We have built and implemented a time-resolved ellipsometry diagnostic for dynamic material properties experiments at Sandia National Laboratories. This diagnostic measures the complex dielectric value of a sample experiencing dynamic compression, with a time resolution of a few nanoseconds. We show and discuss the dynamic ellipsometry measurements taken from shock loading experiments on a gas gun. This work is relevant to geophysical materials at high pressure-temperature conditions.
REFERENCES
1.
Bolme
, C. A.
, S. D.
McGrane
, D. S.
Moore
, and D. J.
Funk
. “Single shot measurements of laser driven shock waves using ultrafast dynamic ellipsometry
.” Journal of Applied Physics
102
, no. 3
(2007
): 033513
.2.
Bakshi
, L.
, S.
Eliezer
, G.
Appelbaum
, N.
Nissim
, L.
Perelmutter
, and M.
Mond
. “A full Stokes vector ellipsometry measurement system for in situ diagnostics in dynamic experiments
.” Review of Scientific Instruments
83
, no. 5
(2012
): 053904
.3.
Obst
, A. W.
, Alrick
, K. R.
, Boboridis
, K.
, Buttler
, W. T.
, Marshall
, B. R.
, Payton
, J. R.
, and Wilke
, M. D.
(2002
). “Ellipsometry in the study of dynamic material properties
.” International journal of thermophysics
, 23
(5
), 1259
–1266
.4.
Nguyen
, J. H.
, and N. C.
Holmes
. “Shock-Induced Birefringence in Lithium Fluoride.” In AIP CONFERENCE PROCEEDINGS
, no. 2
, pp. 1251
–1254
. IOP INSTITUTE OF PHYSICS PUBLISHING LTD
, 2002
.
This content is only available via PDF.
© 2017 Author(s).
2017
Author(s)
