The Current‐Voltage (IV) measurements on Pt/InN Schottky barrier diodes in the temperature range 10–280 K were done. It was found that the contact was Schottky up to 280 K, becoming irreversible ohmic for higher temperatures. The ideality factor, the saturation current and the apparent barrier height were calculated by using the thermionic emission (TE) theory. The ideality factor is temperature dependent, while the saturation current and the barrier height are not. The non conventional Richardson plot exhibits good linearity, corresponding to an activation energy of 2.08 eV and a Richardson constant of The Cheung’s method to estimate the value of a possible series resistance yields a negligible resistance. From reverse‐bias IV analysis, it is found that the experimental carrier density value increases with temperature.
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4 January 2010
PHYSICS OF SEMICONDUCTORS: 29th International Conference on the Physics of Semiconductors
27 July–1 August 2009
Rio de Janeiro (Brazil)
Research Article|
January 04 2010
Temperature Dependence Of Current‐Voltage Characteristics Of Pt/InN Schottky Barrier Diodes
Victor‐Tapio Rangel‐Kuoppa;
Victor‐Tapio Rangel‐Kuoppa
Micro‐ and Nanosciences Laboratory, Helsinki University of Technology P.O. Box 3500, 02015 Helsinki, Finland
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Sami Suihkonen;
Sami Suihkonen
Micro‐ and Nanosciences Laboratory, Helsinki University of Technology P.O. Box 3500, 02015 Helsinki, Finland
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Markku Sopanen;
Markku Sopanen
Micro‐ and Nanosciences Laboratory, Helsinki University of Technology P.O. Box 3500, 02015 Helsinki, Finland
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Harri Lipsanen
Harri Lipsanen
Micro‐ and Nanosciences Laboratory, Helsinki University of Technology P.O. Box 3500, 02015 Helsinki, Finland
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AIP Conf. Proc. 1199, 53–54 (2010)
Citation
Victor‐Tapio Rangel‐Kuoppa, Sami Suihkonen, Markku Sopanen, Harri Lipsanen; Temperature Dependence Of Current‐Voltage Characteristics Of Pt/InN Schottky Barrier Diodes. AIP Conf. Proc. 4 January 2010; 1199 (1): 53–54. https://doi.org/10.1063/1.3295546
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