Photoemission Spectroscopy (PES) is a powerful method to investigate electronic structure of materials. However, conventional vacuum ultraviolet (VUV) and soft x‐ray (SX) PES is surface sensitive because of the short inelastic‐mean‐free‐paths of photoelectrons. This requires us to prepare clean surface and sometimes obscures intrinsic bulk states. In order to realize bulk‐sensitive or surface‐insensitive PES, we have developed hard x‐ray (HX) PES using high‐brilliance synchrotron radiation at BL29XU in SPring‐8. Large probing depth of high energy photoelectrons enables us to probe intrinsic bulk states almost free from surface condition. A combination of x‐ray optics and an electron energy analyzer dedicated for HX‐PES achieved the total instrumental energy resolution of 63 and 55 meV (FWHM) at 5.95 and 7.94 keV, respectively. A special arrangement of an analyzer and a sample was employed and increased photoelectron intensity drastically. We describe present performance of our apparatus and characterize HX‐PES by showing typical spectra.
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19 January 2007
SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation
28 May-2 June 2006
Daegu (Korea)
Research Article|
January 19 2007
High Resolution Hard X‐ray Photoemission Spectroscopy at SPring‐8: Basic Performance and Characterization
Yasutaka Takata;
Yasutaka Takata
1Soft X‐ray Spectroscopy Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Koji Horiba;
Koji Horiba
1Soft X‐ray Spectroscopy Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Masaharu Matsunami;
Masaharu Matsunami
1Soft X‐ray Spectroscopy Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Shik Shin;
Shik Shin
1Soft X‐ray Spectroscopy Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Makina Yabashi;
Makina Yabashi
2Coherent X‐ray Optics Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
3JASRI/SPring‐8, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5198, Japan
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Kenji Tamasaku;
Kenji Tamasaku
2Coherent X‐ray Optics Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Yoshinori Nishino;
Yoshinori Nishino
2Coherent X‐ray Optics Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Daigo Miwa;
Daigo Miwa
2Coherent X‐ray Optics Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
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Tetsuya Isikawa;
Tetsuya Isikawa
2Coherent X‐ray Optics Laboratory, RIKEN SPring‐8 Center, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5148, Japan
3JASRI/SPring‐8, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5198, Japan
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Eiji Ikenaga;
Eiji Ikenaga
3JASRI/SPring‐8, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5198, Japan
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Keisuke Kobayashi;
Keisuke Kobayashi
3JASRI/SPring‐8, 1‐1‐1 Kouto, Sayo‐cho, Sayo‐gun, Hyogo 679‐5198, Japan
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Masashi Arita;
Masashi Arita
4HiSOR, Hiroshima University, Kagamiyama 2‐313, Higashi‐Hiroshima 739‐5826, Japan
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Kenya Shimada;
Kenya Shimada
4HiSOR, Hiroshima University, Kagamiyama 2‐313, Higashi‐Hiroshima 739‐5826, Japan
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Hirofumi Namatame;
Hirofumi Namatame
4HiSOR, Hiroshima University, Kagamiyama 2‐313, Higashi‐Hiroshima 739‐5826, Japan
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Masaki Taniguchi;
Masaki Taniguchi
4HiSOR, Hiroshima University, Kagamiyama 2‐313, Higashi‐Hiroshima 739‐5826, Japan
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Hiroshi Nohira;
Hiroshi Nohira
5Department of Electrical and Electronic Engineering, Musashi Institute of Technology, Tamazutsumi 1‐28‐1, Setagaya‐ku, Tokyo 158‐8557, Japan
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Takeo Hattori;
Takeo Hattori
5Department of Electrical and Electronic Engineering, Musashi Institute of Technology, Tamazutsumi 1‐28‐1, Setagaya‐ku, Tokyo 158‐8557, Japan
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Sven Södergren;
Sven Södergren
6VG Scienta AB, P.O. Box 15120, SE‐750 15 Uppsala, Sweden
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Björn Wannberg
Björn Wannberg
6VG Scienta AB, P.O. Box 15120, SE‐750 15 Uppsala, Sweden
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AIP Conf. Proc. 879, 1597–1602 (2007)
Citation
Yasutaka Takata, Koji Horiba, Masaharu Matsunami, Shik Shin, Makina Yabashi, Kenji Tamasaku, Yoshinori Nishino, Daigo Miwa, Tetsuya Isikawa, Eiji Ikenaga, Keisuke Kobayashi, Masashi Arita, Kenya Shimada, Hirofumi Namatame, Masaki Taniguchi, Hiroshi Nohira, Takeo Hattori, Sven Södergren, Björn Wannberg; High Resolution Hard X‐ray Photoemission Spectroscopy at SPring‐8: Basic Performance and Characterization. AIP Conf. Proc. 19 January 2007; 879 (1): 1597–1602. https://doi.org/10.1063/1.2436371
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