Metrology and standardization have a crucial role in the development of nanotechnologies. First Russian standards for nanotechnologies are considered. These standards are based on the use of silicon test objects–measures of small length at the nanoscale level. Characteristics of these test objects are presented.

Topics
Metrology, Nanotechnology, Chemical elements, Educational assessment
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© 2008 American Institute of Physics.
2008
American Institute of Physics
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