We report on the performance of a new setup for anomalous x-ray scattering experiments implemented at BL15 of the Saga-Light Source using two silicon drift detectors (SDD). This setup enables an efficient and time-saving analysis of the scattering data and simplifies the correction of spurious contributions to the elastic scattering signal. We demonstrate the feasibility using an amorphous As25Se75 sample, for which element-specific structural information is difficult to obtain by alternative characterization methods.
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Research Article| January 15 2019
Anomalous x-ray scattering experiments for disordered materials at the SAGA light source
J. R. Stellhorn;
AIP Conf. Proc. 2054, 050012 (2019)
J. R. Stellhorn, S. Hosokawa, E. Magome; Anomalous x-ray scattering experiments for disordered materials at the SAGA light source. AIP Conf. Proc. 15 January 2019; 2054 (1): 050012. https://doi.org/10.1063/1.5084630
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