Photoemission Spectroscopy (PES) is a powerful method to investigate electronic structure of materials. However, conventional vacuum ultraviolet (VUV) and soft x‐ray (SX) PES is surface sensitive because of the short inelastic‐mean‐free‐paths of photoelectrons. This requires us to prepare clean surface and sometimes obscures intrinsic bulk states. In order to realize bulk‐sensitive or surface‐insensitive PES, we have developed hard x‐ray (HX) PES using high‐brilliance synchrotron radiation at BL29XU in SPring‐8. Large probing depth of high energy photoelectrons enables us to probe intrinsic bulk states almost free from surface condition. A combination of x‐ray optics and an electron energy analyzer dedicated for HX‐PES achieved the total instrumental energy resolution of 63 and 55 meV (FWHM) at 5.95 and 7.94 keV, respectively. A special arrangement of an analyzer and a sample was employed and increased photoelectron intensity drastically. We describe present performance of our apparatus and characterize HX‐PES by showing typical spectra.

Topics
Measuring instruments, Vacuum ultraviolet radiation, Synchrotron radiation, Photoelectron spectroscopy
This content is only available via PDF.
© 2007 American Institute of Physics.
2007
American Institute of Physics
You do not currently have access to this content.