Beamline commissioning activities at the Sub-micron Resolution Spectroscopy Beamline, SRX, one of the project beamlines of the National Synchrotron Light Source II, began in December 2014. SRX is a hard x-ray micro-probe beamline. The technical capabilities presented in this paper include scanning micro-fluorescence microscopy (µ-XRF) and x-ray absorption near-edge structure (µ-XANES) spectroscopy. The high flux KBs station with sub-micron resolution in the step-scanning mode has been commissioned with results presented in this paper. Capabilities under commissioning/planning include XRF-XANES stack imaging, a high resolution station (sub-100 nm), x-ray fluorescence tomography, integration of Maia detector, and fly-scan mode. Early science commissioning results from SRX in the materials science field are presented in this paper. Topics being studied include nanoporous materials for energy conversion/storage, thin film materials for electronics, degradation of paint materials for art conservation, and grain boundary segregation in structural materials. On December 7th 2015, SRX officially became a user-operational beamline and started accepting general users. The users of interest are encouraged to contact the beamline staff and submit General User Proposals.
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30 August 2016
ICXOM23: International Conference on X-ray Optics and Microanalysis
14–18 September 2015
Upton, NY, USA
Research Article|
August 30 2016
Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering
Yu-chen Karen Chen-Wiegart;
Yu-chen Karen Chen-Wiegart
a)
1National Synchrotron Light Source – II,
Brookhaven National Laboratory
, Upton, NY 11973, USA
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Garth Williams;
Garth Williams
1National Synchrotron Light Source – II,
Brookhaven National Laboratory
, Upton, NY 11973, USA
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Chonghang Zhao;
Chonghang Zhao
2Department of Materials Science and Engineering,
Stony Brook University
11794, USA
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Hua Jiang;
Hua Jiang
2Department of Materials Science and Engineering,
Stony Brook University
11794, USA
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Li Li;
Li Li
1National Synchrotron Light Source – II,
Brookhaven National Laboratory
, Upton, NY 11973, USA
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Michael Demkowicz;
Michael Demkowicz
3Department of Materials Science and Engineering,
Texas A&M University
, College Station, TX 77843, USA
4Department of Materials Science and Engineering,
Massachusetts Institute of Technology
, Cambridge, MA 02139, USA
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Matteo Seita;
Matteo Seita
4Department of Materials Science and Engineering,
Massachusetts Institute of Technology
, Cambridge, MA 02139, USA
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Mike Short;
Mike Short
5Department of Nuclear Science and Engineering,
Massachusetts Institute of Technology
, Cambridge, MA 02139, USA
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Sara Ferry;
Sara Ferry
5Department of Nuclear Science and Engineering,
Massachusetts Institute of Technology
, Cambridge, MA 02139, USA
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Takeshi Wada;
Takeshi Wada
6Institute for Materials Research,
Tohoku University
, Katahira, Sendai, 980-8577, Japan
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Hidemi Kato;
Hidemi Kato
6Institute for Materials Research,
Tohoku University
, Katahira, Sendai, 980-8577, Japan
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Kang Wei Chou;
Kang Wei Chou
7
Henkel Corporation
, Bridgewater, NJ 08807 USA
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Stanislas Petrash;
Stanislas Petrash
7
Henkel Corporation
, Bridgewater, NJ 08807 USA
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Jaclyn Catalano;
Jaclyn Catalano
8Department of Chemistry and Biochemistry,
Montclair State University
, Montclair, NJ, USA
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Yao Yao;
Yao Yao
9Department of Chemistry and Biochemistry,
University of Delaware
, Newark, DE, USA
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Anna Murphy;
Anna Murphy
9Department of Chemistry and Biochemistry,
University of Delaware
, Newark, DE, USA
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Nicholas Zumbulyadis;
Nicholas Zumbulyadis
10
Independent Researcher
, Rochester, NY, USA
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Silvia A. Centeno;
Silvia A. Centeno
11Department of Scientific Research,
The Metropolitan Museum of Art
, New York, NY 10028, USA
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Cecil Dybowski;
Cecil Dybowski
9Department of Chemistry and Biochemistry,
University of Delaware
, Newark, DE, USA
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Juergen Thieme
Juergen Thieme
b)
1National Synchrotron Light Source – II,
Brookhaven National Laboratory
, Upton, NY 11973, USA
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a)
Corresponding author: [email protected]
b)
Lead scientist of SRX: [email protected]
AIP Conf. Proc. 1764, 030004 (2016)
Citation
Yu-chen Karen Chen-Wiegart, Garth Williams, Chonghang Zhao, Hua Jiang, Li Li, Michael Demkowicz, Matteo Seita, Mike Short, Sara Ferry, Takeshi Wada, Hidemi Kato, Kang Wei Chou, Stanislas Petrash, Jaclyn Catalano, Yao Yao, Anna Murphy, Nicholas Zumbulyadis, Silvia A. Centeno, Cecil Dybowski, Juergen Thieme; Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering. AIP Conf. Proc. 30 August 2016; 1764 (1): 030004. https://doi.org/10.1063/1.4961138
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