid Mohammed; Rajesh Gupta; Oruganti Sastry; Brinchi Bora; Dhiraj Magare; Yogesh Singh; Sagarika Kumar
AIP Conf. Proc. 2147, 090004 (2019)
https://doi.org/10.1063/1.5123872
Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic modules
AIP Conf. Proc. 2147, 090005 (2019)
https://doi.org/10.1063/1.5123873
NPV WORKSHOP
Statistical analysis of structure loss in Czochralski silicon growth
AIP Conf. Proc. 2147, 100002 (2019)
https://doi.org/10.1063/1.5123875
PROCESS INTEGRATION AND LOW-COST MANUFACTURING
Adaptation of the industrial PERC solar cell process chain to plated Ni/Cu/Ag front contact metallization
Norbert Bay; Stephen Fox; Peng Ren; John Burschik; Ulrich Jäger; Holger Kühnlein; Michael Passig; Damian Pysch; Markus Sieber; Sabrina Lohmüller; Elmar Lohmüller; Andreas Wolf; Bruce Lee
AIP Conf. Proc. 2147, 110001 (2019)
https://doi.org/10.1063/1.5123877
Al fire through contacts for p-type bifacial PERC devices
Tobias Fellmeth; Daniel Ourinson; Tim Riebe; Max Pospischil; Florian Clement; Kosuke Tsuji; Suzuki Shota; Marwan Dhamrin
AIP Conf. Proc. 2147, 110002 (2019)
https://doi.org/10.1063/1.5123878
Efficiency improvement of bifacial PERC solar cell based on the optimization of rear structure
AIP Conf. Proc. 2147, 110003 (2019)
https://doi.org/10.1063/1.5123879
Optimization of boron, phosphorus, carbon extraction from metallurgical-grade silicon
Sergey M. Karabanov; Andrey A. Trubitsyn; Dmitriy V. Suvorov; Dmitriy Yu. Tarabrin; Oleg A. Belyakov; Andrey S. Karabanov; Evgeniy V. Slivkin; Andrey E. Serebryakov
AIP Conf. Proc. 2147, 110004 (2019)
https://doi.org/10.1063/1.5123880
Inline deposited PassDop layers for rear side passivation and contacting of p-type c-Si PERL solar cells with high bifaciality
Mohammad Hassan Norouzi; Pierre Saint-Cast; Elmar Lohmüller; Sabrina Lohmüller; Bernd Steinhauser; Andreas Wolf; Marc Hofmann
AIP Conf. Proc. 2147, 110005 (2019)
https://doi.org/10.1063/1.5123881
REVIEW
Efficiency roadmaps for industrial bifacial pPERC and nPERT cells
Loic Tous; Patrick Choulat; Sukhvinder Singh; Joachim John; Monica Aleman; Meric Fırat; Filip Duerinckx; Jozef Szlufcik
AIP Conf. Proc. 2147, 120001 (2019)
https://doi.org/10.1063/1.5123883
SI-BASED TANDEM CELLS, NEW MATERIALS AND NOVEL APPROACHES
A facile way to improve the efficiency of perovskite/silicon four-terminal tandem solar cell based on the optimization of long-wavelength spectral response
Shude Zhang; Xiang Fang; Hongwei Hu; Jiansheng Jie; Xiaohong Zhang; Hongqiang Qian; Weifei Lian; Zhichun Ni; Ningyi Yuan; Jianning Ding; Qingzhu Wei
AIP Conf. Proc. 2147, 130003 (2019)
https://doi.org/10.1063/1.5123886
SILICON MATERIAL AND DEFECT ENGINEERING
Analysis of temperature dependent surface recombination properties
AIP Conf. Proc. 2147, 140001 (2019)
https://doi.org/10.1063/1.5123888
Gettering efficacy of an APCVD glasses based stacked co-diffusion for bifacial mc-Si PERT solar cells
AIP Conf. Proc. 2147, 140002 (2019)
https://doi.org/10.1063/1.5123889
Impact of the thermal budget of the emitter formation on the pFF of PERC+ solar cells
AIP Conf. Proc. 2147, 140005 (2019)
https://doi.org/10.1063/1.5123892
Investigation of LeTID where we can control it – Application of FZ silicon for defect studies
AIP Conf. Proc. 2147, 140006 (2019)
https://doi.org/10.1063/1.5123893
Hydrogenation of dislocations in p-type cast-mono silicon
Aref Samadi; Chandany Sen; Shaoyang Liu; Utkarshaa Varshney; Daniel Chen; Moonyong Kim; Arman Mahboubi Soufiani; Michelle Vaqueiro Contreras; Chee Mun Chong; Alison Ciesla; Malcolm Abbott; Catherine Chan
AIP Conf. Proc. 2147, 140007 (2019)
https://doi.org/10.1063/1.5123894
Zone melting recrystallization of microcrystalline silicon ribbons obtained by chemical vapor deposition
AIP Conf. Proc. 2147, 140008 (2019)
https://doi.org/10.1063/1.5123895
Evolution of defect densities with height in a HPMC-Si ingot
AIP Conf. Proc. 2147, 140010 (2019)
https://doi.org/10.1063/1.5123897
Evaluation of dissolved oxygen concentration in silicon wafers by measuring infrared attenuated total reflection
AIP Conf. Proc. 2147, 140012 (2019)
https://doi.org/10.1063/1.5123899
Low-T anneal as cure for LeTID in Mc-Si PERC cells
AIP Conf. Proc. 2147, 140013 (2019)
https://doi.org/10.1063/1.5123900
New insights into the thermally activated defects in n-type float-zone silicon
Yan Zhu; Fiacre Rougieux; Nicholas Grant; Jack Mullins; Joyce Ann De Guzman; John D. Murphy; Vladimir P. Markevich; Gianluca Coletti; Anthony R. Peaker; Ziv Hameiri
AIP Conf. Proc. 2147, 140014 (2019)
https://doi.org/10.1063/1.5123901
WAFERING TECHNOLOGIES
Inkjet- and flextrail-printing of silicon polymer-based inks for local passivating contacts
Zohreh Kiaee, Andreas Lösel, et al.
Effect of coupling agent type on the self-cleaning and anti-reflective behaviour of advance nanocoating for PV panels application
Taha Tareq Mohammed, Hadia Kadhim Judran, et al.
Students’ mathematical conceptual understanding: What happens to proficient students?
Dian Putri Novita Ningrum, Budi Usodo, et al.