We report on the performance of a new setup for anomalous x-ray scattering experiments implemented at BL15 of the Saga-Light Source using two silicon drift detectors (SDD). This setup enables an efficient and time-saving analysis of the scattering data and simplifies the correction of spurious contributions to the elastic scattering signal. We demonstrate the feasibility using an amorphous As25Se75 sample, for which element-specific structural information is difficult to obtain by alternative characterization methods.
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