We realized the milliseconds rapid diffraction measurement using the high-flux synchrotron radiation (SR) of SPring-8 and a high frame rate photon counting detector in BL40XU beamline. We carried out single crystal X-ray diffraction measurements at high rotation speeds up to 80,000 rpm (0.75 ms/rotation) in order to evaluate the limitations of the measurement time and the accuracy of molecular structure. Using a high-speed spindle motor for sample rotation, we successfully analyzed the structure of cytidine (C9H13N3O5) from a dataset of a 60 ms measurement time at a 1,000 rpm sample rotation. However, although weak diffraction spots were clearly observed, the crystal structure could not be solved at an 80,000 rpm sample rotation. These results show that it is possible to observe the crystal structure or lattice parameter changes during one-shot irreversible chemical reactions using the millisecond rapid diffraction measurement.
Skip Nav Destination
Article navigation
15 January 2019
PROCEEDINGS OF THE 13TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2018
11–15 June 2018
Taipei, Taiwan
Research Article|
January 15 2019
Rapid single crystal structure analysis using high-flux synchrotron radiation of SPring-8
Nobuhiro Yasuda;
Nobuhiro Yasuda
a)
1
Japan Synchrotron Radiation Research Institute
, 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan
a)Corresponding author: nyasuda@spring8.or.jp
Search for other works by this author on:
Shigeru Kimura
Shigeru Kimura
b)
1
Japan Synchrotron Radiation Research Institute
, 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan
Search for other works by this author on:
a)Corresponding author: nyasuda@spring8.or.jp
AIP Conf. Proc. 2054, 050007 (2019)
Citation
Nobuhiro Yasuda, Shigeru Kimura; Rapid single crystal structure analysis using high-flux synchrotron radiation of SPring-8. AIP Conf. Proc. 15 January 2019; 2054 (1): 050007. https://doi.org/10.1063/1.5084625
Download citation file:
256
Views
Citing articles via
Related Content
Present Status of BL40B2 and BL40XU at SPring‐8 (Beamlines for Small Angle X‐ray Scattering)
AIP Conference Proceedings (May 2004)
Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination
AIP Conference Proceedings (June 2010)
Subnanosecond‐Resolved X‐ray Diffraction at the SPring‐8 High Flux Beamline BL40XU
AIP Conference Proceedings (May 2004)
Microsecond Time‐resolved Diffraction and Scattering Measurements System Using Semi‐monochromatic X‐ray Pulse at SPring‐8 BL40XU
AIP Conference Proceedings (May 2004)
Quick XAFS System using Quasimonochromatic Undulator Radiation at SPring‐8
AIP Conference Proceedings (February 2007)