In this paper, we present two frequency-domain algorithms for 2D imaging with plane wave emissions, namely Stolt’s migration and Lu’s method. The theoretical background is first presented, followed by an analysis of the algorithm complexities. The frequency-domain methods are then compared to the time-domain plane wave imaging in a realistic inspection configuration where the array elements are not in contact with the specimen. Imaging defects located far away from the array aperture is assessed and computation times for the three methods are presented as a function of the number of pixels of the reconstructed image. We show that Lu’s method provides a time gain of up to 33 compared to the time-domain algorithm, and demonstrate the limitations of Stolt’s migration for defects far away from the aperture.

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