The impact of boron-oxygen related light-induced degradation (BO-LID) of bulk lifetime on the efficiency of PERC and full area Al-alloyed cells is studied by means of device simulations. As the higher efficiency potential of PERC cells relies on the better use of high bulk lifetime, PERC cells are –as expected– found to be stronger impacted by BO-LID. However, the exact extent of BO-LID in both cell architectures depends on factors like resistivity, oxygen level, thermal processing and bulk lifetime limitation by other defects.

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