We report improvement of the Self-referenced lattice comparator using a wide brush beam with size of 16 mm × 0.3 mm and a pair of one-dimensional position sensitive X-ray counters instead of using a pencil beam with size of 1 mm × 0.3 mm and a pair of PIN photodiode detector in the former system. The experimental time is accelerated by a factor of more than ten times. Since we use a brush beam for the measurement, the wavelength alone the horizontal beam width positions are different, it is necessary to establish a data correction procedure for the lattice comparator. We reported our first data after the system improved, the spatial resolution of mapping measurement reached to 0.5 mm × 0.3 mm, that is higher than the previous system.

1.
X W
Zhang
,
H
Sugiyama
,
M
Ando
,
Y
Imai
and
Y
Yoda
,
J. Appl. Cryst.
36
,
188
192
(
2003
).
2.
A
Waseda
,
H
Fujimoto
,
X W
Zhang
,
N
Kuramoto
, and
K
Fujii
,
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
,
66
(
2017
)
6
.
3.
H
Fujimoto
,
A
Waseda
and
X W
Zhang
,
Metrologia
48
S55
S61
(
2011
).