We have succeeded in measuring X-ray absorption fine structure (TEY-XAFS) spectra of insulating plate samples by total electron yield. The biggest problem is how to suppress the charge-up. We have attempted to deposit a gold stripe electrode on the surface and obtained a TEY-XAFS spectrum. This indicates that the metal stripe electrode is very useful in the TEY-XAFS measurement of the insulating plate samples. In the detailed analysis, we have found that the effective area for suppressing charge-up was approximately 120 μm from the edge of the electrode.
Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator
Takumi Yonemura, Junji Iihara, Shigeaki Uemura, Koji Yamaguchi, Masahito Niibe; Development of the surface-sensitive soft x-ray absorption fine structure measurement technique for the bulk insulator. AIP Conf. Proc. 27 July 2016; 1741 (1): 050025. https://doi.org/10.1063/1.4952945
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