The aim of this study was to determine of K shell fluorescence yields (ωK) of Hf compounds. The targets were irradiated with γ‐photons at 123.6 keV from 57Co annular source. The K X‐rays from different targets were dedected using a (Ultra‐LEGe) semiconductor dedector with a resolution of 150 eV at 5.9 keV. The measured K shell fluorescence yields results compare with the literature semi‐emprical prediction that taken from Krause.

This content is only available via PDF.
You do not currently have access to this content.