A method for fast contactless CPV cell wafer inspection and chip sorting is proposed. A corresponding installation is based on two lasers and a compact spectrometer. Electroluminescence relating to top and middle subcells in triple-junction InGaP/InGaAs/Ge chips is analyzed under separate in time photoexitation using fiber optics. Special software allows comparing and sorting the cells with respect to expected voltage in MPP conditions under solar illumination. The developed method may be useful at optimization of promising four-junction cells entirely constructed on the basis of the direct-gap semiconductor compounds characterized by intensive luminescence.
Working capability characterization of the CPV chips in wafers through two-wavelength photoelectroluminescent scanning
Valery Rumyantsev, Valery Larionov, Dmitriy Malevskiy, Pavel Pokrovskiy; Working capability characterization of the CPV chips in wafers through two-wavelength photoelectroluminescent scanning. AIP Conf. Proc. 1 September 2016; 1766 (1): 100005. https://doi.org/10.1063/1.4962120
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