Adaptive x-ray mirrors are viewed as the main path to meeting the science and usability needs of the next generation of x-ray light sources. Curren tly these mirrors op erate open loop with intermittent feedback from invasive sensors that measure the beam quality. We outline a novel design for in situ metrology of the shape of these mirrors using an array of interferometric sensors. We describe a proof-of-principle demonstration showing sub-nm agreement between shape changes measured by this technique to simultaneous measurements by a large-aperture 18” Fizeau interferometer.

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