Two new approaches are taken in multilayer fabrication to help bridge the gap in bandwidth between traditional multilayers (1 to 2%) and perfect crystals (0.01%). The first approach is based on creating many layers of low‐contrast Al2O3/ B4C materials. The second approach is based on using multilayer structures with a small d‐spacing using traditional W/B4C and Mo/B4C materials. With 8 keV x‐rays on the Chess A2 beamline, we measured a bandwidth of 0.27% with a reflectivity of 40% and a Darwin width of 17 arc seconds from a 26 Å d‐spacing multilayer with 800 bi‐layers of Al2O3/B4C using the low‐contrast approach. On the other hand, the short period approach with a W/B4C multilayer and a 14.8 Å d‐spacing showed a resolution of 0.5 % and a reflectivity of 58.5%. Two more Mo/B4C samples with d‐spacings of 15 Å and 20 Å showed energy resolutions of 0.25% and 0.52% with corresponding reflectivities of 39% and 66%. Thus we observe that both methods can produce useful x‐ray optical components.

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