X-ray phase-contrast imaging technique based on a bilens interferometer Free

The phase-sensitive X-ray imaging technique based on the bilens interferometer is demonstrated. The technique allows obtaining the absolute value of a phase shift profile of the sample with a high phase and spatial resolution. The imaging technique was employed to study fibers with different sizes. Experiments were performed at the ESRF ID06 beamline using hard X-rays. The corresponding phase shift profile reconstructions and computer simulations were performed. The experimental results are fully consistent with theoretical concepts and appropriate numerical calculations. Future improvements of the interferometric imaging technique, as well as applications, are discussed. The advantages of the proposed phase-contrast imaging method in the hard X-ray domain are given.