Design improvements in the last decade make the atom-probe field ion microscope (FIM) an exciting research tool for the study of surface and solid state phenomena, some of which are extremely important in the steel industry. For instance, with the greatly improved resolution now available in energy-focused atom probes, recent results show that hygdrogen can be easily resolved even when combined with metals having several isotopes. In addition to finding that H, H2, FeH and TiH2 accumulate at segregated grain boundaries in Fe-0.29 wt.% Ti, a striking observation was made—the formation and propagation of a microcrack when the (field ion microscope) tip was exposed to hydrogen gas at elevated temperatures. This crack could be easily grown by further H2 exposure, or reduced in size by field evaporation of the surface. Hydrogen was identified in quantity in the fracture of the surface (former grain boundary), though not elsewhere. Other promising applications include the study of segregation at grain boundaries, in part because the atom probe is the only instrument available for the study of nonembrittled grain boundaries at the atomic level, surface segregation, cluster formation and the initial stages of precipitation.
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20 May 1982
Topical Conference on the Applications of Physics in the Steel Industry
5–7 October 1981
Bethlehem, Pennsylvania
Research Article|
May 20 1982
High performance time-of-flight atom-probe for characterization of hydrogen in metals
T. Sakurai;
T. Sakurai
Departments of Physics and Materials Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA
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H. W. Pickering
H. W. Pickering
Departments of Physics and Materials Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA
Search for other works by this author on:
T. Sakurai
H. W. Pickering
Departments of Physics and Materials Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA
AIP Conf. Proc. 84, 99–110 (1982)
Citation
T. Sakurai, H. W. Pickering; High performance time-of-flight atom-probe for characterization of hydrogen in metals. AIP Conf. Proc. 20 May 1982; 84 (1): 99–110. https://doi.org/10.1063/1.33518
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