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AIP Conf. Proc. 1552, frontmatter (2013) https://doi.org/10.1063/v1552.frontmatter
AIP Conf. Proc. 1552, backmatter (2013) https://doi.org/10.1063/v1552.backmatter

III. TEMPERATURE SCALES

AIP Conf. Proc. 1552, 94–99 (2013) https://doi.org/10.1063/1.4819521
AIP Conf. Proc. 1552, 71–80 (2013) https://doi.org/10.1063/1.4821373
AIP Conf. Proc. 1552, 89–93 (2013) https://doi.org/10.1063/1.4819520
AIP Conf. Proc. 1552, 112–117 (2013) https://doi.org/10.1063/1.4819524
AIP Conf. Proc. 1552, 81–88 (2013) https://doi.org/10.1063/1.4821374
AIP Conf. Proc. 1552, 106–111 (2013) https://doi.org/10.1063/1.4819523
AIP Conf. Proc. 1552, 100–105 (2013) https://doi.org/10.1063/1.4819522

IV. LOW-TEMPERATURE THERMOMETRY

AIP Conf. Proc. 1552, 148–152 (2013) https://doi.org/10.1063/1.4819530
AIP Conf. Proc. 1552, 156–161 (2013) https://doi.org/10.1063/1.4819532
AIP Conf. Proc. 1552, 130–135 (2013) https://doi.org/10.1063/1.4819527
AIP Conf. Proc. 1552, 153–155 (2013) https://doi.org/10.1063/1.4819531
AIP Conf. Proc. 1552, 162–167 (2013) https://doi.org/10.1063/1.4819533
AIP Conf. Proc. 1552, 124–129 (2013) https://doi.org/10.1063/1.4819526
AIP Conf. Proc. 1552, 142–147 (2013) https://doi.org/10.1063/1.4819529
AIP Conf. Proc. 1552, 136–141 (2013) https://doi.org/10.1063/1.4819528
AIP Conf. Proc. 1552, 118–123 (2013) https://doi.org/10.1063/1.4821375
AIP Conf. Proc. 1552, 168–173 (2013) https://doi.org/10.1063/1.4819534

IX. CALIBRATION METHODS AND UNCERTAINTY

AIP Conf. Proc. 1552, 492–497 (2013) https://doi.org/10.1063/1.4819590
AIP Conf. Proc. 1552, 468–473 (2013) https://doi.org/10.1063/1.4821391
AIP Conf. Proc. 1552, 474–479 (2013) https://doi.org/10.1063/1.4819587
AIP Conf. Proc. 1552, 510–515 (2013) https://doi.org/10.1063/1.4821393
AIP Conf. Proc. 1552, 486–491 (2013) https://doi.org/10.1063/1.4819589
AIP Conf. Proc. 1552, 480–485 (2013) https://doi.org/10.1063/1.4819588
AIP Conf. Proc. 1552, 520–525 (2013) https://doi.org/10.1063/1.4819595
AIP Conf. Proc. 1552, 516–519 (2013) https://doi.org/10.1063/1.4821394
AIP Conf. Proc. 1552, 504–509 (2013) https://doi.org/10.1063/1.4821392
AIP Conf. Proc. 1552, 526–531 (2013) https://doi.org/10.1063/1.4819596
AIP Conf. Proc. 1552, 498–503 (2013) https://doi.org/10.1063/1.4819591

VIII. RESISTANCE THERMOMETRY

AIP Conf. Proc. 1552, 451–456 (2013) https://doi.org/10.1063/1.4819583
AIP Conf. Proc. 1552, 398–403 (2013) https://doi.org/10.1063/1.4819573
AIP Conf. Proc. 1552, 404–408 (2013) https://doi.org/10.1063/1.4819574
AIP Conf. Proc. 1552, 409–413 (2013) https://doi.org/10.1063/1.4819575
AIP Conf. Proc. 1552, 439–444 (2013) https://doi.org/10.1063/1.4819581
AIP Conf. Proc. 1552, 427–432 (2013) https://doi.org/10.1063/1.4819579
AIP Conf. Proc. 1552, 457–462 (2013) https://doi.org/10.1063/1.4819584
AIP Conf. Proc. 1552, 433–438 (2013) https://doi.org/10.1063/1.4821390
AIP Conf. Proc. 1552, 421–426 (2013) https://doi.org/10.1063/1.4819578
AIP Conf. Proc. 1552, 417–420 (2013) https://doi.org/10.1063/1.4819577
AIP Conf. Proc. 1552, 445–450 (2013) https://doi.org/10.1063/1.4819582
AIP Conf. Proc. 1552, 463–467 (2013) https://doi.org/10.1063/1.4819585
AIP Conf. Proc. 1552, 414–416 (2013) https://doi.org/10.1063/1.4819576
AIP Conf. Proc. 1552, 392–397 (2013) https://doi.org/10.1063/1.4819572

XV. PHOSPHOR THERMOMETRY

AIP Conf. Proc. 1552, 873–878 (2013) https://doi.org/10.1063/1.4819659
AIP Conf. Proc. 1552, 885–890 (2013) https://doi.org/10.1063/1.4819661
AIP Conf. Proc. 1552, 903–908 (2013) https://doi.org/10.1063/1.4819664
AIP Conf. Proc. 1552, 867–872 (2013) https://doi.org/10.1063/1.4819658
AIP Conf. Proc. 1552, 863–866 (2013) https://doi.org/10.1063/1.4819657
AIP Conf. Proc. 1552, 897–902 (2013) https://doi.org/10.1063/1.4819663
AIP Conf. Proc. 1552, 891–896 (2013) https://doi.org/10.1063/1.4821412
AIP Conf. Proc. 1552, 879–884 (2013) https://doi.org/10.1063/1.4819660

VII. HIGH TEMPERATURE FIXED POINTS

AIP Conf. Proc. 1552, 363–368 (2013) https://doi.org/10.1063/1.4821388
AIP Conf. Proc. 1552, 374–379 (2013) https://doi.org/10.1063/1.4819569
AIP Conf. Proc. 1552, 352–357 (2013) https://doi.org/10.1063/1.4819565
AIP Conf. Proc. 1552, 358–362 (2013) https://doi.org/10.1063/1.4821387
AIP Conf. Proc. 1552, 346–351 (2013) https://doi.org/10.1063/1.4819564
AIP Conf. Proc. 1552, 329–334 (2013) https://doi.org/10.1063/1.4819561
AIP Conf. Proc. 1552, 386–391 (2013) https://doi.org/10.1063/1.4819571
AIP Conf. Proc. 1552, 323–328 (2013) https://doi.org/10.1063/1.4819560
AIP Conf. Proc. 1552, 317–322 (2013) https://doi.org/10.1063/1.4821384
AIP Conf. Proc. 1552, 369–373 (2013) https://doi.org/10.1063/1.4819568
AIP Conf. Proc. 1552, 335–339 (2013) https://doi.org/10.1063/1.4821385
AIP Conf. Proc. 1552, 380–385 (2013) https://doi.org/10.1063/1.4821389
AIP Conf. Proc. 1552, 340–345 (2013) https://doi.org/10.1063/1.4821386
AIP Conf. Proc. 1552, 305–316 (2013) https://doi.org/10.1063/1.4821383

XVI. NOVEL THERMOMETERS AND FIXED POINTS

AIP Conf. Proc. 1552, 943–948 (2013) https://doi.org/10.1063/1.4821413
AIP Conf. Proc. 1552, 920–924 (2013) https://doi.org/10.1063/1.4819667
AIP Conf. Proc. 1552, 909–914 (2013) https://doi.org/10.1063/1.4819665
AIP Conf. Proc. 1552, 925–930 (2013) https://doi.org/10.1063/1.4819668
AIP Conf. Proc. 1552, 937–942 (2013) https://doi.org/10.1063/1.4819670
AIP Conf. Proc. 1552, 931–936 (2013) https://doi.org/10.1063/1.4819669
AIP Conf. Proc. 1552, 915–919 (2013) https://doi.org/10.1063/1.4819666

I. MEASUREMENT OF THE BOLTZMANN CONSTANT

AIP Conf. Proc. 1552, 17–22 (2013) https://doi.org/10.1063/1.4819508
AIP Conf. Proc. 1552, 11–16 (2013) https://doi.org/10.1063/1.4819507
AIP Conf. Proc. 1552, 1–10 (2013) https://doi.org/10.1063/1.4821367
AIP Conf. Proc. 1552, 23–28 (2013) https://doi.org/10.1063/1.4821368
AIP Conf. Proc. 1552, 29–33 (2013) https://doi.org/10.1063/1.4821369
AIP Conf. Proc. 1552, 34–38 (2013) https://doi.org/10.1063/1.4821370

II. THERMODYNAMIC TEMPERATURE DETERMINATIONS

AIP Conf. Proc. 1552, 44–49 (2013) https://doi.org/10.1063/1.4819513
AIP Conf. Proc. 1552, 39–43 (2013) https://doi.org/10.1063/1.4819512
AIP Conf. Proc. 1552, 50–55 (2013) https://doi.org/10.1063/1.4819514
AIP Conf. Proc. 1552, 60–64 (2013) https://doi.org/10.1063/1.4819516
AIP Conf. Proc. 1552, 65–70 (2013) https://doi.org/10.1063/1.4821372
AIP Conf. Proc. 1552, 56–59 (2013) https://doi.org/10.1063/1.4821371

X. THERMOCOUPLE THERMOMETRY

AIP Conf. Proc. 1552, 601–606 (2013) https://doi.org/10.1063/1.4821397
AIP Conf. Proc. 1552, 560–563 (2013) https://doi.org/10.1063/1.4819602
AIP Conf. Proc. 1552, 554–559 (2013) https://doi.org/10.1063/1.4819601
AIP Conf. Proc. 1552, 544–548 (2013) https://doi.org/10.1063/1.4821395
AIP Conf. Proc. 1552, 564–569 (2013) https://doi.org/10.1063/1.4819603
AIP Conf. Proc. 1552, 595–600 (2013) https://doi.org/10.1063/1.4821396
AIP Conf. Proc. 1552, 581–586 (2013) https://doi.org/10.1063/1.4819606
AIP Conf. Proc. 1552, 538–543 (2013) https://doi.org/10.1063/1.4819598
AIP Conf. Proc. 1552, 591–594 (2013) https://doi.org/10.1063/1.4819608
AIP Conf. Proc. 1552, 587–590 (2013) https://doi.org/10.1063/1.4819607
AIP Conf. Proc. 1552, 532–537 (2013) https://doi.org/10.1063/1.4819597
AIP Conf. Proc. 1552, 576–580 (2013) https://doi.org/10.1063/1.4819605
AIP Conf. Proc. 1552, 549–553 (2013) https://doi.org/10.1063/1.4819600
AIP Conf. Proc. 1552, 570–575 (2013) https://doi.org/10.1063/1.4819604

XVII. THERMOMETRY FOR SPECIAL APPLICATIONS

AIP Conf. Proc. 1552, 1014–1019 (2013) https://doi.org/10.1063/1.4819683
AIP Conf. Proc. 1552, 970–975 (2013) https://doi.org/10.1063/1.4819675
AIP Conf. Proc. 1552, 976–980 (2013) https://doi.org/10.1063/1.4821415
AIP Conf. Proc. 1552, 958–963 (2013) https://doi.org/10.1063/1.4821414
AIP Conf. Proc. 1552, 993–997 (2013) https://doi.org/10.1063/1.4819679
AIP Conf. Proc. 1552, 1009–1013 (2013) https://doi.org/10.1063/1.4819682
AIP Conf. Proc. 1552, 949–957 (2013) https://doi.org/10.1063/1.4819672
AIP Conf. Proc. 1552, 1003–1008 (2013) https://doi.org/10.1063/1.4821417
AIP Conf. Proc. 1552, 964–969 (2013) https://doi.org/10.1063/1.4819674
AIP Conf. Proc. 1552, 981–986 (2013) https://doi.org/10.1063/1.4819677
AIP Conf. Proc. 1552, 998–1002 (2013) https://doi.org/10.1063/1.4821416
AIP Conf. Proc. 1552, 987–992 (2013) https://doi.org/10.1063/1.4819678

XIV. TEMPERATURE CONTROL

AIP Conf. Proc. 1552, 834–839 (2013) https://doi.org/10.1063/1.4819652
AIP Conf. Proc. 1552, 851–856 (2013) https://doi.org/10.1063/1.4819655
AIP Conf. Proc. 1552, 840–844 (2013) https://doi.org/10.1063/1.4819653
AIP Conf. Proc. 1552, 830–833 (2013) https://doi.org/10.1063/1.4819651
AIP Conf. Proc. 1552, 825–829 (2013) https://doi.org/10.1063/1.4819650
AIP Conf. Proc. 1552, 845–850 (2013) https://doi.org/10.1063/1.4821411
AIP Conf. Proc. 1552, 857–862 (2013) https://doi.org/10.1063/1.4819656

XI. RADIATION THERMOMETRY-STANDARDS

AIP Conf. Proc. 1552, 698–703 (2013) https://doi.org/10.1063/1.4821402
AIP Conf. Proc. 1552, 678–681 (2013) https://doi.org/10.1063/1.4819623
AIP Conf. Proc. 1552, 660–665 (2013) https://doi.org/10.1063/1.4819620
AIP Conf. Proc. 1552, 643–648 (2013) https://doi.org/10.1063/1.4819617
AIP Conf. Proc. 1552, 666–671 (2013) https://doi.org/10.1063/1.4821400
AIP Conf. Proc. 1552, 631–636 (2013) https://doi.org/10.1063/1.4819615
AIP Conf. Proc. 1552, 672–677 (2013) https://doi.org/10.1063/1.4819622
AIP Conf. Proc. 1552, 613–618 (2013) https://doi.org/10.1063/1.4819612
AIP Conf. Proc. 1552, 654–659 (2013) https://doi.org/10.1063/1.4819619
AIP Conf. Proc. 1552, 693–697 (2013) https://doi.org/10.1063/1.4819626
AIP Conf. Proc. 1552, 649–653 (2013) https://doi.org/10.1063/1.4821399
AIP Conf. Proc. 1552, 682–687 (2013) https://doi.org/10.1063/1.4819624
AIP Conf. Proc. 1552, 607–612 (2013) https://doi.org/10.1063/1.4819611
AIP Conf. Proc. 1552, 637–642 (2013) https://doi.org/10.1063/1.4819616
AIP Conf. Proc. 1552, 688–692 (2013) https://doi.org/10.1063/1.4821401
AIP Conf. Proc. 1552, 625–630 (2013) https://doi.org/10.1063/1.4821398
AIP Conf. Proc. 1552, 619–624 (2013) https://doi.org/10.1063/1.4819613

VI. METAL FIXED POINTS

AIP Conf. Proc. 1552, 265–270 (2013) https://doi.org/10.1063/1.4819551
AIP Conf. Proc. 1552, 300–304 (2013) https://doi.org/10.1063/1.4821382
AIP Conf. Proc. 1552, 295–299 (2013) https://doi.org/10.1063/1.4819556
AIP Conf. Proc. 1552, 277–282 (2013) https://doi.org/10.1063/1.4819553
AIP Conf. Proc. 1552, 249–254 (2013) https://doi.org/10.1063/1.4821381
AIP Conf. Proc. 1552, 237–242 (2013) https://doi.org/10.1063/1.4819546
AIP Conf. Proc. 1552, 259–264 (2013) https://doi.org/10.1063/1.4819550
AIP Conf. Proc. 1552, 271–276 (2013) https://doi.org/10.1063/1.4819552
AIP Conf. Proc. 1552, 243–248 (2013) https://doi.org/10.1063/1.4819547
AIP Conf. Proc. 1552, 289–294 (2013) https://doi.org/10.1063/1.4819555
AIP Conf. Proc. 1552, 232–236 (2013) https://doi.org/10.1063/1.4819545
AIP Conf. Proc. 1552, 283–288 (2013) https://doi.org/10.1063/1.4819554
AIP Conf. Proc. 1552, 255–258 (2013) https://doi.org/10.1063/1.4819549
AIP Conf. Proc. 1552, 227–231 (2013) https://doi.org/10.1063/1.4819544

XIII. INTERNATIONAL COMPARISONS

AIP Conf. Proc. 1552, 782–785 (2013) https://doi.org/10.1063/1.4821407
AIP Conf. Proc. 1552, 802–807 (2013) https://doi.org/10.1063/1.4819646
AIP Conf. Proc. 1552, 819–824 (2013) https://doi.org/10.1063/1.4819649
AIP Conf. Proc. 1552, 813–818 (2013) https://doi.org/10.1063/1.4819648
AIP Conf. Proc. 1552, 808–812 (2013) https://doi.org/10.1063/1.4821410
AIP Conf. Proc. 1552, 777–781 (2013) https://doi.org/10.1063/1.4821406
AIP Conf. Proc. 1552, 791–796 (2013) https://doi.org/10.1063/1.4821409
AIP Conf. Proc. 1552, 771–776 (2013) https://doi.org/10.1063/1.4821405
AIP Conf. Proc. 1552, 797–801 (2013) https://doi.org/10.1063/1.4819645
AIP Conf. Proc. 1552, 786–790 (2013) https://doi.org/10.1063/1.4821408

XII. RADIATION THERMOMETRY-EMISSIVITY, APPLICATIONS, AND MATERIAL PROPERTIES

AIP Conf. Proc. 1552, 716–721 (2013) https://doi.org/10.1063/1.4821403
AIP Conf. Proc. 1552, 762–766 (2013) https://doi.org/10.1063/1.4819638
AIP Conf. Proc. 1552, 710–715 (2013) https://doi.org/10.1063/1.4819629
AIP Conf. Proc. 1552, 734–739 (2013) https://doi.org/10.1063/1.4819633
AIP Conf. Proc. 1552, 722–727 (2013) https://doi.org/10.1063/1.4819631
AIP Conf. Proc. 1552, 752–756 (2013) https://doi.org/10.1063/1.4819636
AIP Conf. Proc. 1552, 740–745 (2013) https://doi.org/10.1063/1.4819634
AIP Conf. Proc. 1552, 767–770 (2013) https://doi.org/10.1063/1.4819639
AIP Conf. Proc. 1552, 757–761 (2013) https://doi.org/10.1063/1.4819637
AIP Conf. Proc. 1552, 728–733 (2013) https://doi.org/10.1063/1.4821404
AIP Conf. Proc. 1552, 746–751 (2013) https://doi.org/10.1063/1.4819635
AIP Conf. Proc. 1552, 704–709 (2013) https://doi.org/10.1063/1.4819628

V. LOW-TEMPERATURE/WATER FIXED POINTS

AIP Conf. Proc. 1552, 198–203 (2013) https://doi.org/10.1063/1.4819539
AIP Conf. Proc. 1552, 204–208 (2013) https://doi.org/10.1063/1.4819540
AIP Conf. Proc. 1552, 180–185 (2013) https://doi.org/10.1063/1.4821376